Breakdown Phenomena in Semiconductors and Semiconductor Devices

As mentioned in Section 2.1, the breakdown scenario depends critically on the ramp dV 0/ dt. Over a very wide range of magnitudes of dV 0/ dt the conventional (static or quasi-static) breakdown scenario discussed in Chapter 3 is followed, but if dV 0/ dt ramp becomes extremely large the picture changes dramatically.
To establish the criteria for static and dynamic breakdown, let us consider the situation in which a relatively small voltage V 0 << V i (where V i is the static breakdown voltage) is applied to a reverse-biased p - n junction (Figure 5.1, curve 1).
The left-hand part of the base region of W length is completely depleted (space-charge (SCR) or depleted region). The electric field in this region decreases linearly with x according to the Poisson equation dF/ dx = eN d/ ? ? 0.