Appendix

Figure II.1: (a) A high-resolution transmission electron microscope (TEM) is a key tool for nanomaterials research, which can provide not only atomic resolution lattice images but also chemical and electronic information at a spatial resolution better than 1 nm. The most advanced TEM today can reach 0.1 nm image resolution, and 0.2 nm in probe size, (b, c) Optical diagrams of a TEM in selected area diffraction (SAD) mode and bright-field imaging (BFI) and dark-field imaging (DFI) mode.

Figure II.2: Atomic structures of nanocrystals can be imaged directly by TEM, which has been used since late 1970s for imaging of surfaces, (a, b) are high-resolution TEM images of FePt nanocrystals oriented along [110], showing the profile images of the {111}, {100} and {110} facets, (c, d) Enlarged atomic structures of the {110} surface, showing the "missing-row" reconstruction, and (e, f) are the corresponding atomic structure models, respectively (Z. R. Dai, S. H. Sun, and Z. L. Wang, Surface Sci., 505 (2002) 325).

Figure II.3: Growth of heterostructures is an important technique for fabrication of quantum devices for optoelectronic applications. Examining the interfaces in these materials can only be carried out by high-resolution TEM. (a) TEM image of the GaAs superlattice structure formed by periodically exposing GaAs (001) to Sb ₂ during the molecular beam epitaxy, (b, c) High-resolution TEM images recorded from the region with Sb exposure, showing that anion exchange is limited to about 4 atomic layers (Courtesy of Dr. Yongqian Wang, Dr. Z. L. Wang, and Dr.

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Handbook of Nanophase and Nanostructured Materials, Volume 2: Characterization

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