Six Sigma for Electronics Design and Manufacturing

2.6: References and Bibliography

2.6 References and Bibliography

Bowker A. and Lieberman G. Engineering Statistics. Engelwood Cliffs, NJ: Prentice-Hall, 1972.

Box, G. and Hunter W. Statistics for Experimenters. New York: Wiley, 1978.

Burr, I. Engineering Statistics and Quality Control. New York: McGraw Hill, 1953.

Chan, L. et al. "A New Measure for Process Capability: Cpm." Journal of Quality Technology, 20, 3, 162 175, July, 1988.

Clausing D. and Simpson H. "Quality by Design." Quality Progress, January 1990, 41 44.

Crosby, P. Quality Is Free. New York: McGraw Hill, 1979.

Deming, Edwards. Quality, Productivity and Competitive Position. Published video lectures and notes. MIT Center for Advanced Engineering Studies. 1982.

Devore, J. Probability and Statistics for Engineering and the Sciences. Belmont, CA: Brooks/Cole, 1987.

Dixon W. and Massey, F. Introduction to Statistical Analysis. New York: McGraw Hill, 1969.

Ducan, Acheson J. Quality Control and Industrial Statistics, 4th ed. Homewood IL: Irwin. 1995.

Feigenbaum, A. V. Total Quality Control, 3rd ed. New York: McGraw Hill, 1983.

Gill, Mark S. "Stalking Six Sigma." Business Month Journal, January, 1990.

Ishikawa, K. Guide to Quality Control ( rev. ed.). Tokyo: Asian Productivity Institute, 1976.

Juran, J. and Gryna, F. Quality Control Handbook, 4th ed. New York: McGraw Hill, 1979.

Juran, J. and Gryna, F. Quality Planning and Analysis. New...

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