Reliability Modeling, Analysis and Optimization

C. Cocozza-Thivent* and R. Eymard
Laboratoire d Analyse et de Math matiques Appliqu es
(CNRS-UMR 8050),
Universit de Marne-la-Vall e, Cit Descartes,
5 boulevard Descartes,
Champs sur Marne,
77454 Marne-La-Vall e Cedex 2,
France
*christiane.cocozza@univ-mlv.fr
robert.eymard@univ-mlv.fr
Industrial devices must be designed to prevent possible severe consequences from the failure of a device component. A way to ameliorate this design is to use probabilistic models of the device, from which technical and economical expectations can be drawn. Let us first give a mathematical background of such models. We consider a semi-Markov process ( ? t) t ?0 taking its values in a finite space E. Let T 0 = 0 and T n ( n ? 1) be the successive jump times of this process. We assume that the semi-Markov kernel of the process has a density q with respect to the Lebesgue measure. This means that, for all i 0, i 1, , i n ?1, i, j
E, all 0 < s 1 < < s n,...