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Supplier: Shimadzu Scientific Instruments, Inc.
Description: XRD-6000 – General-purpose X-Ray Diffractometer The Windows XP-supported application software ushers this compact, multi-functional, general-purpose X-ray Diffractometer into the networking era of analysis. With its basic ease of use and abundant functions, the XRD-6000
- Angular Range: -6 to 163 degrees
- Detector Type: Scintillation
- Diffracted Beam Optics: Monochromating Crystal
- Sample/Detector Positioning System: Goniometer
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Supplier: Evident Scientific
Description: for launch in 2011. Check out the NASA site for more. The Terra is the first truly portable combination XRF/XRD system designed specifically for rock and mineral analysis. Now field XRD work can really be done in the field. The Terra can be configured with everything you need to
- Form Factor: Portable / Hand Held / Mobile
- Instrument / System Type: X-ray Generator / Source
- Programmable / Digital Control Unit: Yes
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Supplier: Bruker Corporation
Description: Non-destructive Characterization of Material Properties Bruker's X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to our customers today. Applications of these qualitative
- Diffraction Method: Powder, Laue - Single Crystal, Other Method
- Features: Benchtop, High Resolution / Crystal Quality
- Wave Type: X-Ray
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Supplier: Win Source Electronics
Description: Manufacturer: Exar Corporation Win Source Part Number: 416569-XRD9816ACV Category: Integrated Circuits(ICs) Family: Data Acquisition - Analog Front End(AFE) Family Name: XRD9816 Introduction Date: December 09, 1999 Is this a common-used part?: Yes Popularity: High Fake Threat In the
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Supplier: Win Source Electronics
Description: Manufacturer: Exar Corporation Win Source Part Number: 416568-XRD8814AID Category: Integrated Circuits(ICs) Family: Data Acquisition - Analog Front End(AFE) Popularity: Low Fake Threat In the Open Market: 31 pct. Supply and Demand Status: Balance
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Supplier: Win Source Electronics
Description: Manufacturer: Exar Corporation Win Source Part Number: 1282331-XRD9836ACG Packaging: Tube Package: 48-TSSOP (0.240", 6.10mm Width) Power (Watts): 500mW Operating Supply Voltage: 3 V ~ 3.6 V Voltage - Supply, Digital: 3 V ~ 3.6 V Number of Channels: 3 Part Status
- Supply Voltage (VS): 3 to 3.6 volts
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Supplier: Win Source Electronics
Description: Manufacturer: Exar Corporation Win Source Part Number: 1282329-XRD9816BCV Manufacturer Homepage: www.exar.com RoHS State: Request Verification Popularity: Medium Fake Threat In the Open Market: 65 pct. Supply and Demand Status: Limited
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Supplier: Quarktwin Technology Ltd.
Description: 3 Channel AFE 14 Bit 200 mW 20-SSOP
- Device Type / Applications: Front End
- IC Package Type: SOP, SSOP, Other
- RoHS Compliant: Yes
- Supply Voltage: Other
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Supplier: Quarktwin Technology Ltd.
Description: 3 Channel AFE 16 Bit 200 mW 20-SSOP
- Device Type / Applications: Front End
- IC Package Type: SOP, SSOP, Other
- RoHS Compliant: Yes
- Supply Voltage: Other
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Supplier: Quarktwin Technology Ltd.
Description: 3 Channel AFE 16 Bit 325 mW 28-TSSOP
- Device Type / Applications: Front End
- IC Package Type: SOP, SSOP, TSSOP, Other
- RoHS Compliant: Yes
- Supply Voltage: Other
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Supplier: Quarktwin Technology Ltd.
Description: 3 Channel AFE 12 Bit 200 mW 20-SSOP
- Device Type / Applications: Front End
- IC Package Type: SOP, SSOP, Other
- RoHS Compliant: Yes
- Supply Voltage: Other
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Supplier: Rigaku Corporation
Description: 2012 heralds the newest additions to the MiniFlex series of benchtop X-ray diffraction (XRD) analyzers. The new 5th generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. MiniFlex is now available in
- Angular Range: -3 to 145 degrees
- Detector Type: Scintillation
- Diffracted Beam Optics: Monochromating Crystal, Collimators and Slits, K-Beta Absorption Filter
- Diffraction Method: Powder
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Supplier: Rigaku Corporation
Description: Introduced by Rigaku Innovative Technologies in the early 1990’s, graded multilayer monochromators provide increased intensity for High-Resolution diffraction, Thin Film analysis and other 1-dimensional parallel beam XRD applications. Max-Flux® Optics use graded multilayers
- Vacuum: Yes
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Supplier: Accuris
Description: Refractory products \x97 Determination of reduced species in carbon containing refractories by XRD
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Supplier: Accuris
Description: Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
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Supplier: Rigaku Corporation
Description: The TTRAX III is the world’s most powerful diffractometer. Utilizing an 18 kW rotating anode X-ray source in a ?/? geometry provides the perfect system for demanding applications. Both thin film diffraction and the determination of trace phases in powdered samples benefit greatly from the TTRAX’s
- Detector Type: Other
- Diffraction Method: Powder
- Features: Benchtop, High Resolution / Crystal Quality
- Wave Type: X-Ray
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Supplier: VAST STOCK CO., LIMITED
Description: Toggle Switches F-Series Toggle Switch
- Standards / Compliances: RoHS Compliant
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Supplier: VAST STOCK CO., LIMITED
Description: Toggle Switches G-Series Toggle Switch
- Standards / Compliances: RoHS Compliant
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Supplier: Rigaku Corporation
Description: The Rigaku MFM65 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks. The
- Applications: Semiconductor Wafers
- Form Factor: Monitor / Instrument
- Maximum Wafer / Part Size: 200 to 300 mm
- Measurement Capability: Composition, Particle Contamination, Roughness / Waviness, Thickness - Film / Layer
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Supplier: VAST STOCK CO., LIMITED
Description: Power Management IC Development Tools LI-ION SYS PWR PATH MGT REF Design
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Supplier: ODG (Origin Data Global)
Description: IC ADC 8BIT FLASH 24SOIC
- Operating Temperature: -40 to 185 F
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Supplier: ODG (Origin Data Global)
Description: IC AFE 3 CHAN 16BIT 48TSSOP
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Supplier: Richardson RFPD
Description: Richardson RFPD, an Arrow Company, is a specialized electronic component distributor providing design engineers with deep technical expertise and localized global design support for the latest new products from the world's leading suppliers of RF, Wireless, Energy and Power Technologies.
- Category: Development Board
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Supplier: DigiKey
Description: 10 Bit Analog to Digital Converter 8 Input 1 Pipelined 44-PQFP (10x10)
- Architecture: Pipeline
- IC Package Type: Other
- Input Type: Single-Ended
- Interface Type: Parallel, Other
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Supplier: DigiKey
Description: 10 Bit Digital to Analog Converter 1 8-SOIC
- Architecture: Resistor String
- IC Package Type: SOIC, Other
- Interface Type: SPI, Other
- Operating Temperature: -40 to 85 C
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Supplier: DigiKey
Description: 8 Bit Analog to Digital Converter 1 Input 1 Flash 20-SOIC
- Architecture: Flash (Parallel)
- IC Package Type: SOIC, Other
- Input Type: Single-Ended
- Interface Type: Parallel, Other
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Supplier: DigiKey
Description: 12 Bit Digital to Analog Converter 1 8-SOIC
- Architecture: Resistor String
- IC Package Type: SOIC, Other
- Interface Type: SPI, Other
- Operating Temperature: -40 to 85 C
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Supplier: Lingto Electronic Limited
Description: IC ADC 8BIT FLASH 20SSOP
- Interface Type: Parallel, Other
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Supplier: Lingto Electronic Limited
Description: IC AFE 3 CHAN 16BIT 28TSSOP
- Digital I/O Channels: 3 #
- Resolution: 16 bits
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Supplier: DuPont Plastics, Polymers & Resins
Description: Delrin® FG400XRD NC010 is a filled, medium viscosity acetal copolymer for injection molding. It is detected in xray detectors. It has been developed for consideration into applications such as parts for the food industry. Pushing the Limits: Delrin® High Performance Acetal
- Tensile Modulus: 464 ksi
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Supplier: ASTM International
Description: 1.1 X-Ray diffraction (XRD) is a tool for identifying minerals, such as quartz and feldspar, and types of clay present in bulk samples of equine surfaces. Determining the mineralogy of a given bulk sample provides insight into surface properties, such as abrasion resistance by comparing the
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Description: IC AFE 3 CHAN 12BIT 20SSOP
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Description: IC ADC 10BIT SAR 64LQFP
- IC Package Type: Other
- Operating Temperature: -40 to 85 C
- Packing Method: Tray / Rail, Other
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Description: IC DAC 12BIT V-OUT 8SOIC
- IC Package Type: Other
- Operating Temperature: -40 to 85 C
- Packing Method: Shipping Tube / Stick Magazine, Other
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Description: REFERENCE DESIGN PWR-PTH MCP7383
- Category: Development Board
- Supported System: Other
Find Suppliers by Category Top
Conduct Research Top
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An XRD/XRF Instrument For the Microanalysis of Rocks and Minerals
A breadboard setup constructed at MOXTEK, Inc., is capable of capturing both x-ray diffraction (XRD) and x-ray ?uorescence (XRF) information. simultaneously using a charge-coupled device (CCD) as the x-ray detector. This preliminary setup will lead to a prototype simultaneous XRD/XRF instrument
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Here's the Dirt on Using XRD Technology to Identify the Origin of Soils
The researchers conducted a geochemical analysis to understand the differences in the characteristics between the soils in Meherrin, Virginia and the nearby soils of the Virginia Piedmont Region. X-ray diffraction (XRD) analysis of separated magnetic particles was conducted using an Olympus TERRA
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Simultaneous XRD/XRF with low-power X-Ray tubes
A test bench instrument constructed at Moxtek, Inc. is capable of simultaneously capturing x-ray diffraction (XRD) and x-ray fluorescence (XRF) information using a charge-coupled device (CCD) as the x-ray detector. NASA is funding the instrument's construction because of its low-power consumption
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Olympus XRF & XRD for Lithium Exploration
Portable X-ray fluorescence (pXRF) and portable X-ray diffraction (pXRD) are useful tools in aiding the exploration and investigation of lithium-bearing mineral deposits. Current global lithium production is derived from two key deposit types: 1) lithium-bearing pegmatites and 2) lithium brines or
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Improving the Metal Manufacturing and Recycling Process Using Portable XRF and XRD
Steel, aluminum, and other metal alloys are essential to manufacturing a wide variety of products from small drones to high-speed trains, airplanes, buildings, and bridges. Steel is still the highest produced alloy, with more than 4 million tons of steel produced per week, followed by aluminum.
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Low Frequency THz-Raman Spectroscopy: Using Structural Information for Material Identification
Raman is primarily used for chemical identification. THz and XRD are used for structural analysis, what if Raman could do both?
More Information Top
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New Materials, Applications and Processes
… uniform portions which are used to test the scanning electron microscopy separately, energy spectrum analysis and XRD .
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Advanced Engineering Materials III
XRD pattern and distribution curve of particle size of fused silica was respectively showed in Fig.1 …
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Advances in Materials and Materials Processing
XRD analysis (see Fig. 5) show there exists Al3Ti phase but no AlTi phase.
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Advanced X-Ray Characterization Techniques
between XRD and TEM Results .
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Advanced Materials and Processes II
… out for viewing the worn surfaces and microstructure, and the phases of composites were characterized by XRD .
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New Materials and Processes
… dispersed X-ray spectrometer (EDS), and phase analysis was performed by means of X-ray diffraction ( XRD ).
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Advanced Materials, ICAMMP 2011
The material structures that been modified (unmodified) were characterized by XRD , SEM and SpectraPlus.
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Advanced Engineering Materials II
… Electron Microscope (SEM), Energy Dispersive x-ray Spectroscopy (EDS) and X-Ray Diffraction ( XRD ), The results shown …
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Chinese Ceramics Communications II
… hydroxide which were calcined at 900°C for 3 h, figure 1 gives its XRD ), placed them in …
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ICAME 2007
The filling factor for the A atoms was determined from XRD data, by using FULLPROF [19] and …
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