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Supplier: PCE Instruments / PCE Americas Inc.
Description: The roughness tester PCE-RT 2300 is used to measure the roughness of surfaces. The PCE-RT 2300 roughness meter has a removable motorized sensor. This property makes it possible to determine the surface roughness with the roughness tester even on small or narrow
- Operating Temperature: -4 to 104 F
- Technology: Contact / Stylus Based
- Display & Special Features: Digital Readout
- Mounting / Loading Options: Handheld / Portable
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Supplier: Mahr Inc.
Description: Product features MarSurf 300, the first portable roughness measuring unit with the option of wireless (Bluetooth) connection between the evaluation unit and drive unit. Bluetooth wireless connection Easy to use, with high-resolution color display and ATM-style user guidance Integrated
- Vertical (Z) Range: 0.003543309 to 0.013779535 inch
- Vertical (Z) Resolution: 0.0000003149608 inch
- Operating Temperature: 23 to 104 F
- Standards Compliance: ASME, ISO / EN, JIS
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Supplier: Mahr Inc.
Description: innovative roughness evaluation software. Features Over 80 surface parameters for R-, P- and W-profiles according to current ISO/JIS or MOTIF standards (ISO 12085) Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as required. Comprehensive
- Vertical (Z) Range: 0.009842525 to 0.029527575 inch
- Traverse Length: 0.022047256 to 2.2047256 inch
- Applications: Aerospace / Defense, Automotive, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
- Mounting / Loading Options: Benchtop
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Supplier: Mahr Inc.
Description: Within the "mobile surface metrology" range, MarSurf M 400 provides the necessary range of functions, while at the same time being quick and easy to use. Features Mobile and stationary measuring instrument Roughness and waviness measurements Traversing lengths up to 26 mm Over 50 R , W and P
- Vertical (Z) Range: 0.009842525 to 0.029527575 inch
- Vertical (Z) Resolution: 0.00000003149608 inch
- Traverse Length: 1.0236226 inch
- Scan Rate: 0.0078740157480315 to 0.0393700787401575 in/sec
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: vibration damping and a minimal footprint SURFCOM 2000 Quickly and precisely measure contours and roughness in one measuring run Sensors: Highly accurate, wide-range hybrid probe for contour and surface measurements Measuring range up to 15 mm Options Expandable sensors: contour, surface,
- Measurement Capability: 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
- Standards Compliance: ASME, DIN, ISO / EN, JIS
- Mounting / Loading Options: Benchtop
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: complete data sets can be stored on the internal memory and accessed at any time. PC interface USB and RS 232C interfaces make it possible to transfer the measured values, as well as parameters and profile points directly to a computer. CALYPSO software allows users to merge roughness, form
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
- Standards Compliance: ASME, DIN, ISO / EN, JIS
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability, Video / Graphic Display
- Mounting / Loading Options: Handheld / Portable
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: Flexible CNC measuring station for simple contour measurements All CONTOURECORD machines use the same base column. The only difference is the sensors. With the purchase of additional sensors, you can turn your surface measuring instruments into a contour measuring system – or vice versa.
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
- Standards Compliance: ASME, DIN, ISO / EN, JIS
- Mounting / Loading Options: Benchtop
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
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Machinability of hypereutectic silicon-aluminum alloys
The cutting force and thrust force were measured, and sur- face roughness of Rz ( JIS B 0601-1994) was measured by using a stylus instrument.
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Crater formation mechanism on the surface of a biaxially oriented polypropylene film
The ten-point av- erage roughness ( Rz ) defined by JIS B0601 (1994) was used as the parameter of depth of the crater on the BOPP film surface.
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Study of crater structure formation on the surface of biaxially oriented polypropylene film
Ra, arithmetic mean roughness; Rz , ten points average roughness ( JIS B0601[1994]).
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Influence of Microstructural Inhomogeneity and Residual Stress on Very High Cycle Fatigue Property of Clean Spring Steel
Firstly, the values of average roughness, maximum height of the profile, and ten-point average roughness , Ra, Ry and Rz , JIS , for the hourglass surface of the specimen were measured.
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Effect of pre-heat-treatment on silicon nitride joining with aluminium braze
One end of the rod was ground to a surface roughness of 0.4 #m Rz (ten points average surface roughness standardized in JIS B-0601).
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Fracture of silicon nitride joined with an aluminium braze
Surfaces of rods 5 mm diameter and 20 mm long were ground with a no. 450 diamond wheel to a surface roughness of 0.4#m Rz (ten points average surface roughness standardized in JIS B0601)*.
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Copper Electrodeposition for Nanofabrication of Electronics Devices
In addition, Rz denotes the 10-point average roughness defined by JIS -B-0601- 1994.
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Nonvacuum electron beam cutting and welding—two partnering processes for fast and highly efficient metal working
To evaluate the cutting quality, the edges were scanned by 3D-Lasermicroscopy (Keyence VK-9700) and the rough- ness ( Rz ) has been established to 26 μm according to norm JIS B0601 (1994) which is given by the analysis software of the microscope.
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Influence of casting surfaces on fatigue strength of ductile cast iron
The surface roughness parameters, Rz and RSm, are defined by Japanese Industrial Standards ( JIS ).
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Effect of micro-scale Young’s modulus and surface roughness on adhesion property to plasma-treated rubber surface
The surface roughness parameters, Rz (maximum peak height roughness ) and Rq (root mean square roughness) are defined by JIS B 0601 2001.
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