Brian Walker, Senior RF Design Engineer at Copper Mountain Technologies looks at how a Smith Chart is simply a special case of the polar plot and how the real and imaginary axes are constructed in this video.
Copper Mountain Technologies' Senior Design Engineer Brian Walker demonstrates how to make Pulsed S-parameter Measurements.
Differential signal impairment caused by transport through various media is becoming more important with the ever increasing demand for high data rates in digital data systems. This drives the need for differential transmission lines to be properly characterized in frequency and time domain. CMT Application Engineer Subbaiah Pemmaiah provides a quick guide on differential measurements on a cable in frequency and time domain analysis.
Time Domain Reflectometry (TDR) has traditionally been performed using a fast oscilloscope and a very sharp impulse or step type excitation. Reflections from the excitation are measured at the source and distance and the magnitude of the reflection coefficient may be ascertained from the delay and magnitude of the returning reflected signal. This measurement is performed in a very wide band measurement and the signal to noise ratio can be quite poor because of this. TDR performed using a Vector Network Analyzer (VNA) allows for the measurement to be made in a narrow RF bandwidth with a corresponding large improvement in signal to noise ratio. This method, utilizing the reverse Fourier Transform on a VNA is clearly superior.
De-embedding is the process of eliminating something from your measurement, such as a filter or fixture. When you de-embed you eliminate the effect of something you don't need to measure so your results are more accurate. Senior RF Design Engineer Brian Walker shows how to use a 4.8 GHz Copper Mountain Technologies VNA to make de-embedded measurements.
There may be instances where you need to make a 75 Ohm measurement, but you don't have to have a 75 Ohm VNA. It is possible to use a 50 Ohm VNA to make accurate 75 Ohm measurement. All that is required is to use the proper physical adapters and use a 75 Ohm calibration kit to perform calibration. Senior RF Design Engineer Brian Walker describes how to do such a measurement.
Tuning a diplexer can be challenging. But having all the right tools can make it easier. In this video, we show how three R60 1-port VNAs can be used to measure all three ports of the diplexer simultaneously. This greatly simplifies the tuning procedure which tends to be highly interactive. Alternatively, an affordable TR1300/1 2-port VNA or a 4-port Cobalt C1409 VNA might also be used.
Alex Goloschokin (Copper Mountain Technologies) and Jason White (National Instruments) share details on the new PXIe-S5090 VNA that will be released in August 2019.
Brian Walker, Senior RF Design Engineer at Copper Mountain Technologies shows how there can be significant variation of performance of a PCB mounted antenna when it is close enough to other objects to disturb the near field response. It is best to measure the return loss of an embedded antenna in its final configuration and be prepared to add matching elements to improve radiation efficiency. Careful consideration of the location of the calibration plane of a vector network analyzer measurement is important to derive matching circuit element values.
Sébastien Lambot from Université Catholique de Louvain in Belgium gave a demonstration of materials measurement with our R60 1-Port USB VNA connected to a dipole antenna on a drone at EuMW. He combines a microcomputer with the VNA and portable battery to create a solution for ground penetrating radar that is less than one kilogram. They use the dipole antenna for measuring the amount of moisture in the soil, road conditions, or other penetrating measurements.
Epsilometer Dielectric Materials Measurement solution is a cost-effective, accessible way to measure material properties to enable and optimize RF system performance. It measures dielectric substrate materials to determine the complex permittivity from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3 mm thick. The output includes dielectric permittivity, loss, and/or loss tangent as a function of frequency. The Epsilometer solution includes R60 VNA with software, measurement fixture, Epsilometer software, and calibration sample.
Compass Technology Group scanned a radome using a robot with a mounted 1-Port VNA at IMS 2019.
John Schultz, Ph.D., of Compass Technology Group describes the principles of how the new Epsilometer operates. Epsilometer Dielectric Materials Measurement solution is a cost-effective, accessible way to measure material properties to enable and optimize RF system performance. It measures dielectric substrate materials to determine the complex permittivity from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3 mm thick. The output includes dielectric permittivity, loss, and/or loss tangent as a function of frequency. The Epsilometer solution includes R60 VNA with software, measurement fixture, Epsilometer software, and calibration sample.
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Our popular compact series combines a maximum standard feature set with a compact size suitable for many applications. These instruments are a great value solution for magnitude and phase measurements from 9 kHz to 8.5 GHz. This series includes time domain with gating, fixture simulation, frequency offset mode, and each instrument is fully programmable using either COM/DCOM automation or SCPI/VISA.
Frost & Sullivan honors Copper Mountain Technologies (CMT) with its 2015 Global Competitive Strategy Innovation and Leadership Award for the company's vector network analyzers (VNAs).
Our founder and Chief Revenue Officer discusses the new product releases of 9 new Cobalt models and 1 new 1-Port VNA model. Thanks to Microwave Journal for the great video covering our new product releases.
This new series of high-performance vector network analyzers (VNAs) offers an unmatched price-performance combination for S-parameter measurement between 100 kHz and 20 GHz. The design and production of Cobalt VNAs incorporates several innovative new manufacturing and test approaches.
Copper Mountain Technologies and Farran Technology, Ltd. have worked together to create CobaltFx, an entirely new piece of technology for millimeter-wave S-parameter measurements that establishes lab quality results in a more compact and significantly more affordable solution. The system is the first millimeter-wave frequency extension solution built on a 9 GHz vector network analyzer (VNA) and is available in three dedicated waveguide bands: 50-75 GHz, 60-90 GHz and 75-110 GHz.
Powered and operated via USB connection to an external PC, these 1-port VNAs perform lab quality measurements of the S11 parameter in various presentation formats. Their portable size allows operation in any environment without the use of a test cable, resulting in highly dependable performance and calibration stability.