Reliability Modeling, Analysis and Optimization

Reliability Modeling, Analysis and Optimization

Hoang Pham

Rutgers University, USA

World Scientific
NEW JERSEY LONDON SINGAPORE BEIJING SHANGHAI HONG KONG TAIPEI CHENNAI

Published by

World Scientific Publishing Co. Pte. Ltd.
5 Toh Tuck Link, Singapore 596224
USA office: 27 Warren Street, Suite 401-402, Hackensack, NJ 07601
UK office: 57 Shelton Street, Covent Garden, London WC2H 9HE

British Library Cataloguing-in-Publication Data
A catalogue record for this book is available from the British Library.

2006 by World Scientific Publishing Co. Pte. Ltd.

ISBN 9789812563880

All rights reserved. This book, or parts thereof, may not be reproduced in any form or by any means, electronic or mechanical, including photocopying, recording or any information storage and retrieval system now known or to be invented, without written permission from the Publisher.

For photocopying of material in this volume, please pay a copying fee through the Copyright Clearance Center, Inc., 222 Rosewood Drive, Danvers, MA 01923, USA. In this case permission to photocopy is not required from the publisher.

ISBN 981-256-388-1

Typeset by Stallion Press
Email: enquiries@stallionpress.com

Dedication

To

Michelle, Hoang Jr. and David

List of Contributors

K. K. Aggarwal

GGS Indraprastha University, India

M. Arafuka

Kinjo Gakuin University, Japan

W. Bodhisuwan

King Mongkut s Institute of Technology North Bangkok, Thailand

W.-T. Cheong

National University of Singapore, Singapore

J. K. Chhabra

National Institute of Technology, India

C. Cocozza-Thivent

Universit de Marne-la-Vall e, France

T. Dohi

Hiroshima University, Japan

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