EIA Standard: Use of Semiconductor Devices Outside Manufacturers' Specified Temperature Ranges

Annex A: Device Parameter Re-characterization

A.1 Glossary of Symbols

The following terms and definitions are used in this Annex.

T room:
Room temperature (25 C)
T rated-max:
Maximum temperature at which part manufacturer guarantees operation of a part in accordance with the published data sheet
T rated-min:
Minimum temperature at which part manufacturer guarantees operation of a part in accordance with the published data sheet
T req-max:
Maximum temperature at which the part is required to operate in a system
T req-min:
Minimum temperature at which the part is required to operate in a system
T test-max:
Maximum temperature at which the part is tested, usually more than T req-max
T test-min:
Minimum temperature at which the part is tested, usually less than T req-min
UL:
Maximum limit of a parameter value in the part manufacturer specified temperature range (Specified by part manufacturer)
LL:
Minimum limit of a parameter value in the part manufacturer specified temperature range (Specified by part manufacturer)
UL Max:
Maximum allowable upper limit for a parameter for proper system operation
LL Min:
Minimum allowable upper limit for a parameter for proper system operation
UL New:
New maximum parameter value limit if the parameter limit is modified
LL New:
New minimum parameter value limit if the parameter limit is modified
M UL:
Margin of tested parameter value at extremes of target application temperature range with UL
M LL:
Margin of tested parameter value at extremes of target application temperature range...

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