Product Announcements:
Interferometers

Micro-Epsilon's IMS5400-TH white light interferometer measures thickness with nanometer accuracy from a large distance. Distance-independent measurement delivers reliable results even on moving objects such as thin layers, flat glass and films. Read more...

Micro-Epsilon's IMS5420 white light interferometer measures monocrystalline silicon wafers without contact. One sensor handles undoped, doped and highly doped wafers and achieves signal stability of less than 1 nm. Read more...

Micro-Epsilon's IMS5200-TH white light interferometer measures transparent films inline from 1 µm to 100 µm. Measuring rates up to 24 kHz support fast, nanometer-precise layer control in production processes. Read more...

Micro-Epsilon's interferometer sensor IMP-NIR-TH3/90/IP68 is designed for inline thickness measurement of silicon and silicon carbide wafers. A 90° beam path, IP68 protection and air purge support stable results in demanding production environments. Read more...

The size of the XL-80 laser and XC-80 compensator means that a complete linear system can fit into a 'wheelie-case' and weighs only 12 kg. Add the tripod, in its own fabric case and you have a truly portable solution to machine metrology. Both the laser and compensator connect to your PC via USB so there is no separate interface required and no complicated set-up to worry about. Read more...