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Supplier: Shimadzu Scientific Instruments, Inc.
Description: XRD-6000 – General-purpose X-Ray Diffractometer The Windows XP-supported application software ushers this compact, multi-functional, general-purpose X-ray Diffractometer into the networking era of analysis. With its basic ease of use and abundant functions, the XRD-6000 offers
- Angular Range: -6 to 163 degrees
- Positioning System: Goniometer
- Diffracted Beam Optics: Monochromating Crystal
- Detector: Scintillation
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Supplier: Evident Scientific
Description: launch in 2011. Check out the NASA site for more. The Terra is the first truly portable combination XRF/XRD system designed specifically for rock and mineral analysis. Now field XRD work can really be done in the field. The Terra can be configured with everything you need to acquire
- Features: Other, Programmable / Digital Control Unit, X-ray Generator / Source
- Form Factor: Portable / Hand Held / Mobile
- Instrument Technology: Radiographic / X-ray
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Supplier: Bruker Corporation
Description: Non-destructive Characterization of Material Properties Bruker's X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to our customers today. Applications of these qualitative
- Features: Benchtop, High Resolution / Crystal Quality, Other Method
- Diffraction Method: Laue - Single Crystal, Powder
- Wave: X-Ray
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Supplier: Win Source Electronics
Description: Manufacturer: Exar Corporation Storage Condition: Dry storage cabinet & Humidity protection package Win Source Part Number: 1055089-XRD9814ACV Categories: OEM Parts(T-Z) Popularity: Low Fake Threat In the Open Market: 55 pct. Supply and Demand Status: Shortage
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Supplier: Win Source Electronics
Description: Manufacturer: Exar Corporation Win Source Part Number: 214634-XRD9824ACD Packaging: Tube/Rail Power (Watts): 200mW Number of Bits: 14 Number of Channels: 3 Categories: Integrated Circuits Status: Obsolete(EOL) Case / Package: 20-SOIC Analog Supply Voltage: 3 V to 5.5 V Digital Supply Voltage: 3 V
- Features: Other
- Package Type: SOIC
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Supplier: Win Source Electronics
Description: Manufacturer: Exar Corporation Win Source Part Number: 1282329-XRD9816BCV Manufacturer Homepage: www.exar.com RoHS State: Request Verification Popularity: Medium Fake Threat In the Open Market: 65 pct. Supply and Demand Status: Limited
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Supplier: Win Source Electronics
Description: Manufacturer: Exar Corporation Win Source Part Number: 1119603-XRD9818ACGTR Packaging: Reel - TR Power (Watts): 325mW Number of Bits: 16 Number of Channels: 3 Categories: Integrated Circuits Status: Obsolete(EOL) Case / Package: 28-TSSOP Analog Supply Voltage: 3 V to 3.6 V Digital Supply Voltage: 3
- Features: Other
- Package Type: SOP, SSOP, TSSOP
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Supplier: Quarktwin Technology Ltd.
Description: 3 Channel AFE 16 Bit 200 mW 20-SSOP
- Device Type: Front End
- Features: Other, RoHS Compliant
- Package Type: SOP, SSOP
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Supplier: Rigaku Corporation
Description: Introduced by Rigaku Innovative Technologies in the early 1990’s, graded multilayer monochromators provide increased intensity for High-Resolution diffraction, Thin Film analysis and other 1-dimensional parallel beam XRD applications. Max-Flux® Optics use graded multilayers, assuring the same
- Monochromator Features: Vacuum
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Supplier: Rigaku Corporation
Description: The TTRAX III is the world’s most powerful diffractometer. Utilizing an 18 kW rotating anode X-ray source in a θ/θ geometry provides the perfect system for demanding applications. Both thin film diffraction and the determination of trace phases in powdered samples benefit greatly from the TTRAX’s
- Features: Benchtop, High Resolution / Crystal Quality, Other
- Diffraction Method: Powder
- Wave: X-Ray
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Supplier: Quarktwin Technology Ltd.
Description: 8 Bit Analog to Digital Converter 1 Input 1 Flash 20-SSOP
- Resolution: 8 bits
- Sample Rate: 20,000 kSamples/Sec
- Input Voltage Range (Vpp): 5 volts
- Operating Temperature: -40 to 85 C
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Supplier: Rigaku Corporation
Description: 2012 heralds the newest additions to the MiniFlex series of benchtop X-ray diffraction (XRD) analyzers. The new 5th generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. MiniFlex is now available in
- Angular Range: -3 to 145 degrees
- Features: Benchtop
- Diffracted Beam Optics: Collimators and Slits, K-Beta Absorption Filter, Monochromating Crystal
- Positioning System: Goniometer
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Supplier: Richardson RFPD
Description: Richardson RFPD, an Arrow Company, is a specialized electronic component distributor providing design engineers with deep technical expertise and localized global design support for the latest new products from the world's leading suppliers of RF, Wireless, Energy and Power Technologies.
- Category: Development Board
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Supplier: ODG (Origin Data Global)
Description: IC AFE 3 CHAN 16BIT 48TSSOP
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Supplier: Quarktwin Technology Ltd.
Description: WLS15 WORK LIGHT STRIP; DIFFUSED
- Application: Industrial
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Supplier: Lingto Electronic Limited
Description: IC AFE 3 CHAN 16BIT 20SSOP
- Digital I/O Channels: 3 #
- Resolution: 16 bits
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Supplier: ODG (Origin Data Global)
Description: IC ADC 8BIT FLASH 24SOIC
- Operating Temperature: -40 to 185 F
- Features: Other
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Supplier: Quarktwin Technology Ltd.
Description: 8 Bit Digital to Analog Converter 1 8-PDIP
- Resolution: 8 bits
- Settling Time: 15 µs
- Operating Temperature: -40 to 85 C
- Package Type: DIP
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Supplier: VAST STOCK CO., LIMITED
Description: Power Management IC Development Tools LI-ION SYS PWR PATH MGT REF Design
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Supplier: DigiKey
Description: 10 Bit Analog to Digital Converter 8 Input 1 Pipelined 44-PQFP (10x10)
- Pin Count: 44
- Resolution: 10 bits
- Sample Rate: 2,000 kSamples/Sec
- Operating Temperature: -40 to 85 C
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Supplier: VAST STOCK CO., LIMITED
Description: Toggle Switches F-Series Toggle Switch
- Standards / Compliances: RoHS Compliant
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Supplier: DigiKey
Description: 12 Bit Digital to Analog Converter 1 8-SOIC
- Resolution: 12 bits
- Settling Time: 15 µs
- Operating Temperature: -40 to 85 C
- Reference Access: External
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Supplier: Rigaku Corporation
Description: The Rigaku MFM65 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
- Maximum Wafer / Part Size: 200 to 300.00000000000006 mm
- Measurements: Composition, Particle Contamination, Roughness / Waviness, Thickness - Film / Layer
- Mounting / Loading: Floor Mounted / Stand-alone
- Form Factor: Monitor / Instrument
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Supplier: Lingto Electronic Limited
Description: IC ADC 10BIT PIPELINED 44PQFP
- Features: Other
- Interface Type: Parallel
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Supplier: DigiKey
Description: MOLDED CASE CIRCUIT BREAKER 600V
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Supplier: DigiKey
Description: MCP73832, MCP73833 Battery Charger Power Management Evaluation Board
- Category: Development Board
- Manufacturer: Microchip (PIC®)
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Supplier: ERSAELECTRONICS PTE. LTD.
Description: IC ADC 10B PAR 40MSPS DL 64LQFP Product overview: XRD64L43AIV from Exar is an Analog-to-Digital Converter IC for sensor measurement, data acquisition, industrial monitoring, instrumentation, and embedded control systems. It is useful for engineers and buyers comparing datasheets, replacement parts,
- Operating Temperature: -40 to 85 C
- Features: Other
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Supplier: Lingto Electronic Limited
Description: IC DAC 12BIT V-OUT 8DIP
- DNL: 0.5 LSB
- INL: 2 LSB
- Features: Other
- Interface Type: SPI
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Supplier: DuPont Plastics, Polymers & Resins
Description: Delrin® FG400XRD NC010 is a filled, medium viscosity acetal copolymer for injection molding. It is detected in xray detectors. It has been developed for consideration into applications such as parts for the food industry. Pushing the Limits: Delrin® High Performance Acetal Resin Solutions Delrin®
- Tensile Modulus: 464.11788594303 ksi
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Supplier: ERSAELECTRONICS PTE. LTD.
Description: D/A Converter, 1 Func, Serial Input Loading, 13us Settling Time, PDIP8, 0.300 INCH, GREEN, PLASTIC, DIP-8 Product overview: XRD5412AIP-F from Exar is a Digital-to-Analog Converter IC for analog output generation, control loops, instrumentation, signal synthesis, and embedded system interfaces. It
- Pin Count: 8
- Operating Temperature: -40 C
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Supplier: ERSAELECTRONICS PTE. LTD.
Description: IC DAC 10BIT V-OUT 8SOIC Product overview: XRD5410AID-F from MaxLinear is a Digital-to-Analog Converter IC for analog output generation, control loops, instrumentation, signal synthesis, and embedded system interfaces. It is useful for engineers and buyers comparing datasheets, replacement parts,
- Operating Temperature: -40 C
- Features: Other
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Description: IC AFE 3 CHAN 16BIT 28TSSOP
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Description: IC ADC 10BIT PIPELINED 44PQFP
- Operating Temperature: -40 to 85 C
- Features: Other
- Packing Method: Tray / Rail
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Description: IC DAC 10BIT V-OUT 8DIP
- Operating Temperature: -40 to 85 C
- Package Type: DIP
- Features: Other
- Packing Method: Shipping Tube / Stick Magazine
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Supplier: ERSAELECTRONICS PTE. LTD.
Description: IC ADC 8BIT 20MSPS 24SOIC Product overview: XRD8785AIDTR-F from Exar is an Analog-to-Digital Converter IC for sensor measurement, data acquisition, industrial monitoring, instrumentation, and embedded control systems. It is useful for engineers and buyers comparing datasheets, replacement parts,
- Operating Temperature: -40 to 85 C
- Features: Other
Find Suppliers by Category Top
Conduct Research Top
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An XRD/XRF Instrument For the Microanalysis of Rocks and Minerals
A breadboard setup constructed at MOXTEK, Inc., is capable of capturing both x-ray diffraction (XRD) and x-ray ?uorescence (XRF) information. simultaneously using a charge-coupled device (CCD) as the x-ray detector. This preliminary setup will lead to a prototype simultaneous XRD/XRF instrument
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Here's the Dirt on Using XRD Technology to Identify the Origin of Soils
The researchers conducted a geochemical analysis to understand the differences in the characteristics between the soils in Meherrin, Virginia and the nearby soils of the Virginia Piedmont Region. X-ray diffraction (XRD) analysis of separated magnetic particles was conducted using an Olympus TERRA
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Simultaneous XRD/XRF with low-power X-Ray tubes
A test bench instrument constructed at Moxtek, Inc. is capable of simultaneously capturing x-ray diffraction (XRD) and x-ray fluorescence (XRF) information using a charge-coupled device (CCD) as the x-ray detector. NASA is funding the instrument's construction because of its low-power consumption
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Olympus XRF & XRD for Lithium Exploration
Portable X-ray fluorescence (pXRF) and portable X-ray diffraction (pXRD) are useful tools in aiding the exploration and investigation of lithium-bearing mineral deposits. Current global lithium production is derived from two key deposit types: 1) lithium-bearing pegmatites and 2) lithium brines or
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Improving the Metal Manufacturing and Recycling Process Using Portable XRF and XRD
Steel, aluminum, and other metal alloys are essential to manufacturing a wide variety of products from small drones to high-speed trains, airplanes, buildings, and bridges. Steel is still the highest produced alloy, with more than 4 million tons of steel produced per week, followed by aluminum.
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Low Frequency THz-Raman Spectroscopy: Using Structural Information for Material Identification
Raman is primarily used for chemical identification. THz and XRD are used for structural analysis, what if Raman could do both?
More Information Top
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New Materials, Applications and Processes
… uniform portions which are used to test the scanning electron microscopy separately, energy spectrum analysis and XRD .
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Advanced Engineering Materials III
XRD pattern and distribution curve of particle size of fused silica was respectively showed in Fig.1 …
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Advances in Materials and Materials Processing
XRD analysis (see Fig. 5) show there exists Al3Ti phase but no AlTi phase.
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Advanced X-Ray Characterization Techniques
between XRD and TEM Results .
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Advanced Materials and Processes II
… out for viewing the worn surfaces and microstructure, and the phases of composites were characterized by XRD .
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New Materials and Processes
… dispersed X-ray spectrometer (EDS), and phase analysis was performed by means of X-ray diffraction ( XRD ).
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Advanced Materials, ICAMMP 2011
The material structures that been modified (unmodified) were characterized by XRD , SEM and SpectraPlus.
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Advanced Engineering Materials II
… Electron Microscope (SEM), Energy Dispersive x-ray Spectroscopy (EDS) and X-Ray Diffraction ( XRD ), The results shown …
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Chinese Ceramics Communications II
… hydroxide which were calcined at 900°C for 3 h, figure 1 gives its XRD ), placed them in …
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ICAME 2007
The filling factor for the A atoms was determined from XRD data, by using FULLPROF [19] and …