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Supplier: Bruker Corporation
Description: Bruker's Dektak® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film
- Display & Special Features: Computer Interface / Networkable
- Industrial Applications: Electronics, Semiconductor Manufacturing, Other
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
- Mounting / Loading: Benchtop, Floor / Free Standing
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Description: ,0 mm2. The Technical Report is applicable only to a laterally homogeneous bulk or single-layered material where the ion-sputtering rate is determined from the sputtered depth, as measured by a mechanical stylus profilometer, and sputtering time. The Technical Report provides a method
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Supplier: Accuris
Description: Surface chemical analysis - Depth profiling - Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
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Supplier: Accuris
Description: Surface chemical analysis \x97 Depth profiling \x97 Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
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Supplier: Fischer Technology, Inc.
Description: Developed by anti-corrosion experts, the three devices impress with robustness, usability and performance. All required measurement tasks in heavy corrosion protection are solved quickly and reliably. The DFT is the handheld device for the simple layer thickness measurement on steel and non-ferrous
- Technology: Contact / Stylus Based
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Supplier: CSA Group
Description: ,0 mm2. The Technical Report is applicable only to a laterally homogeneous bulk or single-layered material where the ion-sputtering rate is determined from the sputtered depth, as measured by a mechanical stylus profilometer, and sputtering time. The Technical Report provides a method
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Supplier: Fischer Technology, Inc.
Description: To ensure that protective layers adhere permanently, the surface roughness of the base material must comply with strict recommended standards. The FPR1 profile probe is the ideal solution in this case: When combined with the FMP10/40 series, the FPR1 profile probe is the ideal solution for testing
- Industrial Applications: Other
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
- Standards Compliance: Other
- Technology: Contact / Stylus Based
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Supplier: Precision Surfacing Solutions
Description: The Lapmaster Flatness Gauges provides a quick, reliable method of inspecting lap plates, polishing plates, surface plates and other large surfaces for flatness. The Flatness Gauge determines flatness by measuring the deviation from a straight line on a plane determined by the gauge body. This
- Display & Special Features: Analog Meter, Digital Readout
- Industrial Applications: Aerospace / Defense, Electronics, Precision Machining / Grinding
- Measurement Capability: Flatness
- Mounting / Loading: Handheld / Portable, Machine Mounted
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Supplier: Mahr Inc.
Description: "sMAHRtSurf" - Simple, smart and mobile Compact roughness measuring instrument for mobile use Simple and intuitive to use: As easy to use as a smart phone Large, illuminated 4.3" TFT touch display Adjustable display Start button also serves as the Home button for direct access to the start screen
- Display & Special Features: Video / Graphic Display
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Handheld / Portable
- Standards Compliance: ISO / EN, DIN
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Supplier: Mahr Inc.
Description: Product features Bright, illuminated color display Automatic selection of filter and traversing length conforming to standards Integrated thermal graphics printer of high print quality Print the r-profile via the thermal graphics printer Printed log either by pressing a button or automatically Data
- Display & Special Features: Digital Readout
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Handheld / Portable
- Operating Temperature: 23 to 104 F
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Supplier: Mahr Inc.
Description: Product features MarSurf 300, the first portable roughness measuring unit with the option of wireless (Bluetooth) connection between the evaluation unit and drive unit. Bluetooth wireless connection Easy to use, with high-resolution color display and ATM-style user guidance Integrated standard in
- Display & Special Features: Digital Readout
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Handheld / Portable
- Operating Temperature: 23 to 104 F
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Supplier: PCE Instruments / PCE Americas Inc.
Description: PCE-RT 1200 Roughness Tester For quick, accurate measurement of Ra, Rz, Rq and Rt roughness parameters PCE-RT 1200 is a portable roughness tester used in many different material surface testing applications. The PCE-RT 1200 roughness tester has an internal memory. Data transfer to a PC is possible
- Common Specific Parameters: Roughness Average (Ra), Roughness - RMS (Rq), Mean Peak to Valley Height (Rtm, Rz), Total Roughness Height (Rt, PV)
- Display & Special Features: Digital Readout
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Handheld / Portable
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Supplier: PCE Instruments / PCE Americas Inc.
Description: Roughness Tester PCE-RT 11 Roughness tester for accurate determination of roughness according to Ra, Rz, Rq and Rt / with piezoelectric probe / big OLED display with backlight The Roughness Tester PCE-RT-11 is a portable measuring instrument for determination of surface roughness according to Ra,
- Common Specific Parameters: Roughness Average (Ra), Roughness - RMS (Rq), Mean Peak to Valley Height (Rtm, Rz), Total Roughness Height (Rt, PV)
- Display & Special Features: Digital Readout
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Handheld / Portable
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Supplier: Mahr Inc.
Description: MarSurf XR 1. The ideal instrument for a low-cost introduction to user-friendly surface metrology. The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. MarSurf XR 1 from Mahr stands for
- Display & Special Features: Computer Interface / Networkable
- Industrial Applications: Aerospace / Defense, Automotive, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Benchtop
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Supplier: ASTM International
Description: 1.1 This guide covers the preferred procedure for acquiring and post-processing of sputter crater depth measurements. This guide is limited to stylus-type surface profilometers equipped with a stage, stylus, associated scan and sensing electronics, video system for sample and
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Supplier: ASTM International
Description: 1.1 This guide covers the preferred procedure for acquiring and post-processing of sputter crater depth measurements. This guide is limited to stylus-type surface profilometers equipped with a stage, stylus, associated scan and sensing electronics, video system for sample and
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Supplier: ASTM International
Description: 1.1 This guide covers the preferred procedure for acquiring and post-processing of sputter crater depth measurements. This guide is limited to stylus-type surface profilometers equipped with a stage, stylus, associated scan and sensing electronics, video system for sample and
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Supplier: ASTM International
Description: 1.1 This guide covers the preferred procedure for acquiring and post-processing of sputter crater depth measurements. This guide is limited to stylus-type surface profilometers equipped with a stage, stylus, associated scan and sensing electronics, video system for sample and
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The correct objective is like the proper stylus probe on a contact measurement device. With an objective, paying attention to the following is essential: field-of-view (FOV), working distance, and lateral resolution. FOV refers to the area the device captures in one image. A (read more)
Browse Surface Profilometers Datasheets for Zygo Corporation
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Comparison of Frequency Response Characteristics of an Optical Scatterometer and a Mechanical Profilometer
In this paper we examine the frequency response characteristics of an ARS and a stylus profilometer .
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Optimization of laser scribing for thin-film PV modules. Final technical progress report, 12 April 1995--11 October 1997
Optical micrograph and stylus profilometer trace of cwp YAG scribe in GIGS . . . . . . . . . . .
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Development of B‐doped Si multiple delta‐layer reference materials for SIMS profiling
A consistency check of the calibration of stylus profilometers for measurement of sputter depth is another possible application.
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On‐line determination of sputtered depth in a radio frequency glow discharge atomic emission source by laser confocal displacement
The claimed depth/displacement res- olutions for the LCDS system and the stylus profilometer are vastly different (0.2 µm for the LCDS vs. 25 ˚A for the profilometer), however both are within the range applica- ble to GD analyses.
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CR4 - Thread: Calibration of Stylus Profilometers
Calibration of Stylus Profilometers .
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Limits Of Surface Measurement By Stylus Instruments
The performance of stylus profilometers can be defined by modelling their abilities to respond to sinusoidal profiles, and can be compared by mapping their limits in amplitude - wavelength (AW) space.
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Surface roughness measurement of flat and curved machined metal parts using a near infrared super-continuum laser
The roughness measurements performed by this system are in very good agreement with comparative data from a stylus profilometer and a white light interferometer.
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Accurate and traceable measurement of nano- and microstructures
In order to further expand the application capacity of the LR-SPM, a diamond stylus detector has been implemented as an alternative probe head to the LR-SPM, and consequently a new metrological stylus profilometer is constructed.