Optical Emission Spectrometer

Description: Optical emission spectrometers (OES) and the measuring principal of the atomic emission is the ideal method and provide the perfect instrumentation for metal analysis in all different industrial businesses and environments. Metal producing industries like foundries,

• Computer Interface: Yes
• Detector: Solid State (CCD)
• Excitation Source: Spark or Arc
• Portable: Yes

Description: The FM EXPERT is the next level optical emission spectrometer, combining superior analytical performance with a compact size. Its large wavelength range is ideal for the analysis of all relevant elements in metals quality assurance and production process control. The FM EXPERT

• Detector: Solid State (CCD)
• Excitation Source: Spark or Arc

Description: The PMI-MASTER range of optical emission spectrometers (OES) for mobile metal analysis. The mobile spectrometers PMI-MASTER are used for the precise analysis of key elements, rapid material verification, positive materials identification (PMI) and sorting of different

• Detector: Solid State (CCD)
• Display Options: Video Display
• Excitation Source: Spark or Arc
• Local Interface: Digital Front Panel

Description: The FT230 benchtop XRF analyzer has been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a ground-breaking analyzer that effectively ‘sets up’ itself,

• Computer Interface: Yes
• Data Processing Functions: Yes
• Data Storage / Data Logger: Yes
• Detector Type: Other

Description: -effective, reliable analysis. These new generation optical emission spectrometers offer high analytical performance at an extremely compact size. The preinstalled GRADE Database is the largest metals database for fast and easy grade identification. It offers over 12 million

• Computer Interface: Yes
• Computer Interface Options: Serial Interface
• Display Options: Digital Readout
• Local Interface: Digital Front Panel

Description: Fewer and narrower emission lines reduce interference Freedom from metallurgical history Fewer standards required for calibration Low argon gas consumption Automatic cleaning between samples

• Application Software Included: Yes
• Computer Interface: Yes
• Detector: Solid State (CCD)
• Display Options: None

Description: higher energy levels of valence shell) and by returning into their ground state (transition from higher to lower level of valence shell) they will emit characteristic lines for each element. The emitted light is transmitted through optical fibers and the polychromatic radiation is dispersed

• Detector: Solid State (CCD)
• Excitation Source: Laser-Induced Breakdown
• Portable: Yes

Description: LED’s and other sources such as elemental emissions from plasma & Laser Induced Breakdown Spectroscopy. Also Bragg grating technology enables optical sensing of many parameters including temperature and pressure. Thin film thickness measurements can be made using sample specular

• Application Software Included: Yes
• Computer Interface: Yes
• Computer Interface Options: Serial Interface
• Data Storage / Data Logger: Yes

Description: The StellarNet GREEN-Wave low cost Spectrometers are fiber optic coupled instruments with a wide selection of models for measurements in 190-1150nm wavelength ranges. Each unit contains a USB interface with a snap shot memory to provide instantaneous spectral image from the highly sensitive

• Application Software Included: Yes
• Computer Interface: Yes
• Computer Interface Options: Serial Interface
• Data Storage / Data Logger: Yes

Description: Highlights The SpectrOil 100 Rotating Disc Electrode Optical Emission Spectrometer (RDE-OES) is the eighth generation of the market leading RDE elemental spectrometer. It is widely used in commercial oil laboratories, on-site or trailer labs, as a proven means of

• Application Software Included: Yes
• Computer Interface: Yes
• Computer Interface Options: Serial Interface
• Detector: Solid State (CCD)

Description: The Spectroil M/F-W has become the standard instrument when on-site and immediate fuel analysis is a necessity. It fulfills the requirements of ASTM D 6728, Standard Test Method for Determination of Contaminants in Gas Turbine and Diesel Engine Fuel by Rotating Disc Electrode Atomic Emission

• Display Options: Video Display
• Local Interface: Digital Front Panel

Description: light into a mini-spectrometer through an optical fiber and transferring the measured results to a PC via the USB connection. Moreover, the trigger function that can be also used for short-term integration enables spectroscopic measurement of pulse emissions. The product

Description: LED’s and other sources such as elemental emissions from plasma & Laser Induced Breakdown Spectroscopy. Also Bragg grating technology enables optical sensing of many parameters including temperature and pressure. Thin film thickness measurements can be made using sample specular

• Application Software Included: Yes
• Computer Interface: Yes
• Computer Interface Options: Serial Interface
• Detector Type: Diode Array, Charge Coupled Device (CCD)

Description: Standard Practice for Describing and Specifying Inductively-Coupled Plasma Optical Emission Spectrometers

Description: Compact and thin, built-in high-sensitivity CMOS image sensor The mini-spectrometer TF series is a polychromator provided in a compact, thin case that houses optical elements, image sensor, and driver circuit. Spectrum data can be acquired by guiding measurement light into a

• Horizontal Pixels: 512

Description: Compact and thin, built-in high-sensitivity CMOS image sensor for Raman spectroscopy The mini-spectrometer TF series is a polychromator provided in a compact, thin case that houses optical elements, image sensor, and driver circuit. Spectrum data can be acquired by guiding measurement

• Horizontal Pixels: 2048

Description: with the built-in image sensor is output from the USB port to a PC for data acquisition. The C11697MB is a mini-spectrometer with a high-sensitivity CMOS image sensor mounted on the optical system platform of the previous type C10083MD. The trigger function accepts even short-time

• Horizontal Pixels: 2048

Description: Standard Guide for Describing and Specifying the Spectrometer of an Optical Emission Direct-Reading Instrument

Description: STANDARD PRACTICE FOR EVALUATING AN OPTICAL EMISSION VACUUM SPECTROMETER TO ANALYZE CARBON AND LOW-ALLOY STEEL

Description: inductively coupled plasma – optical emission spectrometry and is applicable to leathers which are expected to have chromic oxide contents in excess of 1 mg/kg. Two techniques for the preparation of the solution to be analysed are included. In the case of dispute, the wet oxidation

Description: Highlights The SpectrOil M/N-W is the military version of the SpectrOil M family of oil and fuel analysis spectrometers. It is a compact, rugged, transportable and easy to use spectrometer designed specifically for the analysis of wear metals, contaminants and additives in lubricants

• Display Options: Video Display
• Local Interface: Digital Front Panel
• Number of Channels: 20

Description: sensitivity on par with inductively coupled plasma optical emission spectroscopy (ICP-OES), NANOHUNTER provides part-per-billion (PPB) level detection limits in a fully automated tool. Direct measurement of solids and powders provides freedom from complex sample digestion or

• Computer Interface: Yes
• Detector Type: Other
• Excitation Source: X-Ray Tubes
• Module Type: Wavelength Dispersive

Description: Leather - Chemical determination of chromic oxide content - Part 4: Quantification by inductively coupled plasma-optical emission spectrometer (ICP-OES)

Description: 1.1 This guide lists and discusses features of a spectrometer or polychromator used for optical emission, direct-reading, spectrochemical analysis. A polychromator in this sense consists of a spectrometer with an extended and fixed wavelength range and an array of fixed

Description: The model ATS/40998-4 is a multi-channel analyser system that measures simultaneously and instantaneously 4 elements in a single aspiration; Na, K, Li, and Ca. The system consists of the ATS/40994 analyser, the ATS LabAssistant™ with piston type precision auto-dilutor for micro volume dilutions, the

• Application Software Included: Yes
• Computer Interface: Yes
• Display Options: Digital Readout
• Excitation Source: Flame (Flame Photometer)

Description: The model ATS/40997 - ATS 200S Science/Industry HPFP™ with Mg (High Performance Flame Photometer) is a multi-channel analyzer that measures simultaneously up to 4 elements; typically the hardware for Na, K, Mg, and Ca are included in the basic analyzer with additional element channels available. The

• Application Software Included: Yes
• Computer Interface: Yes
• Data Storage / Data Logger: Yes
• Display Options: Digital Readout

Description: The model ATS/40998-7 – ATS 200S High Performance Flame Photometer™ System with Mg is a multi-channel analyser system that measures simultaneously and instantaneously up to 4 elements in a single aspiration. The hardware for Na, K, Mg, and Ca are included in the basic analyser with additional

• Application Software Included: Yes
• Computer Interface: Yes
• Display Options: Digital Readout
• Excitation Source: Flame (Flame Photometer)

Description: The model ATS/40994 - ATS 200S Science / Industry HPFP™ (High Performance Flame Photometer) is a multi-channel analyzer that measures simultaneously up to 4 elements; typically Na, K, Li, and Ca. It uses powerful microprocessor and proprietary firmware that permits the analysis to be done through a

• Application Software Included: Yes
• Computer Interface: Yes
• Data Storage / Data Logger: Yes
• Display Options: Digital Readout

Description: LECO's 744 Series will redefine the way you determine carbon and sulfur in metals, ores and other inorganic materials. Using extensive customer feedback and innovative engineering, our latest instrumentation takes advantage of an immersive software platform that will increase usability and lower the

Description: 1.1 This practice describes the components of a direct-current-plasm a (DCP) optical emission spectrometer. This practice does not attempt to specify component tolerances or performance criteria. This practice does, however, attempt to identify critical factors affecting bias,

Description: Knight Optical’s Knight Multisystem range of dual spectrometer systems combine two instruments to create an extended operating range that would be unachievable with a single spectrometer. By combining a 2048 CCD detector array and an InGaAs NIR PDA array, our Knight Multisystem

• Wavelength Range: 200 to 1700 nm

Description: Knight Optical’s Knight Multisystem range of dual spectrometer systems combine two instruments to create an extended operating range that would be unachievable with a single spectrometer. By combining a 2048 CCD detector array and an InGaAs NIR PDA array, our Knight Multisystem

• Wavelength Range: 350 to 1700 nm

Description: Knight Optical’s Knight Multisystem range of dual spectrometer systems combine two instruments to create an extended operating range that would be unachievable with a single spectrometer. By combining a 2048 CCD detector array and an InGaAs NIR PDA array, our Knight Multisystem

• Wavelength Range: 280 to 1700 nm

Description: Knight Optical’s Knight Multisystem range of dual spectrometer systems combine two instruments to create an extended operating range that would be unachievable with a single spectrometer. By combining a 2048 CCD detector array and an InGaAs NIR PDA array, our Knight Multisystem

• Wavelength Range: 200 to 1700 nm

Description: 1.1 This practice describes the components of an inductively-coupled plasma optical emission spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, since

Description: 1.1 This guide covers features of a spectrometer or polychromator used for optical emission, direct-reading, spectrochemical analysis. A polychromator in this sense consists of a spectrometer with an extended and fixed wavelength range and an array of fixed exit slits to

Description: inductively coupled plasma – optical emission spectrometry and is applicable to leathers which are expected to have chromic oxide contents in excess of 1 mg/kg. Two techniques for the preparation of the solution to be analysed are included. In the case of dispute, the wet oxidation

Description: filter. Relative to the application of laser emission, the notch filter is very important. In the spectrum experiment, in order to obtain a good signal-to-noise ratio, it is very critical to suppress the pump laser. This can be achieved by placing a notch filter on the detection channel.

• Filter Surface Quality: 60-40 Scratch / Dig, 80-50 Scratch / Dig
• Thickness: 0.5000 to 6 mm

Description: . EPMA is abbreviation for Electron Probe Microanalyzer. Setting Holder insertion with Auto Loading! Quickly find the target observation point! Specimen insertion and acquisition of an optical image of the specimen holder (Stage Navigation image) is

Description: The Optical Particle Sizer (OPS) Model 3330 is a light, portable spectrometer that provides fast and accurate measurement of particle concentration and particle size distribution using single particle counting technology. The OPS measures particles from 0.3 to 10 µm in 16 user

• Measurement Type: Size

Description: , emission, and scattering) is followed by a system-level discussion of a variety of ground-, air-, and space-based remote sensing systems. Key equations are presented for predicting the optical resolution and signal-to-noise performance of passive and active sensing systems. Sensor

• Continuing Education Credit (CEU): Yes
• Modality: Off Site (Conference / Seminar), On-site / In Plant
• Technology / Subject: Avionics / Radar, Instruments / Sensors, Photonics / Optics
• Type: Course

Description: Shimadzu's double beam AA-6200 atomic absorption spectrophotometer combines high performance with affordability. The double beam system provides the superior baseline stability expected from high-performance optical systems at an affordable price. Windows®-based software Wizard functions

• Alarms: Yes
• Application Software Included: Yes
• Background Correction: Yes
• Computer Interface: Yes

Description: calculations to determine how much optical power is captured by a sensor system. We survey atmospheric propagation and phenomenology (absorption, emission, scattering, and turbulence) and explore how these issues affect sensor systems. Finally, we perform signal calculations that

• Industry: Aerospace / Defense
• Modality: On-site / In Plant
• Technology / Subject: Avionics / Radar, Instruments / Sensors, Photonics / Optics, Specialty / Other
• Type: Course

Description: Leather - Chemical determination of chromic oxide content - Part 4: Quantification by inductively coupled plasma - optical emission spectrometer (ICP-OES) (ISO 5398-4:2007)

Description: X-ray Spectrometers Portable X-Ray Fluorescent Analyzer Optical Emission Spectroscopy (OES) Portable Optical Emission Spectroscopy (OES) Atomic Absorption (AA) Analyzers Inductively Coupled Plasma (ICP) Combustion/IR Analyzers Gas

• Industry: Aerospace / Aviation, Automotive, Chemical / Material Processing, Food / Beverage, Health Care / Medical, Legal / Forensics, Marine, Military, Nuclear / Utility, Packaging, Pharmaceutical / Biotech, Piping / Pressure Vessel, Semiconductors / Electronics, Structural / Construction, Specialty / Other
• Laboratory Services Offered: Chemical Testing Services, Deformulation / Reverse Engineering, Environmental Exposure, Failure Analysis, Field Sampling, Geotechnical Services, Materials Testing Services, Monitoring Programs (Audits / Surveillance), Purity / Quality (Air, Water, Material), Stack Emissions / Opacity Testing,
• Materials: Adhesives / Sealants, Air, Ceramics / Glass, Chemicals, Coatings, Composites, Concrete / Mortar, Gases, Heavy Metals (Lead, Chromium, etc.), Inorganics, Metals, Nanomaterials, Paper, Petroleum Fluids (Oil, Fuel, Distillates), Plastic / Rubber, Polymers / Organics, Powders, Sediment, Soil, Toxins /
• Regional Preference: North America, United States Only, Northeast US Only, Southern US Only, Southwest US Only, Northwest US Only, Midwest US Only, Canada Only, Europe Only

Description: : Sequential X-ray Spectrometers Portable X-Ray Fluorescent Analyzer Optical Emission Spectroscopy (OES) Portable Optical Emission Spectroscopy (OES) Atomic Absorption (AA) Analyzers Inductively Coupled Plasma (ICP) Combustion/IR Analyzers

• Industry Applications: Aerospace / Aviation, Food / Beverage, Automotive, Chemical / Material Processing, Health Care / Medical, Legal / Forensics, Marine, Military, Nuclear / Utility, Pharmaceutical / Biotech, Packaging, Piping / Pressure Vessel, Semiconductors / Electronics, Structural / Construction, Specialty / Other
• Materials: Adhesives / Sealants, Air, Ceramics / Glass, Chemicals, Coatings, Composites, Concrete / Mortar, Inorganics, Metals, Paper, Petroleum Fluids (Oil, Fuel, Distillates), Plastic / Rubber, Polymers / Organics, Powders, Soil, Textiles, Thin Films / Plating, Volatiles (VOCs) / Solvents, Toxins /
• Regional Preference: North America, United States Only, Northeast US Only, Southern US Only, Southwest US Only, Northwest US Only, Midwest US Only, Canada Only, Europe Only
• Services Offered: Deformulation / Reverse Engineering, Environmental Exposure Testing, Field Sampling, Geotechnical Services, Materials Testing Services, Monitoring Programs (Audits / Surveillance), Quality / Purity (Contamination), Standards Testing / Certification, Sunlight Exposure / Solar Simulation, Other

Description: IEC TS 62607-4-7:2018 provides a method for the determination of magnetic impurities in anode nanomaterials for energy storage devices using an Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES), including test overview, reagents, apparatus, test procedures, test

Description: a portable USB spectrometer coupled to a reflectance probe and light source. The optical properties are obtained from reflection and thickness is measured by detecting the sinusoidal fringe pattern from the sample's specular reflectance. Several spectrometer models are available

• Applications: Semiconductor Wafers, CVD / PVD Films, Data Storage / Memory, Flat Panel Displays, Optical Components , Polishing / CMP, Polymers / Photoresists, Other
• Form Factor: Monitor / Instrument
• Measurement Capability: Thickness - Film / Layer, Thickness - Wafer / Disc (TTV)
• Mounting / Loading: In-situ / System Mounted

Description: IEC TS 62607-4-7:2018 provides a method for the determination of magnetic impurities in anode nanomaterials for energy storage devices using an Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES), including test overview, reagents, apparatus, test procedures, test

Description: concentrations. Usually, wet chemical methods are used, based on aqua regia extracts, in combination with optical or mass spectrometric (MS) methods like atomic absorption spectrometry (AAS), inductively coupled plasma/optical emission spectrometry (ICP/OES) or ICP/MS.

Description: and temperature-control chambers. Features Characterization of emissive, transmissive, reflective, and transflective displays Fully motorized 6-axis positioner with electrical driving, photometer or spectrometer, illumination, PC, and software Area scan: max. 100

• Application Software Included: Yes
• Instrument Type: Spectrophotometer
• Operating Humidity: 0.0 to 60 %
• Property Measured: Color

Description: The DMS 505 is based on a 6-axis goniometer with 3 motorized axes. The measurement system permits angle-dependent analysis of all electro-optical characteristics of displays, including luminance, contrast, and color properties of displays at different viewing angles and variable electrical

• Application Software Included: Yes
• Operating Humidity: 0.0 to 60 %