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  • 9 Points to Check Before Trusting Your Laser Microscope
    (3D) image within seconds. SLCM†TMs measurement scale overlaps with optical light microscopy (OLM), scanning electron microscopy (SEM), and atomic force microscopy (AFM). In addition, there are minimal sample preparation requirements, and the microscopes can accommodate samples with a wide range
  • A Paramertic Study of Electron Backscatter Diffraction based Grain Size Measurements (.pdf)
    Polycrystalline microstructures can be well imaged using maps reconstructed from orientation data collected by electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM). These maps are very helpful for delineating grain boundaries in such microstructures and are thus well
  • A Collection of OIM TMApplications (.pdf)
    Orientation Imaging Microscopy OIM is a technique for characterizing the crystallographic orientation aspects of material microstructures. The technique is based on automated indexing of electron backscatter diffraction (EBSD) patterns. EBSD is a scanning electron microscope (SEM) based technique
  • Database For Trace Analysis (.pdf)
    Coupled with an Energy Dispersive x-ray System (EDS), the Scanning Electron Microscope (SEM) is often used to analyze trace evidence. Automated identification of gun shot residue is an excellent example of this. The traditional approach has been to mount the unknown in some fashion, insert
  • Microstructural Analysis of Optical Materials (.pdf)
    ) in the scanning electron microscope (SEM).

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