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Supplier: Cosmic Equipment SpA
Description: and short circuit, using high performance modular test generators. Flexibility: Quickly switch between different pick and place / gravity feed / leadframe strip handlers without compromising on output. The loadboard based architecture of M2 Flexible Edition means switching to different
- Component / Product Tested: Active Components / Semiconductors
- Type / Form: Measure Unit / Monitor, Test Platform / System
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Supplier: Cosmic Equipment SpA
Description: and short circuit, using high performance modular test generators. Flexibility: Quickly switch between different pick and place / gravity feed / leadframe strip handlers without compromising on output. The loadboard based architecture of M2 Flexible Edition means switching to different
- Component / Product Tested: Active Components / Semiconductors
- Type / Form: Measure Unit / Monitor, Test Platform / System
-
Supplier: Cosmic Equipment SpA
Description: and short circuit, using high performance modular test generators. Flexibility: Quickly switch between different pick and place / gravity feed / leadframe strip handlers without compromising on output. The loadboard based architecture of M2 Flexible Edition means switching to different
- Component / Product Tested: Active Components / Semiconductors
- Type / Form: Measure Unit / Monitor, Test Platform / System
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-
Supplier: Cosmic Equipment SpA
Description: and short circuit, using high performance modular test generators. Flexibility: Quickly switch between different pick and place / gravity feed / leadframe strip handlers without compromising on output. The loadboard based architecture of M2 Flexible Edition means switching to different
- Component / Product Tested: Active Components / Semiconductors
- Type / Form: Measure Unit / Monitor, Test Platform / System
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A comparative study of switching losses of IGBTs under hard-switching, zero-voltage-switching and zero-current-switching
The high power IGBT tester corresponding to the circuit diagrams shown in Figs. l(a)-3(a)has been built, and used in this study.
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Failure dynamics of the IGBT during turn-off for unclamped inductive loading conditions
Equivalent circuit used to simulate the IGBT UIS failure consisting of current constriction IGBT model (components within box) and equiva- lent circuit for RBSOA tester (components outside of box).
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Medium-voltage pulse width modulated current source rectifiers using different semiconductors: loss and size comparison
Other investigations compared the IGBT , GCT and ETO (emitter turn off) thyristors using a pulse- tester circuit [15, 16].
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Development of a new short-circuit tester for 1.7kV high current power devices
Finally, different short- circuit tests have been performed for different families of IGBTs to validate the presented tester .
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Performance evaluation of SiC power MOSFETs for high-temperature applications
In order to protect the DUT from any potential over-current failure, an IGBT with de-sat detection function is connected between the bulk capacitors and the tester circuit as a breaker.
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Design and test of a PCB Rogowski coil for very high dI/dt detection
Abstract — This study proposes the bespoke design of a printed- circuit -board (PCB) integrated Rogowski coil to detect very high dI/dt’s in an IGBT non-destructive tester .
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The effects of the stray elements on the failure of parallel connected IGBTs during Turn-Off
The basic operating principle is the same of the high power non destructive tester reported in the past [2], but, in this case the circuit allows us to characterize the IGBT also during unclamped operation.
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Investigation on surge testing for winding insulation fault detection in an online environment
A simplyfied one phase equivalent circuit is shown in Fig. 4, where L1 and R1 are supply inductance and resistance, L2 and R2 the equivalent motor inductance and resistance, C the capacitance of the surge tester and S the IGBT switch.
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A compact high-voltage pulse generator with opening insulated-gate bipolar transistor switch and a high pulse repetition rate
… PT) pulse transformer on the ferrite magnetic circuit (ktr = 25, w1 = 12, and w2 = 300); (L) indicator lamp (light emitting diode); (Q) IRG4PH50UD IGBT (two in parallel) with … … decoupling of the power circuit from the control system … … a UNI T M890G tester ).
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Progress in Power and Electrical Engineering
In order to verify the feasibility, validity and practicality of topological structure MCAC above, a prototype tester is structured, based on TMS320F2812 of TI company as control core, IGBT for power switch, using the open-loop control mode. Hardware parts including the main circuit and control circuit, the power supply circuit, etc.