Technical Articles

Zygo Corporation has published these technical articles:

(Electronics and Microelectronics Manufacturing)
From this Article:
When looking at metrology, general discussion often revolves around the relative merits of contact or non-contact measurement solutions. There is now a drive across nearly all industries for smaller...
(Electronics and Microelectronics Manufacturing)
From this Article:
The most sensitive and high precision optical systems are made possible by the ability to produce optics with - in some instances - sub-angstrom surface roughness. The polishing processes that allow...
(Electronics and Microelectronics Manufacturing)
From this Article:
Technological advances over recent years have elevated metrology from being a "necessary evil" in manufacturing scenarios to enabling technologies, allowing the measurement of previously impossible...
(Electronics and Microelectronics Manufacturing)
From this Article:
While the measurement of super smooth surfaces typically requires the use of optical metrology tools, it is important to realize that not all optical solutions are the same. The metrology option...
(Inspection Tools and Instruments)
From this Article:
Zygo is the market leader in non-contact 3D optical profilers, used in many aspects of production and manufacturing of metal components. Used on the production line, in metrology labs, or integrated...
(Electronics and Microelectronics Manufacturing)
From this Article:
The manufacture of Intelligence, Surveillance, & Reconnaissance (ISR) optics requires a rigorous analysis of the capabilities and methods of an optical component design/manufacturing partner. Not all...
(Electronics and Microelectronics Manufacturing)
From this Article:
Undoubtedly there are many benefits associated with the use of additive manufacturing (AM) as a production technology. Across industries, manufacturers exploit the fact that through the use of AM they...
(Electronics and Microelectronics Manufacturing)
From this Article:
Innovative technology enables form measurement of both front and back surfaces of thin optics, simultaneously. Driven by the demand for smaller and smaller consumer products and semiconductor devices,...