Design and Development of Medical Electronic Instrumentation

Chapter 4 - Electromagnetic Compatibility And Medical Devices: Susceptibility to Fast Power Line Transients

Susceptibility to Fast Power Line Transients

IEC-61000-4-4 deals with the immunity that devices must present against repetitive fast
transients that may be induced, for example, by inductive disconnects on the power line circuit
from which the medical device is powered. Electrical fast transients (EFTs) are caused
any time that gaseous discharge occurs (a spark in air or other gas), the most common being
the opening of a switch through which current is flowing. As the switch is opened, arcing
occurs between the contacts: first at low voltage and high frequency while contacts are close
together, and later at a higher voltage and lower frequency as the contacts separate.

Figure 4.28 shows the experimental setup to test for susceptibility to EFT. The device
under test is placed in the approximate center of a reference ground plane and is powered
and operated under worst-case conditions. Throughout the test, the device under test is
observed for any indications of erratic operation. Transients are applied to the power leads
through the use of a coupling/decoupling network. In this network, 33-nF capacitors couple
the high-voltage pulses from the EFT burst generator between ground and the live and
neutral lines of the device under test’s power input. The network also includes a filter to
prevent the high-voltage pulses from coupling into the real power line.

The device under test is subjected to 1-kV discharges to the ac power input leads. Each
pulse should reach 900 V by 5 ns ± 30% and should spend no more than 50 ns ± 30%
above 500V. The burst of pulses is delivered with a 5-kHz repetition rate. Both positive
and negative polarity discharges are applied. For each discharge sequence the duration is

Figure 4.25 Construction details for the Blumlein generator. The TEM horn antenna is formed from two truncated triangular pieces of single-sided PCB and edge-soldered to the Blumlein generator board. The spark gap is in a bronze U shape with a bolt that permits the discharge gap to be adjusted.

1 minute with a 1-minute pause between sequences. EFT is capable of inducing EMI
within the device under test over a 60-MHz bandwidth.

A capacitive coupling clamp is used to couple bursts onto signal, data, I/O, and tele-
communications lines. The coupling clamp is really a 1-m-long metallic plate that couples the
EFT to signal lines without galvanic connection. This plate is suspended by insulator
blocks 10 cm over a reference ground plane. An EFT generator is a relatively complex
piece of equipment. However, for design-time testing, Guettler [1999] proposed a simple
line-disturbance simulator which generates inductive-disconnect transients through the use
of a fluorescent-lamp ballast inductor and a modified glow-discharge starter. In the circuit
shown in Figure 4.29, a fluorescent-lamp glow-discharge starter is modified by removing
its noise-suppression capacitor. In operation, when SW2 is closed, the glow-discharge
starter SW3 switches on and off at random. The abrupt current variations through the


Figures 4.26 and 4.27


Figure 4.28 Setup for assessing the susceptibility of a medical device to electrical fast transients (EFTs). This test simulates the power line transients that are caused by switching off an inductive load.


fluorescent lamp ballast L5 induce noise at the device under the test’s power line input. An
LRC network filters the transients so that they do not flow back into the real power line.



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