Code Design for Dependable Systems

Chapter 4 - Codes for High-Speed Memories I: Bit Error Control Codes


Error control codes (ECCs) have been successfully applied to computer systems, especially
to memory systems. One can say that every memory designer has adopted some types of
error detecting or error correcting codes in order to enhance system reliability [HSIA69,
TANG69, FUJI82, CHEN84, BOSE86B, FUJI90]. In Chapters 4 through 7 we discuss error
control codes for high-speed memories, namely for semiconductor memories such as cache
memories, main memories, control memories, and disk cache memories. These memories
all employ random access memory (RAM) semiconductor chips. Therefore we also call
these applications codes for semiconductor memories. Chapter 4 covers bit error correcting
code applications, and Chapters 5, 6, and 7 cover some types of byte error correction /
detection for recent memory systems with byte organized high-density RAM chips.

One of the notable features of the codes developed for high-speed memories is that
parallel encoding and decoding is required to maintain high rates of data throughput.
Therefore encoding and decoding circuits have to be implemented by combinational logic
[HSIA69, FUJI75].

In high-speed memories, single-bit error correcting and double-bit error detecting
codes (SEC-DED codes) were commonly used. This is because the original firstgeneration
semiconductor DRAM (dynamic RAM) chips are organized for one bit of data
input / output at a time, and therefore any failure in one chip manifested itself as one bit in
error. For the purpose of correcting soft errors induced by α-particles, external noises, and
sometimes by neutrons and cosmic rays, some new techniques and some advanced error
correcting codes are being required for large-capacity, high-speed memories [HSIA70b,
IMAI77b, BOSS80]. This chapter deals with these considerations for codes such as the
modified Hamming SEC-DED codes and double-bit error correcting codes (DEC codes).
This chapter also presents on-chip error control codes, called on-chip ECCs, that are used
to solve the problems of soft-errors and chip yield degradation.

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