Monitoring System Eddy Current Instruments

Bar Inspection System (BIS)
from Olympus America, Inc.

The BIS can combine phased array (PA) and eddy current array (ECA) technologies to inspect the full volume and the full surface of round and square bars. The system is based on a unique "Floating Head" concept (PA) and on a "Wear Shoes" concept (ECA) for a constant optimal positioning of probes;... [See More]

  • Form Factor: Monitoring System
  • Applications: Machining / Grinding Damage
  • Instrument Type: Flaw Detectors
Rotating Billet Inspection System (RBIS)
from Olympus America, Inc.

In order to inspect round, large-diameter billets, Olympus has developed high-speed inspection systems, which reach the highest quality standard without any compromise to productivity. [See More]

  • Form Factor: Monitoring System