Microscope Autofocus System

Description: Integrates Seamlessly with PI Piezo-Z Stages or PIFOC® Objective Scanners Extremely Fast Laser Based System Works with Microscopes from Industry Leaders

Description: -quality images using basic features, and offers the market's fastest loading and imaging time. The reliable autofocus and source alignment make this the most user-friendly system on the market. The Phenom Pure is the most economic and efficient tool for high-resolution imaging. Its

• Application: Biological / Life Science
• Digital Display: Yes
• Grade: Benchtop
• Microscope Type: Scanning Electron Microscope (SEM)

Description: FLEXBAR DIGI-ZOOM VIDEO MICROSCOPE SYSTEM Featuring Auto-Focus, Image Capture, Documentation and Manual Measurement In One Easy-to-Use Package. MAIN SYSTEM FEATURES: Continuous 1:14 Ratio Optical Zoom Auto-Focus System 0.5X Standard Objective

Description: supported, including brightfield, darkfield and differential interference contrast (DIC), as well as various transparent samples. Hybrid Auto-Focus There are two common types of auto-focus systems for microscopes: slit projection and contrast detection. Slit projection

• Application: Semiconductor Inspection
• Computer Interface: Yes
• Eyepiece Style: Binocular
• Total Magnification: 2.5 to 100 X

Description: C-Focus™ systems provide an automatic means to eliminate microscope focus drift over long time periods. Unlike autofocus systems which require use of advanced microscopes with internal focus correction or external devices which track video signals or reflected

Description: with the Olympus autofocus unit, ideal for automating the inspection process. Strehl ratio: Indicates as a percent, the ratio of the proportion of light that an actual optical system can concentrate with respect to the proportion of light concentrated in the image plane (central

• Field of View: 26.5 mm
• Lens Type: Objective Lens
• Magnification: 50 to 100 X
• Numerical Aperture: 0.9500 NA

Description: Application fields Super-resolution microscopy Light disk microscopy Confocal microscopy 2-photon microscopy 3D imaging Screening Interferometry Measuring technology Autofocus systems

• Type: Z-Axis Stage

Description: technology, and TT L laser autofocus. It allows both 2D and height measurements in the same field of view. The Confocal NEXIV VMZ-K6555 is used for the inspection and measurement of critical dimensions of highly complex structures on advanced semiconductor devices, probe cards, substrate

• Applications / Capabilities: Electronics or Semiconductor Inspection
• Image Source: Optical Microscope
• System Type: Turnkey / Complete System

Description: supported, including brightfield, darkfield and differential interference contrast (DIC), as well as various transparent samples. Hybrid Auto-Focus There are two common types of auto-focus systems for microscopes: slit projection and contrast detection. Slit projection

• Application: Other
• Eyepiece Style: Trinocular
• Image Analysis Processing Software: Yes

Description: without the need for vibration isolation or specialized enclosures. And the interactive control software, Mx™, provides easy and detailed visualization to help you control your process. Read more to see how the ZeGage system's power, versatility, and value can benefit you. Powerful

• Application: Measuring / Toolmaker
• Computer Interface: Yes
• Digital Display: Yes
• Grade: Benchtop

Description: objective scanning system for microscopy Optimized for large travel ranges and fast step-and-settle with step sizes to 3 µm. Compact design and QuickLock Thread Adapters for easy integration in all standard microscope designs. Ideally suited for 2-photon microscopy and all

• Minimum Step Size (Resolution): 2000 µm
• Type: Motorized Stage, Z-Axis Stage

Description: WDI's Laser Auto-Focus ATF6 sensor is an active optical device (incorporating a class II semiconductor laser) designed to provide focusing servo systems with fast feedback signals needed to quickly and accurately focus all types of infinity corrected microscopes.

• Applications: Semiconductor Wafers, CVD / PVD Films, Flat Panel Displays, Photolithography / Patterning
• Form Factor: Sensor / Sensing Element
• Mounting / Loading: In-situ / System Mounted
• Non-contact: Yes

Description: application Microscopy, confocal microscopy, 3D imaging, screening, autofocus systems, surface analysis. Ideal for multiphoton microscopy due to high dynamics at heavy loads

• Minimum Step Size (Resolution): 400 µm
• Type: Motorized Stage, Z-Axis Stage

Description: for positioning accuracy to < 500 nm More powerful microscope with autofocus and automatic object recognition Specimen holders for different samples

• Hardness Testers: Vickers and Knoop, Other
• Mounting: Fixtured or Permanent
• Test Method: Micro

Description: of indentation and creep Measurement and computation of material parameters according to DIN EN ISO 14577-1 and ASTM E 2546 Indenters: Vickers, Berkovich or carbide ball Customer-specific indenters on request Microscope with three magnification levels and

• Hardness Testers: Vickers and Knoop, Other
• Mounting: Fixtured or Permanent
• Test Load: 5.10E-7 to 0.0510 kg
• Test Method: Micro

Description: The WDI Laser Auto-Focus ATF5 sensor is an active optical device (incorporating a semiconductor laser) designed to provide focusing servo systems with fast feedback signals needed to quickly and accurately focus all types of infinity corrected microscopes.

• Automation / Control: CNC Control
• Laser Type: Diode
• Materials Processed: Semiconductors / Electronics
• Options / Components: Monitoring Sensors / System