Electronic Noise and Interfering Signals: Principles and Applications

References

1. IEEE(1997): IEEE Standard Dictionary of Electrical and Electronics Terms. Wiley Interscience, New York

2. Pearsall J., Trumble B.(1996): The Oxford English Reference Dictionary. Oxford University Press, Oxford

3. R. F. Graf (ed.) (1977): The Modern Dictionary of Electronics. Howard W. Sams & Co., Indianapolis

4. M. J. Clugston (ed.) (1998): The New Penguin Dictionary of Science. Penguin Books, London

5. Rheinfelder W. A. (1964): Design of Low-Noise Transistor Input Circuits. Iliffe Book Ltd., London

6. Hartmann K. (1976): Noise characterization of linear circuits . IEEE Trans. on Circ. and Syst., CAS-23(10), 581 590

7. Visweswariah C., Haring R. A., and Conn A. R. (2000): Noise consideration in circuit optimization . IEEE Trans. on Computer-Aided Design of Int. Circ. and Syst., 19(6), 679 690

8. Shephard K. L., Narayanan V., and Rose R. (1999): Harmony: static noise analysis of deep submicron digital integrated circuits . IEEE Trans. on Computer-Aided Design of Int. Circ. and Syst., 18(8), 1132 1150

9. HP Company (1998): Noise sources in CMOS image sensors .

10. Tian H., Fowler B. and El Gamal A. (2001): Analysis of temporal noise in CMOS photodiode active pixel sensor . IEEE Journal of Solid-State Electronics, 36(1), 92 101

11. Balamurugan G., Shanbhag N. R. (2001): The twin-transistor noise-tolerant dynamic circuit technique . IEEE Journal of Solid-State Circuits, 36(2), 273 280

12. Jou S-J., Kuo S-H., Chiu J-T., and Lin T-H. (2001): Low switching noise and load-adaptive output buffer design techniques . IEEE Journal of Solid-State Circuits, 36(8), 1239 1249

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