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Supplier: Phenom-World BV
Description: With the 3D Roughness Reconstruction application, the Phenom desktop SEM systems are able to generate three-dimensional images and submicrometer roughness measurements. 3D imaging helps to interpret sample characteristics and makes images understandable for a larger group of
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Supplier: CIQTEK Co., Ltd
Description: microscopic imaging and analysis.
- Total Magnification: 1 to 1,000,000 X
- Resolution: 3 to 8 nm
- Accelerating Voltage: 0.2 to 30 kilovolts
- Grade: Benchtop, Research
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Supplier: CIQTEK Co., Ltd
Description: CIQTEK SEM5000Pro is a field emission scanning electron microscope with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (Super Tunnel), low aberration, and
- Total Magnification: 1 to 2,500,000 X
- Resolution: 0.8999999999999999 to 1.2999999999999998 nm
- Accelerating Voltage: 0.02 to 30 kilovolts
- Grade: Benchtop, Research
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Supplier: Phenom-World BV
Description: The Phenom desktop SEM with ParticleMetric software allows easy generation and analysis of SEM images. The integrated ParticleMetric software allows the user to gather morphology and particle size data for many submicron particle applications. The fully
- Particle Size Range: 0.1 to 100 µm
- Technology: Microscopy / Image Analysis
- Sample Type: Powder / Solid Particles
- Measurement Type: Shape, Size
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Supplier: CIQTEK Co., Ltd
Description: CIQTEK SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope (FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Benefiting from the upgraded column engineering process, “SuperTunnel” technology, and high-resolution objective lens design, SEM5000X
- Total Magnification: 1 to 2,500,000 X
- Resolution: 0.6 to 1 nm
- Accelerating Voltage: 0.02 to 30 kilovolts
- Grade: Benchtop, Research
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Supplier: Phenom-World BV
Description: The Phenom ProX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system. With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Viewing three-dimensional images of
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection, Flaw Detection, Materials Analysis
- Modules Included: Imaging & Analysis Software
- System Type: Modular / PC-Based
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Supplier: CIQTEK Co., Ltd
Description: immersion electromagnetic & electrostatic combo objective lens to achieve high-speed image acquisition whilst ensuring nano-scale resolution.The automated operation process is designed for applications such as a more efficient and smarter large-area high-resolution imaging workflow. The
- Total Magnification: 66 to 1,000,000 X
- Resolution: 1.2999999999999998 to 3.3 nm
- Accelerating Voltage: 0.1 to 30 kilovolts
- Remote Interface: Computer Interface, Image Analysis Processing Software
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Supplier: ValueTronics International, Inc.
Description: QPSK, O-QPSK, GMSK, FSK, APSK) Bluetooth® analysis of Low Energy, Basic Rate and Enhanced Data Rate P25 analysis of phase I and phase 2 signals WLAN analysis of 802.11a/b/g/j/p, 802.11n, 802.11ac LTE™ FDD and TDD Base Station (eNB) Cell ID & RF measurements Mapping Pulse
- Frequency Range: 7,500,000 kHz
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Want to detect smaller defects? Looking for sharper, clearer inspection images? In semiconductor inspection and failure analysis, improving electron microscope resolution is a constant challenge. However, even with a high (read more)
Browse Power Supplies Datasheets for Daitron Co., Ltd. -
information, including luminance images, from all viewing angles for the light source or lighting system. This provides full flexibility in analysis and in ray set generation. Better Light Source Models Yield Better Design When paired with a near-field measurement (read more)
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TrueTest™ Software family, TrueMURA supplements the many benefits of TrueTest Software to efficiently perform image-based measurements for luminance, chromaticity, and (read more)
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Solartron is pleased to announce the recent acquisition of Gagesoft inc a leading provider of metrology software for quality control. The existing products Gagemate Pro and GageMate Lite are rebranded as Orbit Gauge Software Pro and Orbit Gauge Software Lite. The (read more)
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series FE SEM. The JEOL IT810 series offers the next level of analytical intelligence for high spatial resolution imaging and analysis at the nanoscale. (read more)
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, and consumer satisfaction of all illuminated elements inside and outside the vehicle. Paired with automated analysis software from Radiant’s TrueTest platform, the ProMetric I offers (read more)
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on the market. Discover the breadth of applications for the Renishaw Raman systems Browse the Raman image gallery (read more)
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analysis in forging and other processes where a single imager must capture a broad range of temperatures. Its versatility makes it an ideal choice for engineers and operators seeking reliable performance in high-temperature environments. The (read more)
Browse Thermal Imagers Datasheets for LAND -
analysis of all 16 images may be required or merging them into a thermal image. Instead the ImageIR® 12300 renders the measurement not only in unrivalled image quality but in just one exposure which guarantees the synchronism of all data collected. The ImageIR® 12300 combines precision (read more)
Browse Thermal Imagers Datasheets for InfraTec GmbH -
and instrument air inlet for purging the imager, to allow extended monitoring during high-temperature processes. Advanced IMAGEPro v2 image processing software from AMETEK Land is displayed on a portable tablet that provides a full (read more)
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A Microfluidic System for Biological Particle Enrichment Using Contactless Dielectrophoresis
and in lab. (G) SEM image of the. silicon wafer mold at the trapping zone. (H) Color image of the fabricated device. The main and side channels were filled with dyes to. improve imaging. JALA June 2010 225. Original Report. negative DEP. This is the first cDEP microfluidic device presenting. negative
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New Materials and Processes
The average diameter of electrospun fiber was measured by a SEM image analysis software named Smile View, which collected 100 data to obtain the diameter and distribution of the nanofibers.
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Influence of Grain Shape, Size, and Grain Boundary Diffusion on High-Temperature Oxidation of Pure Metal Fe, Cu, and Zn
The grain size of the oxidized metal is determined using SEM image analysis software .
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The impact of viscoelastic behavior and viscosity ratio on the phase behavior and morphology of polypropylene/polybutene‐1 blends
The number and weight- average diameter of 600 particles of dispersed phase were determined by using the SEM image analyzing software .
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Antimicrobial effects of nanofiber poly(caprolactone) tissue scaffolds releasing rifampicin
Scaffolds were sputter-coated with 10 nm of gold and fiber diameters were measured using SEM image analysis software .
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Cracking and phase stability in reaction layers between Sn-Cu-Ni solders and Cu substrates
The crack length and crack number of IMCs was measured by digital imaging using commercial SEM image analysis soft- ware , JEOL AnalysisStation.
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Mechanical and morphological characteristics of poly(vinyl alcohol)/chitosan hydrogels
The images were analyzed with SEM Image Analysis software (Oxford Instruments, Abingdon, Oxfordshire, UK).
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Microstructural Analysis of Laser-Beam-Welded Directionally Solidified INCONEL 738
Cracking susceptibility of the welds made along longitudinal and transverse directions was determined by measuring the length of cracks in 10 sections of each weld using SEM image analysis soft- ware .
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Enhanced Hole Mobility in Regioregular Polythiophene Infiltrated in Straight Nanopores
The etched films were then rinsed thoroughly in water, dried, and characterized with SEM image analysis software to obtain the average pore size and porosity for each anodization voltage.
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Presence and density of Helicobacter pylori biofilms in human gastric mucosa in patients with peptic ulcer disease
Total surface area, biofilm density, and percent of total surface area covered by biofilm was calcu- lated using Carnoy SEM image analysis software (analysis software for LM, SEM, and TEM images; Carnoy, Flanders, Belgium).
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Particulate strengthened Ni–Al2O3 microcomposite HARMs for harsh-environmental micromechanical applications
The overall Al2O3 percentage in the deposits, however, was calculated using a combination of WDS and an SEM image analysis software . .