Properties of Silicon Carbide

The following abbreviations are used throughout the book.
| ?-Sic | hexagonal silicon carbide |
| A | acceptor |
| AC | alternating current |
| AES | Auger elctron spectroscopy |
| APB | anti-phase boundary |
| ASA | atomic sphere approximation |
| ?-Sic | cubic silicon carbide |
| BE | bound exciton |
| BJT | bipolar junction transistor |
| BZ | Brillouin zone |
| CFLPE | container free liquid phase epitaxy |
| CL | cathodoluminescence |
| CMOS | complementary metal-oxide-semiconductor |
| C-V | capacitance-voltage |
| CVD | chemical vapour deposition |
| D | donor |
| DAP | donor-acceptor pairs |
| DAS | dimer-adatom stacking fault |
| DC | direct current |
| DLTS | deep level transient spectroscopy |
| DPB | double position boundary |
| EBIC | electron beam induced current |
| ECR | electron cyclotron resonance |
| EELS | electon energy loss spectroscopy |
| EHL | electron hole liquid |
| EL | electroluminescence |
| EMF | electro-motive force |
| EP | empirical pseudopotential |
| EPM | empirical pseudopotential method |
| EPR | electron paramagnetic resonance |
| ESD | electron stimulated desorption |
| ESR | electron spin resonance |
| ETB | empirical tight binding |
| FB | free-to-bound |
| FET | field effect transistor |
| G-V | conductance-voltage |
| HF | hyperfine |
| IC | integrated circuit |
| IDB | inversion domain boundary |
| IMPATT | impact ionization avalanche transient time |
| IR | infrared |
| I-V | current-voltage |
| JFET | junction field effect transistor |
| JFM | Johnson's figure of merit |
| KFM | Keyes' figure of merit |
| LA | longitudinal acoustic |
| LCAO | linear combination of atomic orbitals |
| LDA | local density approximation |
| LED | light emitting diode |
| LEED | low energy electron diffraction |
| LMTO | linear muffin-tin orbital |
| LO | longitudinal optical |
| LPE | liquid phase epitaxy |
| LTLPE | low temperature liquid phase epitaxy |
| LUC-MINDO | large unit cell-modified intermediate neglect of differential overlap |
| LVB | lower valence band |
| LZ | large zone |
| MBE | molecular beam epitaxy |
| MEIS | medium energy ion scattering |
| MESFET | metal semiconductor field effect transistor |
| MINDO | modified intermediate neglect of differential overlap |
| MIS | metal-insulator-semiconductor |
| MOCVD |