Adhesion to Fluoropolymers

| ASTM | American Society for Testing Materials |
| AT-FTIR | attenuated reflectance - Fourier transform infrared spectroscopy |
| at. | atom |
| 13CNMR | carbon 13 nuclear magnetic resonance |
| DC | direct current |
| DDM | diaminodiphenylamine |
| DEAPA | diethylaminopropylamine |
| DMF | dimethylformamide |
| DMSO | dimethylsulfoxide |
| E o | standard electrode potential |
| ECTFE | copolymer of ethylene and chlorotrifluoroethylene |
| ESCA | electron spectroscopy for chemical analysis |
| E-TFE | copolymer of ethylene and tetrafluoroethylene |
| FEP | copolymer of tetrafluoroethylene and hexafluoropropylene |
| ?G o | standard free energy |
| GHz | gigahertz |
| GLD | glow discharge |
| GMA | glycidyl methacrylate |
| HPFP | hydropentafluoropropylene |
| HS | protic solvent |
| IR | infrared |
| IR-IRS | reflection infrared analysis |
| K | Kelvin |
| kHz | kilohertz |
| LDPE | low density polyethylene |
| LF | low frequency |
| m | metre |
| mm | millimetre |
| MHz | megahertz |
| MPa | megapascal |
| MW | microwave |
| N | Newton |
| nm | nanometre |
| Pa | pascal |
| PE | polyethylene |
| PET | poly(ethylene terephthalate) |
| PCTFE | polychlorotrifluorethylene |
| PFA | copolymer of tetrafluoroethylene and perfluoro(propyl vinyl ether) |
| PLL | poly(L-lysine) |
| PMMA | poly(methyl methacrylate) |
| ppGMA | polymerised glycidyl methacrylate |
| PTFE | polytetrafluoroethylene |
| PVDF | poly(vinylidene fluoride) |
| PVF | poly(vinyl fluoride) |
| RBS | Rutherford back scattering |
| RF | radio frequency |
| SCE | standard calomel electrode |
| SEM | scanning electron microscopy |
| SFE | surface free energy |
| SSIMS | static secondary ion mass spectrometry |
| TBAB | tetrabutylammonium bromide |
| TBAT | tetrabutylammonium tetrafluoroborate |
| TEM | transmission electron microscopy |
| TFE | tetrafluoroethylene |
| TOA | take off angle |
| TPP | triphenylphosphine |
| UV | ultraviolet |
| UV-vis | ultraviolet visible |
| VDF | vinylidene fluoride |
| VUV | vacuum ultraviolet |
| XPS | x-ray photoelectron spectroscopy |
| ? | contact angle |
| ? A | advancing contact angle |
| ? R | receding contact angle |
| ? | wavelength |
| m | micron |