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Supplier: Accuris
Description: STANDARD GUIDE FOR ELECTRON BEAM EFFECTS IN AUGER ELECTRON SPECTROSCOPY
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Supplier: Accuris
Description: STANDARD GUIDE FOR DEPTH PROFILING IN AUGER ELECTRON SPECTROSCOPY
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Supplier: Accuris
Description: STANDARD PRACTICE FOR REPORTING DATA IN AUGER ELECTRON SPECTROSCOPY
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Supplier: Accuris
Description: STANDARD PRACTICE FOR ELEMENTAL IDENTIFICATION BY AUGER ELECTRON SPECTROSCOPY
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Supplier: ASTM International
Description: 1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy. 1.2 Guidelines are given for depth profiling by the following: 1.3 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the
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Supplier: CSA Group
Description: ISO/TR 18394:2016 provides guidelines for identifying chemical effects in X-ray or electron-excited Auger-electron spectra and for using these effects in chemical characterization.
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Description: ISO/TR 18394:2006 provides guidelines for identifying chemical effects in X-ray or electron-excited Auger-electron spectra and for using these effects in chemical characterization.
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Supplier: ASTM International
Description: 1.1 This guide outlines the origins and manifestations of unwanted electron beam effects in Auger electron spectroscopy (AES). 1.2 Some general guidelines are provided concerning the electron beam parameters which are most likely to produce these effects and
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Description: ISO 16242:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using Auger electron spectroscopy (AES). It includes information that is to be recorded on or in the analytical record.
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Supplier: CSA Group
Description: ISO 16242:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using Auger electron spectroscopy (AES). It includes information that is to be recorded on or in the analytical record.
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Supplier: CSA Group
Description: ISO 15471:2016 specifies the requirements for the description of specific aspects of the performance of an Auger electron spectrometer.
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Description: ISO 15471:2004 describes the way in which specific aspects of the performance of an Auger electron spectrometer shall be described.
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Supplier: ASTM International
Description: 1.1 This guide outlines the types of chemical effects and matrix effects which are observed in Auger electron spectroscopy. 1.2 Guidelines are given for the reporting of chemical and matrix effects in Auger spectra. 1.3 Guidelines are given for utilizing Auger
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Supplier: ASTM International
Description: ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS). 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish
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Description: ISO 24236:2005 specifies a method for evaluating the constancy and repeatability of the intensity scale of Auger electron spectrometers, for general analytical purposes, using an electron gun with a beam energy of 2 keV or greater. It is only applicable to instruments that
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Supplier: CSA Group
Description: ISO 24236:2005 specifies a method for evaluating the constancy and repeatability of the intensity scale of Auger electron spectrometers, for general analytical purposes, using an electron gun with a beam energy of 2 keV or greater. It is only applicable to instruments that
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Supplier: Cambridge Polymer Group, Inc.
Description: appropriate. Test methods can be transferred to the client for in-house quality control. Rheological Analysis: Shear and extensional rheological characterization Morphological Analysis: Scanning electron microscopy (SEM), transmission electron microscopy (TEM) Chemical Analysis:
- Standards (Test / Certify To): ASTM, NIST, OEM Specific
- Materials: Adhesives / Sealants, Chemicals, Coatings, Composites, Cosmetics (Creams, Sunblocks, etc.), Fuel Cell / Battery Materials, Nanomaterials, Paper, Petroleum Fluids (Oil, Fuel, Distillates), Plastic / Rubber, Polymers / Organics, Powders, Solid Waste, Textiles, Volatiles (VOCs) / Solvents, Wafers /
- Capabilities: Assays / Quantitative, Chemical Testing Services, Cleanliness Monitoring / Testing, Deformulation / Reverse Engineering, Failure Analysis, Materials Testing Services, Report Preparation, Standards Testing / Certification
- Test Methods: Auger Spectroscopy (AES), Chemical Extraction, Chromatography (GC, HPLC, etc.), Diffraction (X-ray, Electron, etc.), Inductively Coupled Plasma (ICP / LA-ICP), Infrared Spectroscopy (FTIR, etc.), Mass Spectroscopy (RGA, etc.), Mechanical Testing, Microscopy / Metallography, Nondestructive Testing,
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Supplier: Element Materials Technology
Description: X-Ray Fluorescent Analyzer Optical Emission Spectroscopy (OES) Portable Optical Emission Spectroscopy (OES) Atomic Absorption (AA) Analyzers Inductively Coupled Plasma (ICP) Combustion/IR Analyzers Gas Chromatography/Mass Spectrometry (GC/MS) Analyzers Glow Discharge Spectrometers
- Standards (Test / Certify To): ASTM, AWS, EPA, MIL-SPEC, OEM Specific, RoHS
- Materials: Adhesives / Sealants, Air, Ceramics / Glass, Chemicals, Coatings, Composites, Concrete / Mortar, Inorganics, Metals, Paper, Petroleum Fluids (Oil, Fuel, Distillates), Plastic / Rubber, Polymers / Organics, Powders, Soil, Textiles, Thin Films / Plating, Toxins / Restrictive Substances, Volatiles
- Industry: Aerospace / Aviation, Automotive, Chemical / Material Processing, Food / Beverage, Health Care / Medical, Legal / Forensics, Marine, Military, Nuclear / Utility, Packaging, Pharmaceutical / Biotech, Piping / Pressure Vessel, Semiconductors / Electronics, Structural / Construction
- Test Methods: Ash Testing / Filler Content, Atomic Absorption Spectroscopy (AA), Auger Spectroscopy (AES), Chemical Extraction, Chromatography (GC, HPLC, etc.), Combustion Analysis, Diffraction (X-ray, Electron, etc.), Inductively Coupled Plasma (ICP / LA-ICP), Infrared Spectroscopy (FTIR, etc.), Mass
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Supplier: SAE International
Description: characterize these materials. Therefore, we have employed a combination of surface analysis (Auger electron spectroscopy) and x-ray fluorescence to obtain a more detailed characterization of the zirconium oxide-based pretreatment coatings. These methods allow for an assessment
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Supplier: Integrity Testing Laboratory Inc.
Description: No Description Provided
- Standards (Test / Certify To): ASTM, MIL-SPEC, OEM Specific, RoHS
- Materials: Adhesives / Sealants, Ceramics / Glass, Chemicals, Coatings, Composites, Concrete / Mortar, Fuel Cell / Battery Materials, Inorganics, Metals, Nanomaterials, Paper, Petroleum Fluids (Oil, Fuel, Distillates), Plastic / Rubber, Polymers / Organics, Powders, Soil, Solid Waste, Textiles, Thin Films /
- Industry: Aerospace / Aviation, Automotive, Chemical / Material Processing, Food / Beverage, Marine, Military, Nuclear / Utility, Packaging, Pharmaceutical / Biotech, Piping / Pressure Vessel, Semiconductors / Electronics, Structural / Construction
- Test Methods: Ash Testing / Filler Content, Auger Spectroscopy (AES), Chemical Extraction, Inductively Coupled Plasma (ICP / LA-ICP), Infrared Spectroscopy (FTIR, etc.), Mass Spectroscopy (RGA, etc.), Microscopy / Metallography, Optical Emission Spectroscopy, Particle Size / Sieve Analysis, Property Testing,
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Supplier: ANALYZE Inc.
Description: ANALYZE is one of the premier independent consulting laboratories and specialty chemical product manufacturers in the United States that supports clients operating throughout the global economy. The company, headquartered in Metropolitan Phoenix, Arizona, has an international team of chemists with
- Standards (Test / Certify To): ASTM, OEM Specific
- Materials: Adhesives / Sealants, Chemicals, Coatings, Composites, Cosmetics (Creams, Sunblocks, etc.), Fuel Cell / Battery Materials, Microbiological (Mold, Bacterial), Petroleum Fluids (Oil, Fuel, Distillates), Plastic / Rubber, Polymers / Organics, Powders
- Industry: Aerospace / Aviation, Automotive, Chemical / Material Processing, Food / Beverage, Health Care / Medical, Packaging, Pharmaceutical / Biotech, Semiconductors / Electronics
- Test Methods: Ash Testing / Filler Content, Auger Spectroscopy (AES), Chemical Extraction, Chromatography (GC, HPLC, etc.), Infrared Spectroscopy (FTIR, etc.), Mass Spectroscopy (RGA, etc.), Nondestructive Testing, Optical Emission Spectroscopy, Particle Size / Sieve Analysis, Property Testing, Rheology, Scanning
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Supplier: Oneida Research Services, Inc.
Description: Oneida Research Services offers advanced analytical testing services for the microelectronics, telecommunications, aerospace, automotive, medical and defense industries. Throughout our 40 years of providing materials analysis services to the electronics industry, Oneida Research Services has
- Standards (Test / Certify To): ASME, ASTM, MIL-SPEC, RoHS
- Test Methods: Acoustic Microscopy (SAM), Auger Spectroscopy (AES), Chromatography (GC, HPLC, etc.), Hermeticity Testing, Inductively Coupled Plasma (ICP / LA-ICP), Infrared Spectroscopy (FTIR, etc.), Mass Spectroscopy (RGA, etc.), Mechanical Testing, Nondestructive Testing, Scanning Electron Microscopy, Trace
- Materials: Adhesives / Sealants, Air, Ceramics / Glass, Chemicals, Coatings, Composites, Concrete / Mortar, Fuel Cell / Battery Materials, Gases, Heavy Metals (Lead, Chromium, etc.), Inorganics, Metals, Nanomaterials, Paper, Plastic / Rubber, Polymers / Organics, Powders, Thin Films / Plating, Volatiles (VOCs)
- Industry: Aerospace / Aviation, Automotive, Chemical / Material Processing, Food / Beverage, Health Care / Medical, Marine, Military, Nuclear / Utility, Packaging, Pharmaceutical / Biotech, Piping / Pressure Vessel, Semiconductors / Electronics
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Semi F19-0185 and Quality Assurance for the Semiconductor Industry: Electropolishing Makes the Grade
for the manufacture of semiconductors are subjected to detailed surface analysis using Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS) and Scanning Electron Microscopy (SEM) to ensure a surface is free of flaws and polished to an Ra level lower than that typically specified
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Failure Analysis of Die Bond Adhesion Failures Caused by Silicone Contamination
used to mount the wafer during the die sawing operation. The analytical equipment and methodology used to determine the failure mechanism are described. Auger Electron Spectroscopy and X-ray Photoelectron spectroscopy are used to identify the elements and their chemical states on the die bonding
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Indicates content that may require registration and/or purchase.
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Auger Electron Spectroscopy (AES) ......................
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Handbook of Applied Solid State Spectroscopy
Auger Electron Spectroscopy ..............................................................
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Practical Materials Characterization
Chapter 3 covers X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES), which probe chemical states and chemical properties of materials.
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Springer Handbook of Metrology and Testing
Auger electron spectroscopy .
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Surface Analysis: The Principal Techniques 2nd Edition Complete Document
2 Auger Electron Spectroscopy Hans Jorg Mathieu ¨ 2.1 2.2 Introduction Principle of the Auger Process 2.2.1 Kinetic Energies of Auger Peaks 2.2.2 Ionization C ross-Section 2.2.3 Comparison of Auger and Photon Emission …
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Fundamentals of Nanoscale Film Analysis
Nonradiative Transitions and Auger Electron Spectroscopy ..
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Springer Handbook of Materials Measurement Methods
Auger electron spectroscopy AFM .
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
Following a study of the physical characterization of the surface, the surface may be analyzed by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), or secondary ion mass spectrometry (SIMS).
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http://dspace.mit.edu/bitstream/handle/1721.1/62054/707926171-MIT.pdf?sequence=2
The total amount of oxygen adsorbed on the surface is quantified using Auger electron spectroscopy .
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Surface Science: Foundations of Catalysis and Nanoscience 3rd Edition
… electron diffraction (LEED) Advanced Topic: LEED structure determination 2.6 Electron spectroscopy 2.6.1 X-ray photoelectron spectroscopy (XPS) 2.6.2 Ultraviolet photoelectron spectroscopy (UPS) Advanced Topic: Multiphoton photoemission (MPPE) 2.6.3 Auger electron spectroscopy (AES) 2.6.4 …