TABLE OF CONTENTS Dan A.Watson, Ph.D.
Texas Instruments Incorporated
Dallas, Texas
Dr. Watson is a statistician in the Silicon Technology Development Group (SiTD) at Texas Instruments. He is responsible for providing statistical consulting and programming support to the researchers in SiTD. His areas of expertise include design of experiments, data analysis and modeling, statistical simulations, the Statistical Analysis System (SAS), and Visual Basic for Microsoft Excel. Prior to coming to SiTD, Dr. Watson spent four years at the TI Learning Institute, heading the statistical training program for the Defense and Electronics Group. In that capacity he taught courses in Design of Experiments (DOE), Applied Statistics, Statistical Process Control (SPC), and Queuing Theory. Dr. Watson has a bachelor of arts degree in physics and mathematics from Rice University in Houston, Texas, and a masters and Ph.D. in statistics from the University of Kentucky in Lexington, Kentucky.
This chapter expands the ideas introduced in the paper, Statistical Yield Analysis of Geometrically Toleranced Features, presented at the Second Annual Texas Instruments Process Capability Conference (Nov. 1995). In that paper, we discussed methods to statistically analyze the manufacturing yield (in defects per unit) of part features that are dimensioned using geometric dimensioning and tolerancing (GD&T). That paper specifically discussed features that are located using positional tolerancing.
This chapter expands the prior statistical...
