Electronic meters and testers measure or probe electrical and electronic parameters in circuits and systems.
Burn-in Test Equipment (47 suppliers)
Burn-in test equipment uses elevated voltages, temperatures and power cycling to evaluate high power chips, boards or products. The burn-in process accelerates failures normally seen as "infant mortality" in a device.
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Capacitance Testers (45 suppliers)
Continuity Testers (69 suppliers)
Current Leakage Testers (83 suppliers)
Current Testers and Detectors (49 suppliers)
Current testers and detectors check for the presence of current flow in electrical circuits. They are also used to locate current in hidden wires and cables
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Electrical Safety Testers (70 suppliers)
Electrical safety testers are instruments used to test diverse electrical safety such as testing outlet polarity, line voltage level, ampere rating, medical equipment, and others.
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Electrical Test Probes (258 suppliers)
EMC Testers (44 suppliers)
EMI and RFI Testers (46 suppliers)
Field Intensity Meters (40 suppliers)
GFCI Testers (36 suppliers)
Ground fault circuit interrupter (GFCI) testers are used to check for improper wiring conditions in GFCI devices such as electrical receptacles. They detect leakage currents that are smaller than those used in fuses and circuit breakers, but still large enough to cause harmful electric shocks.
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Ground Bond Testers (95 suppliers)
Harmonic Distortion Meters (48 suppliers)
Hipot Testers (144 suppliers)
Magnetic Field Instruments (160 suppliers)
Magnetic field instruments include meters, gauges, recorders and other instrumentation for the measurement of magnetic fields and/or magnetic flux.
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Megohmmeters (128 suppliers)
Megohmmeters generate high voltage, low current signals for testing the breakdown strength of electrical insulation. They are called megohmmeters because the insulating resistance of a properly designed product is expressed in mega ohms (M ).
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Pulse Generators (96 suppliers)
Pulse generators are electrical test equipment used to generate pulses that are injected into devices under test in order to study the behavior of these devices.
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