Products/Services for Rutherford Backscattering Spectrometry
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Semiconductor Metrology Instruments - (191 companies)Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.Form FactorMounting / LoadingApplications -
Wafer and Thin Film Instrumentation - (347 companies)Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. -
Thin Film Monitors - (53 companies)Thin film monitors are used to analyze and/or control thin film deposition rate, composition and properties. -
Mounting Presses and Equipment - (36 companies)Lens. Spectrographic / Spectrometry. Wafer / Substrate Analysis. Image credits: Wikipedia...
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Metallographic Grinding and Polishing Equipment - (47 companies)...preparation applications. The equipment provides a planar, polished surface enabling materials analysis using microscopy, spectrometry, hardness, nanoindentation and other techniques. Metallographic grinding and polishing equipment includes grinders, sanders...
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Laboratory and Calibration Gases - (67 companies)...of an analysis. Analytical or laboratory applications may include gas chromatography (GC, GC-MS, LC-MS), spectrometry (ICP, ICP-MS, Flame A.A., GFAA, NMR), specialty analysis techniques (thermal and elemental analysis, total organic carbon analyzers...
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UV and Visible Spectrometers - (178 companies)UV and visible spectrometers measure the amount of ultraviolet (UV) and visible light transmitted or absorbed by a sample placed in the spectrometer.
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Mass Spectrometers - (127 companies)...in a compound. Mass spectrometers are used in both quantitative and qualitative analysis, including high-resolution accurate mass measurements for the determination of elemental compositions. Mass spectrometry (MS) is an analytical spectroscopic tool...
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Optical Calibration Standards - (24 companies)Optical calibration standards are used to calibrate the optical properties of optical detectors and instruments.
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Imaging Spectrometers - (23 companies)Imaging Spectrometers are instruments used in hyperspectral imaging and imaging spectroscopy to acquire spectrally resolved images.
Product News
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MPF Products, INC.
What is Mass Spectrometry? What is the ASMS Annual Conference About?. Each year, the annual conference hosted by the American Society for Mass Spectrometry (ASMS) brings together thousands of scientists, engineers, and technology companies working at the forefront of analytical instrumentation. MPF Products is excited to be returning this year to exhibit at the 74th ASMS Conference on Mass Spectrometry and Allied Topics. The conference takes place May 31 through June 4, 2026, in San Diego. What is Mass Spectrometry... (read more)Browse Electrical Feedthroughs Datasheets for MPF Products, INC. -
Luna Innovations
World's Highest Resolution OTDR Measurements The Luna OBR 6225 will bring significantly enhanced diagnostic capabilities to the installation and maintenance of commercial and military avionics, data center networks and industrial manufacturing applications. The Luna OBR 6225 is a portable and rugged ultra-high resolution reflectometer with backscatter-level sensitivity for testing short networks deployed in aerospace, naval, data center and industrial applications. Troubleshoot fiber assemblies in the field to easily locate optical loss... (read more)Browse Optical Time Domain Reflectometers (OTDR) Datasheets for Luna Innovations -
Remcom (USA)
Webinar: Radar Analysis Features in WaveFarer The latest release of WaveFarer provides a number of new features to improve its support for automotive and indoor radar applications. New diffuse scattering algorithms capture the backscatter from rough surfaces, such as roads, terrain, and building materials. This combines with detailed backscatter from target objects to provide a more accurate prediction of the radar returns from a complex scene. This release also adds the ability to transmit through walls, windows, or other materials... (read more)Browse Modeling and Simulation Software Datasheets for Remcom (USA) -
New England Wire Technologies Corporation
Superconductor Cabling Superconductor Cabling. New England Wire Technologies has provided cabling, insulating, and other services to the superconductor industry since the 1960 's. Our products are integrated into most of the major accelerator projects, ore separator magnets, NMR magnets, and superconducting magnetic energy storage (SMES) magnets. Other projects include Tevatron at Fermilab, RHIC for Brookhaven National Labs, LHC for Cern, 45 Tesla Hybrid Magnet for NHMFL, 36 strand Rutherford cable for GSI-Darmstadt... (read more) -
Electro Optical Components, Inc.
Monitoring Gas Leaks Across a Wide Area with TDLAS Three TDLAS (Tunable Diode Laser Absorption Spectrometry) Solutions for measuring and / or monitoring across a wide area are: BM-H-3 BeamStack system has the laser and the sensor separated up to 25 meters and can measure one of 10 different gases. BM-V-2 BeamSight system has the laser and sensor in the same module and measures the reflected laser signal up to 100 meters and can measure one of 6 different gases. EOC-GDM-TDLAS-CH4-370 system has the laser and sensor in the same module... (read more)Browse Gas Sensors Datasheets for Electro Optical Components, Inc. -
Agilent Technologies - Vacuum Products
New MS45 Rotary Vane Pump The Agilent MS45 is a single stage, oil-sealed rotary vane pump designed to deliver reliable roughing performance for today 's most demanding laboratory applications. Equipped with an energy efficient inverter-driven motor, the MS45 provides high gas throughput operation below 10?Torr, ensuring stable, consistent performance across mass spectrometry (LC/MS, ICP/MS, GC/TOF/MS), electron microscopy, and a wide range of scientific instrumentation platforms. Visit the product webpage to learn more. (read more)Browse Rotary Vane Vacuum Pumps and Systems Datasheets for Agilent Technologies - Vacuum Products -
Voltage Multipliers, Inc.
Hi-Rel HV Optocouplers & Opto-Diodes Utilizing the photo-sensitive nature of silicon, VMI has created a line of hermetically sealed, high-reliability, high-voltage optocouplers and opto-diodes in versions that can be assembled in series configuration for additional standoff voltage capability -- used for Mass Spectrometry, Military and Aerospace. Available in a clear molded package, VMI 's 10kV and 20kV version optocouplers are fabricated with two infrared LEDs. VMI 's 25kV optocoupler OC250 is assembled in shell with enough... (read more)Browse Optocouplers Datasheets for Voltage Multipliers, Inc. -
Voltage Multipliers, Inc.
10kV to 20kV High Voltage Opto-Diodes VMI designs and manufactures high voltage, hermetically sealed, high-reliability opto-diodes for Mass Spectrometry, Military and Aerospace. For applications that require more custom mechanical configurations or electrical characteristics, VMI has provided customers with the option of high voltage diodes in a clear epoxy package without embedded LEDs -- available in 10kV, 15kV and 20kV. These high voltage, hermetically sealed, high-reliability opto-diodes are available in versions that can... (read more)Browse Optocouplers Datasheets for Voltage Multipliers, Inc. -
Electro Optical Components, Inc.
TDLAS Modules for Gas Detection, Precise, Accurate TDLAS (Tunable Diode Laser Absorption Spectrometry) gas analysis modules are based on the principle of laser spectral absorption. The modules have: High measurement accuracy (PPB sensitivity without cross-talk). Wide measurement range up to 25 meter, 100 meter or 300 meter. Quick response time (as fast as 100 m second). Calibration free gas analysis. Internal temperature compensation and cross interference compensation. Good stability. Long service life. These modules are capable of continuous... (read more)Browse Gas Sensors Datasheets for Electro Optical Components, Inc. -
Xiamen Innovacera Advanced Materials Co., Ltd.
Analytical Instruments Components for analytical instrumentation. Components made from materials such as Alumina, Zirconia, and Zirconia Toughened Alumina (ZTA) solve problems where plastics and metals fail. INNOVACERA excels at matching ceramic properties to the form, fit, and function of the component. INNOVACERA is also able to supply metalized and brazed ceramic to metal assemblies for applications that require hermeticity in ultra-high vacuum (UHV). Filament Assemblies for SEM, TEM, and Mass Spectrometry. INNOVACERA is pleased... (read more)Browse Aluminum Oxide and Alumina Ceramics Datasheets for Xiamen Innovacera Advanced Materials Co., Ltd.
More Information
Indicates content that may require registration and/or purchase.
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Semiconductor Material and Device Characterization 3rd Edition Complete Document
… Induced Current (EBIC), 649 11.2.6 Cathodoluminescence (CL), 651 11.2.7 Low-Energy, High-Energy Electron Diffraction (LEED), 652 Ion Beam Techniques, 653 11.3.1 Secondary Ion Mass Spectrometry (SIMS), 654 11.3.2 Rutherford Backscattering Spectrometry (RBS), 659 .
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Silver Metallization
7 2.2 Rutherford Backscattering Spectrometry …………………………………
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Fundamentals of Nanoscale Film Analysis
Rutherford Backscattering Spectrometry .
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The Influence Of Ion Implantation On Solid Phase Epitaxy Of Amorphous Silicon Deposited By LPCVD
Further structural and chemical characterization was performed by Rutherford backscattering spectrometry (RBS), transmission Electron Microscopy (TEM), and secondary ion mass spectrometry (SIMS) methods.
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OSA | Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films
P. Petrik, N.Q. Khánh, Z. E. Horváth, Z. Zolnai, I. Bársony, T. Lohner, M. Fried, J. Gyulai, C. Schmidt, C. Schneider, and H. Ryssel, âCharacterisation of BaxSr1âxTiO3 films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction,â J. Non …
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Swift Heavy Ions for Materials Engineering and Nanostructuring
3.5 Rutherford Backscattering Spectrometry (RBS .
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Ion Beams in Nanoscience and Technology
The semiconductor industry used small electrostatic accelerators sputter profile methods such as Sec- ondary Ion Mass Spectroscopy (SIMS) and Rutherford backscattering spectrometry (RBS) for a wide range of characterisation tasks such as measuring implantation profiles, diffusion, crystal defect annealing, oxide layer thickness …
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An Overview Of Surface Analysis Techniques And Their Applications In The Semiconductor Industry (New Developments In Esca)
Microscopy /Energy Dispersive X- ray /Wavelength Dispersive X -ray AES - Auger Electron Spectroscopy ESCA - Electron Spectroscopy for Chemical Analysis SIMS - Secondary Ion Mass Spectrometry RBS - Rutherford Backscattering Spectrometry LIMS - Laser Ionization Mass Spectrometry .
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Interfacial Chemistry and Engineering Annual Report 2000
The disorder has been analyzed using 2 MeV He+ Rutherford backscattering spectrometry in channeling geometry (RBS/C).
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Rutherford backscattering analysis of the failure of chlorine anodes
Rutherford Backscattering Spectrometry ,carried out at the ORNL Surface Modification And Characterization Collaborative Research Center (SMAC) facility,has been applied to the nondestructive analysis of RuO,-TiOl electrodes of 5000A, which mimic the DSA anodes in composition and the method of preparation.
