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Supplier: Fischer Technology, Inc.
Description: To ensure that protective layers adhere permanently, the surface roughness of the base material must comply with strict recommended standards. The FPR1 profile probe is the ideal solution in this case: When combined with the FMP10/40 series, the FPR1 profile probe is the ideal solution for testing
- Technology: Contact / Stylus Based
- Features: Other
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
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Supplier: Mahr Inc.
Description: "sMAHRtSurf" - Simple, smart and mobile Compact roughness measuring instrument for mobile use Simple and intuitive to use: As easy to use as a smart phone Large, illuminated 4.3" TFT touch display Adjustable display Start button also serves as the Home button for direct access to the start screen
- Vertical (Z) Range: 0.003543309 to 0.013779535 inch
- Vertical (Z) Resolution: 0.0000003149608 inch
- Traverse Length: 0.0393701 to 0.6299216 inch
- Technology: Contact / Stylus Based
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Supplier: Mahr Inc.
Description: Product features MarSurf M 400. The best of the mobile devices Both in the measuring room and increasingly also in the production area, there is a need for surface evaluations requiring skidless tracing. This generally requires more highly skilled operators, more time and more adjustment work.
- Vertical (Z) Range: 0.009842525 to 0.029527575 inch
- Vertical (Z) Resolution: 0.00000003149608 inch
- Traverse Length: 1.0236226 inch
- Scan Rate: 0.0078740157480315 to 0.0393700787401575 in/sec
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Supplier: Mahr Inc.
Description: MarSurf XR 1. The ideal instrument for a low-cost introduction to user-friendly surface metrology. The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. MarSurf XR 1 from Mahr stands for
- Vertical (Z) Range: 0.009842525 to 0.029527575 inch
- Traverse Length: 0.022047256 to 2.2047256 inch
- Applications: Aerospace / Defense, Automotive, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
- Mounting / Loading Options: Benchtop
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Supplier: PCE Instruments / PCE Americas Inc.
Description: Roughness Tester PCE-RT 11 Roughness tester for accurate determination of roughness according to Ra, Rz, Rq and Rt / with piezoelectric probe / big OLED display with backlight The Roughness Tester PCE-RT-11 is a portable measuring instrument for determination of surface roughness according to Ra,
- Operating Temperature: -4 to 104 F
- Technology: Contact / Stylus Based
- Display & Special Features: Digital Readout
- Mounting / Loading Options: Handheld / Portable
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Supplier: Bruker Corporation
Description: Bruker's Dektak® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
- Mounting / Loading Options: Benchtop, Floor / Free Standing
- Display & Special Features: Computer Interface / Networkable
- Technology: Contact / Stylus Based
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Supplier: Edmund Optics Inc.
Description: Aspheric Surface Accuracy of 0.25μm RMS 0.66 and 0.50 NA Lenses Complete Metrology Data Provided Our TECHSPEC® Calibration Grade Precision Aspheric Lenses offer the ultimate in performance and precision available from an off-the-shelf polished aspheric lenses. Featuring improved aspheric
- Focal Length: 37.50000000000001 mm
- Diameter / Length: 50 mm
- Center Thickness: 19.400000000000002 mm
- Edge Thickness: 7.8500000000000005 mm
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Supplier: Edmund Optics Inc.
Description: Aspheric Surface Accuracy of 0.25μm RMS 0.66 and 0.50 NA Lenses Complete Metrology Data Provided Our TECHSPEC® Calibration Grade Precision Aspheric Lenses offer the ultimate in performance and precision available from an off-the-shelf polished aspheric lenses. Featuring improved aspheric
- Focal Length: 31.250000000000004 mm
- Diameter / Length: 50 mm
- Center Thickness: 19.400000000000002 mm
- Edge Thickness: 2.6900000000000004 mm
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Supplier: Edmund Optics Inc.
Description: Aspheric Surface Accuracy of 0.25μm RMS 0.66 and 0.50 NA Lenses Complete Metrology Data Provided Our TECHSPEC® Calibration Grade Precision Aspheric Lenses offer the ultimate in performance and precision available from an off-the-shelf polished aspheric lenses. Featuring improved aspheric
- Focal Length: 25 mm
- Diameter / Length: 25 mm
- Center Thickness: 7.5 mm
- Edge Thickness: 1.74 mm
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Supplier: Edmund Optics Inc.
Description: Aspheric Surface Accuracy of 0.25μm RMS 0.66 and 0.50 NA Lenses Complete Metrology Data Provided Our TECHSPEC® Calibration Grade Precision Aspheric Lenses offer the ultimate in performance and precision available from an off-the-shelf polished aspheric lenses. Featuring improved aspheric
- Focal Length: 18.750000000000004 mm
- Diameter / Length: 25 mm
- Center Thickness: 10.000000000000002 mm
- Edge Thickness: 1.63 mm
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AIAA Journal > A Review of Roughness-Induced Nosetip Transition
published only rms profilometer data, whereas others documented either profilometer results or photomicrograph data but rarely both.
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Measurement of ocean wave heights with a satellite radar altimeter
The rms profilometer -mea- sured wave height, averaged over this entire track, was reported as 3.51 m [Parsons and Goodman, 1975].
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Optical system materials selection using performance indices in a simultaneous optimization approach
Most often, surface roughness is specified using RMS profilometer measurements.
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MACHINING TECHNIQUES AND PROCEDURES FOR URANIUM, GRAPHITE, TITANIUM, ZIRCONIUM, THORIUM, TANTALUM, BERYLLIUM, BISMUTH, LITHIUM, AND STELLITE
rms profilometer reading.
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Original optical metrologies of large components
We can mention the absorption (photothermal effect) and birefringence bench, a control interferometer equipped with an original stitching option, the optical profilometer ( RMS roughness and small defect measurements).
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Silicon Based Polymers
b Veeco profilometer rms roughness (Rq .
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AIAA Journal > Boundary-Layer Transition on Supersonic Cones in an Aeroballistic Range
In both cases, the actual dimension from the bottom of a groove to the top was approximately four times the quoted profilometer rms roughness reading.
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Light Scattering Characteristics of Some Metal Surfaces—A Smoothing Effect?
Results shown in Figure 5 also compare the WYKO profilometer rms roughness values to those of the scatterometer (OEC vs UNM).
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Thick, fine-grained beryllium optical coatings
surface finishes of 3 - 5 A ( rms ) (Chapman profilometer ).
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Visible Light Scatter Measurements Of The Advanced X-ray Astronomical Facility (AXAF) Mirror Samples
LLL PROFILOMETER ANGSTROMS RMS .
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