TABLE OF CONTENTS Device parameter conformance assessment consists of evaluating electrical parameters at target thermal test points that are higher or lower than the manufacturers' specified ratings. For this uprating method, the specifications, conditions, and test limits used are the manufacturers published data sheet parameters.
The following references to statistical methods are suggested as tools in determining the statistical confidence in the options listed in this annex.
Montgomery D. C., and Runger G. C., "Applied Statistics and Probability for Engineers," John Wiley and Sons, Inc., New York, 1994
Pfaffenberger R., and Patterson J., "Statistical Methods," Irwin Publishers, 1987
Ireson G., "Reliability Handbook," 1966
A test plan should be defined that documents the required tests, process steps, test methods, and number of samples. Figure 19 shows a flow diagram of Parameter Conformance Assessment testing.
All critical application parameters should be identified, and values obtained from the manufacturer's published data sheet. Ideally, all electrical parameters should be tested; however, this is not always possible or practical. For example, it may be difficult to conduct a complete functional test if the applicable test program is not available from the device manufacturer. The manufacturer's specified test parameters (with the exception of the test temperature limits) should be used as device performance specifications for parameter conformance assessment.
Factors to be considered in developing the test plan for parameter conformance assessment are the specified temperature range of the device, the target temperature range, and previous experience...
