Stylus Profilometer

Description: Surface chemical analysis - Depth profiling - Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer

Description: Surface chemical analysis \x97 Depth profiling \x97 Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer

Description: Report is applicable only to a laterally homogeneous bulk or single-layered material where the ion-sputtering rate is determined from the sputtered depth, as measured by a mechanical stylus profilometer, and sputtering time. The Technical Report provides a method to convert the

Description: Report is applicable only to a laterally homogeneous bulk or single-layered material where the ion-sputtering rate is determined from the sputtered depth, as measured by a mechanical stylus profilometer, and sputtering time. The Technical Report provides a method to convert the

Description: Bruker's Dektak® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film

• Measurement Capability: 2D / Line Profile, 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
• Mounting / Loading Options: Benchtop, Floor / Free Standing
• Display & Special Features: Computer Interface / Networkable
• Technology: Contact / Stylus Based

Description: Developed by anti-corrosion experts, the three devices impress with robustness, usability and performance. All required measurement tasks in heavy corrosion protection are solved quickly and reliably. The DFT is the handheld device for the simple layer thickness measurement on steel and non-ferrous

• Technology: Contact / Stylus Based

Description: To ensure that protective layers adhere permanently, the surface roughness of the base material must comply with strict recommended standards. The FPR1 profile probe is the ideal solution in this case: When combined with the FMP10/40 series, the FPR1 profile probe is the ideal solution for testing

• Technology: Contact / Stylus Based
• Features: Other
• Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness

Description: Product features MarSurf 300, the first portable roughness measuring unit with the option of wireless (Bluetooth) connection between the evaluation unit and drive unit. Bluetooth wireless connection Easy to use, with high-resolution color display and ATM-style user guidance Integrated standard in

• Vertical (Z) Range: 0.003543309 to 0.013779535 inch
• Vertical (Z) Resolution: 0.0000003149608 inch
• Operating Temperature: 23 to 104 F
• Standards Compliance: ASME, ISO / EN, JIS

Description: Product features MarSurf M 400. The best of the mobile devices Both in the measuring room and increasingly also in the production area, there is a need for surface evaluations requiring skidless tracing. This generally requires more highly skilled operators, more time and more adjustment work.

• Vertical (Z) Range: 0.009842525 to 0.029527575 inch
• Vertical (Z) Resolution: 0.00000003149608 inch
• Traverse Length: 1.0236226 inch
• Scan Rate: 0.0078740157480315 to 0.0393700787401575 in/sec

Description: MarSurf XR 1. The ideal instrument for a low-cost introduction to user-friendly surface metrology. The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. MarSurf XR 1 from Mahr stands for

• Vertical (Z) Range: 0.009842525 to 0.029527575 inch
• Traverse Length: 0.022047256 to 2.2047256 inch
• Applications: Aerospace / Defense, Automotive, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
• Mounting / Loading Options: Benchtop

Description: 1.1 This guide covers the preferred procedure for acquiring and post-processing of sputter crater depth measurements. This guide is limited to stylus-type surface profilometers equipped with a stage, stylus, associated scan and sensing electronics, video system for sample and

Description: Roughness Tester PCE-RT 11 Roughness tester for accurate determination of roughness according to Ra, Rz, Rq and Rt / with piezoelectric probe / big OLED display with backlight The Roughness Tester PCE-RT-11 is a portable measuring instrument for determination of surface roughness according to Ra,

• Operating Temperature: -4 to 104 F
• Technology: Contact / Stylus Based
• Display & Special Features: Digital Readout
• Mounting / Loading Options: Handheld / Portable

Description: The Lapmaster Flatness Gauges provides a quick, reliable method of inspecting lap plates, polishing plates, surface plates and other large surfaces for flatness. The Flatness Gauge determines flatness by measuring the deviation from a straight line on a plane determined by the gauge body. This

• Vertical (Z) Resolution: 0.0001 inch
• Profile Vertical Resolution: 0.0001 inch
• Applications: Aerospace / Defense, Electronics, Precision Machining / Grinding
• Display & Special Features: Analog Meter, Digital Readout

Description: to characterization of stainless steel surfaces that are smoother than Ra = 0.25 [mu]m, as determined by a contact-stylus profilometer and defined by ANSI B46.1. The magnifications and height scales used in this test method were chosen with this smoothness in mind. 1.2.2 Intentional

Description: to characterization of stainless steel surfaces that are smoother than Ra = 0.25 μm, as determined by a contact-stylus profilometer and defined by ANSI B46.1. The magnifications and height scales used in this test method were chosen with this smoothness in mind. 1.2.2 Intentional