TABLE OF CONTENTS Spin-SEM provides a powerful tool for the investigation of magnetic domain structures in ultrathin films. The very unique feature is that the magnetization orientation is measured with high spatial resolution. This has been successfully applied in studying the internal structure of domain walls, spin-reorientation in ultrathin films, and exchange coupling in films. Further developments are still under progress, pushing the limits of spatial resolution into the range of a few nanometers. A big step forward would be achieved if spin-polarization analyzers with higher sensitivity were available. Preparation techniques have been developed that allow the investigation of nearly all kinds of samples with SEMPA. The first in-field imaging has been successfully demonstrated.
Acknowledgement. HPO would like to thank G. Steierl and J. Kirschner for allowing their images to be included prior to publication. Support from the "Bundesministerium f r Bildung und Forschung" (No. 13N7331/4) is gratefully acknowledged. HH gratefully acknowledges research support from the NSF. The SEMPA project was also supported by the Sony Research Center.
