Products & Services
See also: Categories | Featured Products | Technical Articles | More Information-
Supplier: CIQTEK Co., Ltd
Description: CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore
- Total Magnification: 1 to 1,000,000 X
- Resolution: 3 to 8 nm
- Accelerating Voltage: 0.2 to 30 kilovolts
- Features: Benchtop, Digital Display, Environmental / Low Vacuum / Variable Pressure, Mechanical Stage, Research
-
Supplier: CIQTEK Co., Ltd
Description: CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers
- Total Magnification: 1 to 1,000,000 X
- Resolution: 0.8999999999999999 to 2.5 nm
- Accelerating Voltage: 0.2 to 30 kilovolts
- Features: Benchtop, Digital Display, Environmental / Low Vacuum / Variable Pressure, Mechanical Stage, Research
-
Supplier: Hitachi High Technologies America, Inc.
Description: The FlexSEM 1000 Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Keeping efficiency in mind, the FlexSEM features an adaptable,
- Application: Biological / Life Science, Medical / Forensic
-
-
Electron Microscopes - Ultra-high Resolution Field Emission Scanning Electron Microscope -- SEM5000XSupplier: CIQTEK Co., Ltd
Description: CIQTEK SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope (FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Benefiting from the upgraded column engineering process, “SuperTunnel” technology, and high-resolution objective lens
- Total Magnification: 1 to 2,500,000 X
- Resolution: 0.6 to 1 nm
- Accelerating Voltage: 0.02 to 30 kilovolts
- Features: Benchtop, Digital Display, Mechanical Stage, Research
-
Supplier: ZwickRoell LP
Description: The ZHN/SEM nano indenter for installation in a scanning electron microscope (SEM) enables micromechanical experiments to be performed while observing the specimen at maximum resolution. It possesses the largest measuring range currently available, with a maximum
- Mounting: Fixtured or Permanent
- Test: Nanoindentation
-
Supplier: JEOL USA, Inc.
Description: The JSM-210 is the most compact stationary scanning electron microscope of JEOL. The newly developed stage is motor-driven for all five axes of movement, making it safer and faster to use. In addition, the newly equipped "Simple SEM" automatically acquires observation and
- Microscope Type: Scanning Electron Microscope (SEM)
-
Supplier: Nikon Metrology
Description: As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM. Born from the combined
- Total Magnification: 10 to 60,000 X
- Features: Benchtop
- Application: Biological / Life Science
- Microscope Type: Scanning Electron Microscope (SEM)
-
Supplier: Phenom-World BV
Description: The Phenom Pure desktop SEM (scanning electron microscope) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom Pure is equipped with the basic fundamentals for meeting imaging needs.
- Total Magnification: 70 to 20,000 X
- Resolution: 30 nm
- Accelerating Voltage: 5 kilovolts
- Features: Benchtop, Digital Display
-
Supplier: CIQTEK Co., Ltd
Description: High-speed scanning electron microscope for cross-scale imaging of large-volume specimensCIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration,
- Total Magnification: 66 to 1,000,000 X
- Resolution: 1.2999999999999998 to 3.3 nm
- Accelerating Voltage: 0.1 to 30 kilovolts
- Remote Interface: Computer Interface, Image Analysis Processing Software
-
Supplier: Hitachi High Technologies America, Inc.
Description: object lens design has a capability of EELS and diffraction as well. The SU9000 is HITACHI's new premium SEM. It features unique electron optics, with the sample positioned inside a gap between the upper and lower parts of the objective lens pole piece. This so-called true in-lens
- Application: Biological / Life Science, Medical / Forensic
- Microscope Type: Scanning Electron Microscope (SEM)
-
Supplier: JEOL USA, Inc.
Description: Nowadays, not only resolution and analytical performance on the nanometer order, but also throughput in data acquisition are considered important. The newly born JSM-IT710HR is the fourth-generation model of JEOL's HR* series, which is based on the theme of "SEM that allows anyone to easily
- Microscope Type: Scanning Electron Microscope (SEM)
-
Supplier: JEOL USA, Inc.
Description: Features Automatic Observation and Analysis Function "Neo Action" SEM observation and EDS analysis can be automated by simply setting the analysis conditions and selecting the areas to measure. Sample: Chondrules in chondrite Julesberg (L3.6) Landing Voltage: 5 kV SEM Automatic
- Microscope Type: Scanning Electron Microscope (SEM)
-
Supplier: Hitachi High Technologies America, Inc.
Description: The dual-beam FIB-SEM integrates a high-performance 40 kV FIB column and an ultra-high-resolution Schottky field-emission SEM column. By using dedicated fabrication template patterns for automatic lift-out, fabrication processes from fiducial marking to specimen lift-out can be
- Application: Biological / Life Science, Medical / Forensic
- Features: Research
- Microscope Type: Scanning Electron Microscope (SEM)
-
Supplier: Hitachi High Technologies America, Inc.
Description: beyond our imagination. The SU5000 FE-SEM has forever changed SEM operations. Ground-breaking computer-assisted technology from Hitachi, referred to as the EM Wizard, offers a new level of SEM operation and control. A robust "draw-out" specimen chamber accommodates large
- Application: Biological / Life Science, Medical / Forensic
-
Supplier: Phenom-World BV
Description: Direct observation and measurement of micro and nano fibers is faster, more efficient and easier than ever before, with the improved Fibermetric application. In combination with the Phenom desktop SEM, the Fibermetric application allows you to produce accurate size information from micro and
- Particle Size Range: 40 to 0.1 µm
- Technology: Microscopy / Image Analysis
- Measurement Type: Shape, Size
- Features: Specialty / Other
-
Supplier: Accuris
Description: STANDARD TEST METHOD FOR SCANNING ELECTRON MICROSCOPE (SEM) ANALYSIS OF METALLIC SURFACE CONDITION FOR GAS DISTRIBUTION SYSTEM COMPONENTS
-
Supplier: JEOL USA, Inc.
Description: Benchtop scanning electron microscopes are used in a wide range of fields, such as electrical, electronics, automobiles, machinery, chemical, and pharmaceutical industries. In addition, SEM applications are expanding to not only cover research and development, but also address
- Microscope Type: Scanning Electron Microscope (SEM)
-
Supplier: ASTM International
Description: 1.1 This practice provides a reproducible means by which one aspect of the performance of a scanning electron microscope (SEM) may be characterized. The resolution of an SEM depends on many factors, some of which are electron beam voltage and current, lens
-
Supplier: ASTM International
Description: methodology assumes a SEM operator skill level typically achieved over a 12-month period. 1.3.2 This test method shall be limited to the assessment of pits, stringer, tears, grooves, scratches, inclusions, stepped grain boundaries, and other surface anomalies. However, stains and particles
-
Supplier: ASTM International
Description: 1.1 This practice is designed to calibrate the magnification of scanning electron microscopes (SEMs) using the National Institute of Standards and Technology (NIST) calibration specimen Standard Reference Material (SRM)484. Since the relationship between true magnification and
-
Supplier: ASTM International
Description: methodology assumes a SEM operator skill level typically achieved over a 12-month period. 1.3.2 This test method shall be limited to the assessment of pits, stringer, tears, grooves, scratches, inclusions, stepped grain boundaries, and other surface anomalies. However, stains and particles
-
Supplier: Advanced Energy Industries, Inc.
Description: Ripple: < 2 ppm (50 mVpp) (Accelerator); Floating Suppressor (-1 kV); Extractor (+10 kV); Filament (3 A) Temperature Coefficient: < 25 ppm°C (Accelerator) Control Interface: Digital Advanced Energy’s EG353 series offers dependable, high-stability power supplies for scanning electron
- DC Input Voltage: 24 volts
- DC Input Current: 2.3 amps
- DC Output Voltage: -35,000 to 10,000 volts
- DC Output Current: 0.0001 to 3 amps
-
Supplier: CSA Group
Description: ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the
-
Description: ISO 16700:2004 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the
-
Supplier: CSA Group
Description: scanning electron microscope (SEM). ISO 22489:2016 also describes the following: - the principle of the quantitative analysis; - the general coverage of this technique in terms of elements, mass fractions and reference specimens; - the general requirements for the instrument; -
-
Supplier: MTI Instruments Inc.
Description: These in-situ miniature bend, fatigue, strain, and tensile testers are designed for use in Scanning Electron Microscopes (SEMs), and Light Microscopes (LMs). The dual leadscrew design symmetrically loads samples while keeping them centered within the scopes field of view.
- Maximum X-Distance: 10.000000000000002 mm
- Stage Type: Motorized Stage
-
Supplier: Denton Vacuum
Description: Cold Sputtering Platform The Desk V HP series is used extensively for scanning electron microscope (SEM), transmission electron microscope (TEM) sample preparation and Iridium coating applications. The Desk V HP series includes standard high power systems and turbo
-
Description: in hydraulic fluid with a number size distribution certified using a scanning electron microscope (SEM) and image analysis techniques.
-
Supplier: CSA Group
Description: ISO 16232-8:2007 describes a method for determining the nature of contaminant particles by identifying their elemental chemical composition using energy dispersive X-ray spectroscopy (EDX) in combination with a scanning electron microscope (SEM). The contaminant particles are
-
Description: machine with a vacuum electron beam Surface reforming electron beam device Electron beam lithography apparatus Microscope for transmission electron microscopy SEM (scanning electron microscopy) Surface examination instrument Radiotherapy equipment
- Density: 4.299997286153649 g/cc
- Thermal Conductivity: 11.8 W/m-K
- Shape / Form: Plate / Board (e.g., Fiberboard)
-
Description: beaming milling (SEM/FIB) Covers characterization methods of tin and tin-based alloy finishes such as transmission electron microscopy (TEM), scanning electron microscopy (SEM), and electron backscatter diffraction (EBSD) Reviews theories of mechanically-induced
-
Supplier: Agilent Technologies - Vacuum Products
Description: The Agilent VacIon Plus 40 pump is a medium-sized 40 L/s ion pump for use in general-purpose UHV and XHV systems for evacuating electron devices, scanning electron microscopes (SEM), and in academic and high-energy physics (HEP) research. This pump delivers stable vacuum
- Ultimate Operating Vacuum: 0.0000000000750283824473074 torr
- Pumping Speed: 84.7552001315728 CFM
- Application: Analytical / Scientific, Medical / Laboratory, Semiconductor Manufacturing
- Configuration: Individual Vacuum Pump
-
Supplier: SAE International
Description: were deployed. In the course of the project optical access to all areas in the nozzle was achieved. The experiments were evaluated by means of the monitoring of power output and fuel flow at rated power. The usage of a SEM (scanning electron microscope) and a TEM (transmission
-
Supplier: HiTek Power Ltd.
Description: High reliability Computer controlled Supports tungsten & LaB6 filaments Fibre optic communications link Applications: Scanning electron microscopes Electron beam Lithography Focussed ion beam lithography Semiconductor inspection/repair Transmission microscopy Ion beam etching
- Type: High Voltage Power Supply
-
Supplier: SAE International
Description: structure (XAFS), and scanning electron microscope/energy dispersive X-ray spectroscopy (SEM-EDX). The results showed that dissolution of transition metals from the cathode active material is the main factor producing degradation of the full cell capacity, and that this is
Find Suppliers by Category Top
Featured Products Top
-
The CRYO-FIB-SEM system incorporates a liquid nitrogen cooling stage and a cryocooled specimen transfer mechanism for frozen specimens, making it possible to prepare TEM specimens such as biopolymers. The specimen transfer mechanism has a built-in sputter coating function. Therefore (read more)
Browse Electron Microscopes Datasheets for JEOL USA, Inc. -
Want to detect smaller defects? Looking for sharper, clearer inspection images? In semiconductor inspection and failure analysis, improving electron microscope resolution is a constant challenge. However, even with a high (read more)
Browse Power Supplies Datasheets for Daitron Co., Ltd.
Conduct Research Top
-
9 Points to Check Before Trusting Your Laser Microscope
(3D) image within seconds. SLCM†TMs measurement scale overlaps with optical light microscopy (OLM), scanning electron microscopy (SEM), and atomic force microscopy (AFM). In addition, there are minimal sample preparation requirements, and the microscopes can accommodate samples with a wide range
-
A Paramertic Study of Electron Backscatter Diffraction based Grain Size Measurements (.pdf)
Polycrystalline microstructures can be well imaged using maps reconstructed from orientation data collected by electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM). These maps are very helpful for delineating grain boundaries in such microstructures and are thus well
-
A Collection of OIM TMApplications (.pdf)
Orientation Imaging Microscopy OIM is a technique for characterizing the crystallographic orientation aspects of material microstructures. The technique is based on automated indexing of electron backscatter diffraction (EBSD) patterns. EBSD is a scanning electron microscope (SEM) based technique
-
Database For Trace Analysis (.pdf)
Coupled with an Energy Dispersive x-ray System (EDS), the Scanning Electron Microscope (SEM) is often used to analyze trace evidence. Automated identification of gun shot residue is an excellent example of this. The traditional approach has been to mount the unknown in some fashion, insert
-
Microstructural Analysis of Optical Materials (.pdf)
) in the scanning electron microscope (SEM).
More Information Top
Indicates content that may require registration and/or purchase.
-
Advanced Engineering Materials III
Observed by SEM electron microscope scanning, gangue skeleton structure has changed, from stable to porous skeleton dense structure, and has acicular structure more; explain use of thermal - chemical activation of coal gangue activation treatment effect is better.
-
Characterization of Minerals Metals and Materials
this study were determined by SEM (Philips/FEI XL30FEG SEM Electron Microscope .
-
http://repositories.lib.utexas.edu/bitstream/handle/2152/23936/camacho-padronb45812.pdf?sequence=2
The microstructure of the specimens was visually assessed with images obtained from both optical and scanning electron ( SEM ) microscopes .
-
Materials Processing and Manufacturing III
… picked up from the curing age of 1D, 3D, 7d, 15d, 28d respectively, and immersed in alcohol, so as to stop the hydration reaction, and then removed to spray carbon on the surface, then the SEM electron microscope specimens were obtained to …
-
Nanomaterials
Scanning electron micrographs were obtained using SEM electron microscope .
-
Mechanical Properties of Materials and Information Technology
A. SEM electron Microscope .
-
Fundamentals of Friction and Wear on the Nanoscale
Abstract This chapter is dedicated to manipulation of nanostructures inside a scanning electron ( SEM ) microscope employed for real-time tribological measure- ments.
-
Study of thermal behavior of CrO3 using TG and DSC
The received products were investigated by SEM electron microscope .
-
Looking at Graphite Spheroids
Examination with Optical (OM) and Scanning Electron ( SEM ) microscopes on samples polished, color etched, deep etched or fractured offer valuable information about the so- lidification and characteristics of cast iron.
-
Influence of water temperature and feeding regime on otolith growth in Anguilla japonica glass eels and elvers: does otolith growth cease at low temperatures?
To eliminate the difficulty of observing the edges of otoliths with optical (OM) or scanning electron ( SEM ) microscopes , three to 10 individuals were sampled from each tank at 10, 20 and 30 days during the experiment and reared for an additional 10 …