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Supplier: Mahr Inc.
Description: innovative roughness evaluation software. Features Over 80 surface parameters for R-, P- and W-profiles according to current ISO/JIS or MOTIF standards (ISO 12085) Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as required. Comprehensive
- Vertical (Z) Range: 0.009842525 to 0.029527575 inch
- Traverse Length: 0.022047256 to 2.2047256 inch
- Applications: Aerospace / Defense, Automotive, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
- Mounting / Loading Options: Benchtop
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Supplier: Mahr Inc.
Description: lengths and short cutoff can be selected Key pad lock and/or password protection for instrument settings Built-in rechargeable battery with power management Integrated roughness standard for the standard pick-up PHT 6-350 Dynamic calibration function Date and/or time of
- Vertical (Z) Range: 0.003543309 to 0.013779535 inch
- Vertical (Z) Resolution: 0.0000003149608 inch
- Traverse Length: 0.0393701 to 0.6299216 inch
- Scan Rate: 0.0196850393700788 in/sec
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Supplier: Mahr Inc.
Description: isometric or numeric graph with plate grade All features as standard differential level system Electronic levels are much easier to use with an autocollimator or a laser based calibration system Performance is comparable and results are obtained without time consuming sight path
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Supplier: Mahr Inc.
Description: parameters Automatic choice of cut-off and traversing length in accordance with standard Dynamic calibration function Cable and Bluetooth connection between drive unit and evaluation instrument (4 m) Magnetic probe holder (breakaway probe) BFW 250 Motorized probe zero setting (max. 7.5
- Vertical (Z) Range: 0.009842525 to 0.029527575 inch
- Vertical (Z) Resolution: 0.00000003149608 inch
- Traverse Length: 1.0236226 inch
- Scan Rate: 0.0078740157480315 to 0.0393700787401575 in/sec
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Handbook of Non-Invasive Methods and the Skin
The optical profilometer was calibrated with standard roughness specimens designed for mechanical stylus instruments.
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A new technique for optical 3D measurements with a confocal scanning laser microscope
A calibration standard for stylus profilometer was chosen as a sample which has precise thin pattern.
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Growth and optical, magnetic and transport properties of (C4 H9 NH3 )2 MCl4 organic-inorganic hybrid films (M = Cu, Sn)
The film thickness was measured a-posteriori by a standard profilometer and roughly calibrated by varying the amount of the precursor (i.e., the drop number) placed on the crucible.
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A new method for the calibration of the vertical scale of a stylus profilometer using multiple delta-layer films
The vertical scale of the stylus profilometer was calibrated by a standard material with a certified step-height of 89.4 nm and an expanded uncertainty of 1.2 nm.
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A method to determine the interface position and layer thickness in SIMS depth profiling of multilayer films
The vertical scale of the stylus profilometer was calibrated using a standard material with a certified step height of 89.4 nm and an expanded uncertainty of 1.2 nm.
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Experimental study on operating temperature in laser-assisted milling of silicon nitride ceramics
The profilometer was calibrated using a standard reference specimen, then set to travel at a speed of 0.1 mm/s with a range of 4 mm during testing.
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Comparative study on the effect of ultrasonic instruments on the root surface in vivo
Before the experiment, the surface profilometer was calibrated against a standard device.
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Dimensional variation and roughness of LIGA-fabricated microstructures
The variation in profilometer measurements using the calibration standard for both LIGA runs, as measured by the standard deviation of the two data sets, was 0.007 tim.
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NATIONAL SYMPOSIUM ON DEVELOPMENTS IN IRRADIATION TESTING TECHNOLOGY, SEPTEMBER 9--11, 1969, NASA LEWIS RESEARCH CENTER, SANDUSKY, OHIO.
The profilometer is calibrated with a standard before and after each pin is measured.
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Micro-milling performance of AISI 304 stainless steel using Taguchi method and fuzzy logic modelling
Before the surface roughness mea- surements, the profilometer was calibrated with a standard calibration block.