TABLE OF CONTENTS Transmission electron microscopy and associated techniques are powerful tools for characterization of nanophase materials. This chapter mainly introduced the high-resolution imaging in TEM and some newly developed techniques, such as holography and electron energy filtering. High spatial resolution analysis is vitally important for solving many of the practical problems of nanomaterials. Spectroscopy analysis of the solid state effects and the valence states mapping are new directions of quantitative microscopy.
In situ TEM is anticipated to be important for characterizing and measuring the properties of individual nanoparticles, from which the structure-property relationship can be clearly registered to a specific nanoparticle/structure. An emphasis has been placed on new developments in TEM for in situ nanomeasurements of the mechanical and electrical properties of individual nanostructures, aiming to correlate the measured properties with the nanostructure. This is a new direction in TEM and it is important for characterizing nanophase materials. Therefore, TEM is truly a versatile tool not only for structure analysis both crystallographically and chemically, but also a powerful approach for nanomeasurements.
Acknowledgment Z. L. Wang is grateful to his collaborators, J.S. Yin, W.A. de Heer, P. Poncharal, T. Ahamed, M.A. El-Sayed, R.L. Whetten, T. Green, M. Mohamadi and J. Petroski. Research was partially sponsored by NSF grant DMR-9733160. Thanks to the Georgia Tech Electron Microscopy Center for providing the facility. YL wishes to acknowledge his collaborators D. J. Sellmyer, S. Bandyopadhyay, S.H. Liou, Z.S. Shan and J. P. Liu. Research at UNL is partially supported by AFOSR F49620-98-1-0098 and...
