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Supplier: Unitron Ltd.
Description: Non-contact measuring, utilizes vickers instruments
- Application: Measuring / Toolmaker
- Eyepiece Style: Trinocular
- Fine Focus: Yes
- Grade: Benchtop
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Supplier: Unitron Ltd.
Description: Non-contact measuring, utilizes vickers instruments
- Application: Measuring / Toolmaker
- Eyepiece Style: Monocular
- Fine Focus: Yes
- Grade: Benchtop
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Supplier: Unitron Ltd.
Description: Non-contact measuring, utilizes vickers instruments
- Application: Measuring / Toolmaker
- Eyepiece Style: Trinocular
- Fine Focus: Yes
- Grade: Benchtop
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Supplier: Unitron Ltd.
Description: Non-contact measuring, utilizes vickers instruments
- Application: Measuring / Toolmaker
- Eyepiece Style: Trinocular
- Fine Focus: Yes
- Grade: Benchtop
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Supplier: ASTM International
Description: , permanent indentation. The surface projection of the two diagonals of the permanent indentation is measured using a light microscope. The average diagonal size and the applied force are used to calculate the Vickers hardness, which represents the material’s resistance to penetration
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Supplier: ASTM International
Description: , permanent indentation. The surface projection of the two diagonals of the permanent indentation is measured using a light microscope. The average diagonal size and the applied force are used to calculate the Vickers hardness, which represents the material’s resistance to penetration
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Supplier: Fischer Technology, Inc.
Description: retroactively Indenters: Vickers, Berkovich or carbide ball Measuring head suitable for the measurement of creep at constant temperatures over several hours Microscope with three magnification levels for exact positioning of the measuring spot Autonomous, highly
- Hardness Testers: Vickers and Knoop, Other
- Mounting: Fixtured or Permanent
- Test Method: Micro
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Supplier: Fischer Technology, Inc.
Description: of indentation and creep Measurement and computation of material parameters according to DIN EN ISO 14577-1 and ASTM E 2546 Indenters: Vickers, Berkovich or carbide ball Customer-specific indenters on request Microscope with three magnification levels and
- Hardness Testers: Vickers and Knoop, Other
- Mounting: Fixtured or Permanent
- Test Load: 5.10E-7 to 0.0510 kg
- Test Method: Micro
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Supplier: Shimadzu Scientific Instruments, Inc.
Description: reading through an optical microscope to fully automated models with programmable movement and automatic reading by analysis of images from a built-in CCD camera. HMV-G models: HMV-G20 series standalone testers with manual indentation reading and manual stage movement HMV
- Hardness Testers: Brinell, Vickers and Knoop
- Mounting: Fixtured or Permanent
- Test Method: Micro
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Supplier: Anton Paar
Description: changed in an easy and quick way. Tips of different diameters and angles are available. The same indenter holder can be used for different kinds of tips such as spherical tips (1, 5, 20, 200, 800, ... µm tips with open angles of 120° or 90°), Berkovich tips, or Vickers tips
- Mounting: Fixtured or Permanent
- Test Load: 10.2 to 20.39 kg
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Supplier: ASTM International
Description: indentation. The surface projection of the long diagonal of the permanent indentation is measured using a light microscope. The length of the long diagonal and the applied force are used to calculate the Knoop hardness which represents the material’s resistance to penetration by the Knoop
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Supplier: ASTM International
Description: , permanent indentation. The surface projection of the long diagonal of the permanent indentation is measured using a light microscope. The length of the long diagonal and the applied force are used to calculate the Knoop hardness which represents the material’s resistance to penetration by
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Advanced Materials and Process Technology
Due to the poor knowledge on parameters’ influence on all the responses of hardness (y1), stain yield (y2) and roundness (y3) of specimen from the HTP determined via a hardness vickers , microscope and roundness comparator, respectively.
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Exhibiting Electricity
An important exhibit, not seen previously outside the laboratory, was the Metropolitan- Vickers electron microscope (type EM2), operating at 50 kV, providing a magnification of up to 50 000 times (a resolving power 50 times greater than the best optical microscope of…
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Inferring Pattern and Disorder in Close-Packed Structures from X-ray
Diffraction Studies, Part II: Structure and Intrinsic Computation in Zinc
Sulphide
The crystals were examined under a vickers projection mi- croscope and did not show signs of kinking or shearing, even after annealing.
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Inferring planar disorder in close‐packed structures via ɛ‐machine spectral reconstruction theory: structure and intrinsic computation in zinc sulfide
The crystals were examined under a vickers projec- tion microscope and did not show signs of kinking or shearing, even after annealing.
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X‐ray investigation of the mechanisms of phase transformations in single crystals of ZnS, Zn x Cd 1−x S, and Zn x Mn 1−x S (II). Comparison of observed and cal...
The crystals did not show the appearance of any kinks or shear on examination under a vickers projec- tion microscope .
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Frontiers of Mechanical Engineering and Materials Engineering
The regulation of the continuous cooling phase transformation and microstructure change of Nb-Ti micro-alloyed D460 ship plate steel were studied with Gleeble-3800 thermal mechanical simulation tester, optical microscope and vickers hardness tester.
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Electron microscopy of cellulose in entire tissue
Thin sections and freeze-etch replicas were examined in a Metropolitan- Vickers EM6 electron microscope at 50 kV, or an AEI EM6B or EM801A at 60 kV.
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STUDIES OF THE PRIMARY AND THE SECONDARY IMMUNE RESPONSES OF LYMPH NODES DRAINING HOMOGRAFTS OF FRESH CANCELLOUS BONE (WITH PARTICULAR REFERENCE TO MECHANISMS ...
Sections were cut and ex- amined with a Metropolitan- Vickers EM3A electron microscope .
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Characteristic Growth Features and Etching of InBi Single Crystals
The features on the top free surface were studied by optical method using Vicker 's projection microscope .
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A study on blends of nylon‐6 and nylon‐66
~From the F, and birefringence, the value of the amorphous orientation function was obtained by the method of Stein and Norrk6 Birefringence (A,,) of the drawn samples was obtained using Vicker 's Polarising Microscope with a Leitz Wetzlar tilting-plate-type compensator.
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