X-ray Nondestructive Testing (NDT) Material Testers

15 Results
Analyzer for Measuring Coating Thickness -- X-Strata920
from Hitachi High-Tech America

Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds. Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique,... [See More]

  • Instrument Technology: Radiographic / X-ray
  • Measurement Capability: Alloy Sorting / Content
XRF Analyzer for Automated Material Analysis -- Vanta™ iX
from Evident Scientific

The Olympus Vanta ™ iX in-line X-ray fluorescence (XRF) analyzer gives you confidence in your products by automating material analysis and alloy identification on the manufacturing line:Delivers instant results for real-time process monitoring and 100% inspectionBuilt to operate 24/7Configured... [See More]

  • Instrument Technology: Radiographic / X-ray
  • Form Factor: In-Line
Automated XRF for rapid coatings analysis -- FT200 Series
from Hitachi High-Tech America

The FT200 Series benchtop XRF analyzers have been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a series of ground-breaking analyzers that... [See More]

  • Instrument Technology: Radiographic / X-ray
  • Form Factor: Bench / Rack / Cabinet
Coating Thickness Analyzer -- FT110A
from Hitachi High-Tech America

The FT110A helps a broad range of industries ensure plating specifications are met to avoid the risks of inferior performance and the costs associated with scrap or rework. In addition, it helps increase productivity by reducing the time needed to set up a series of measurements. Accuracy and... [See More]

  • Instrument Technology: Radiographic / X-ray
  • Measurement Capability: Alloy Sorting / Content
Microspot XRF Ultra Thin Coating Analyzer -- FT160
from Hitachi High-Tech America

Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds. Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique,... [See More]

  • Instrument Technology: Radiographic / X-ray
  • Measurement Capability: Alloy Sorting / Content
  • Form Factor: Bench / Rack / Cabinet
Carestream INDUSTREX Digital System -- HPX-1 Plus Digital System
from Carestream NDT

The new HPX-1 Plus has the capability to handle extra long plates, custom cut plates & rigid cassettes. Improved optics for better imaging, 30% faster throughput on long saturated plates, improved imaging plate transport system, higher mechanical reliability and a more user-friendly DICONDE... [See More]

  • Instrument Technology: Radiographic / X-ray
  • Form Factor: Bench / Rack / Cabinet; Portable / Handheld / Mobile
Compact Television-Type Universal X-Ray Inspection Unit -- AIO-901
from Rigaku Corporation

All-in-one, compact and reasonably priced evaluation unit. It can take x10 magnification radiography. It can be used for broad range of inspection, such as blows or cracks of aluminum dye-castings, BGAs or bonding wires of ICs, electronic components and patterns of circuit boards [See More]

  • Instrument Technology: Radiographic / X-ray
  • Applications: Universal
  • Form Factor: Cart
Desktop Coating Thickness Measurement Instrument -- GOLDSCOPE
from Fischer Technology, Inc.

With its GOLDSCOPE series, Fischer offers a tailored solution for the non-destructive testing of gold and precious metals. The hardware and software of these robust X-ray fluorescence instruments is adapted to the unique requirements of the jewelry and gold sector. Focusing on the most important... [See More]

  • Instrument Technology: Eddy Current / Electromagnetic; Radiographic / X-ray
  • Measurement Capability: Conductivity / Resistivity Instruments
  • Form Factor: Bench / Rack / Cabinet
X-Ray Inspection System -- 1600
from Matsusada Precision, Inc.

12 bit density resolution,distance,angle and area measuring, 3D [See More]

  • Instrument Technology: Radiographic / X-ray
  • Applications: Material Inspection, Microelectronics
  • Form Factor: Bench / Rack / Cabinet
  • Features: Programmable / Digital Control Unit
High-Sensitivity Universal X-Ray Inspection Unit -- AIO-601
from Rigaku Corporation

All-in-one, compact and reasonably priced evaluation unit. The low power and high sensitivity make it possible to offer clear graphics of polymer products. It can also detect a hair [See More]

  • Instrument Technology: Radiographic / X-ray
  • Applications: Universal
  • Form Factor: Cart
EDXRF Instrument for Non-destructive Microstructure Wafer Metrology -- FISCHERSCOPE® X-RAY XDV®-µ SEMI
from Fischer Technology, Inc.

The FISCHERSCOPE X-RAY XDV- μ SEMI is an automated measurement system optimized for the quality control of micro-structures in complex 2.5D/3D packaging applications in the semiconductor industry. Fully automated analysis prevents damage to valuable wafer material. And consistent test conditions... [See More]

  • Instrument Technology: Radiographic / X-ray
  • Form Factor: Bench / Rack / Cabinet
Rapid X-Ray Stress Analyzer -- PSPC/MSF
from Rigaku Corporation

Uses X-rays to non-destructively measures the residual stress accumulated in a material during the manufacturing process. Different frame sizes accommodate small, medium and large samples. The position-sensitive proportional counter (PSPC) permits high-speed measurement. Compared with the... [See More]

  • Instrument Technology: Radiographic / X-ray
  • Measurement Capability: Residual Stress
  • Form Factor: Floor
  • Features: Pulsed Unit
High Performance X-Ray Fluorescence Measuring Instrument with Vacuum Chamber for non-destructive Coating Thickness Measurement and Material Analysis -- FISCHERSCOPE® X-RAY XUV® 773
from Fischer Technology, Inc.

The vacuum measurement chamber of devices in the XUV ® range enables the verification of light materials from sodium onwards by means of X-ray fluorescence analysis (RFA). Because of the radiation-absorbing properties of room air, it is normally not possible to use this method. For this reason... [See More]

  • Instrument Technology: Radiographic / X-ray
  • Form Factor: Bench / Rack / Cabinet
X-Ray Stress Analyzer -- MSF/PSF-3M
from Rigaku Corporation

These analyzers use X-ray diffraction to nondestructively test residual stress in materials. Residual stress may be created during the manufacturing process of a material, or it may accumulate in a structure over many years in operation. In either case, this stress can have a serious negative effect... [See More]

  • Instrument Technology: Radiographic / X-ray
  • Measurement Capability: Residual Stress
  • Form Factor: Floor
X-ray Fluorescence Instrument -- FISCHERSCOPE® X-RAY XAN® 500
from Fischer Technology, Inc.

Handheld, desktop, inline: the XAN ®500 X-ray fluorescence instrument is Fischer ’s most versatile yet. It can be used as a handheld device, as a fully enclosed desktop unit or integrated directly into production lines. Equipped with a tablet computer, the XAN500 also utilizes the... [See More]

  • Instrument Technology: Radiographic / X-ray
  • Form Factor: Portable / Handheld / Mobile