Introduction to the Dimensional Stability of Composite Materials

Table 1.1 showed the strain range of interest to the dimensional stability of engineering materials, from nanometers per meter (nanotechnology) to 0.2% offset strain (engineering yield strengths). Table 11.1 lists a range of candidate measurement techniques that cover the required temperatures, stress levels, environmental conditions, precision and accuracy [1]. These techniques include methods to determine linear displacements, area distortions and even volumetric or 3-dimensional shape changes.
| Technique | Resolution (m) | Range (m) or ? ?(%) | Accuracy m or % Range | Contacting [*] |
|---|---|---|---|---|
| A. Metrology | ||||
| Air Gage | 10 ?7 | 10 ?3 | 1% | SG |
| Micrometers | 3 10 ?5 | 10 ?1 | 10 ?4 | C |
| Vernier Scales | 3 10 ?5 | 1 | 2 ?10 ?5 | C |
| Dial Gages | 10 ?5 | 10 ?2 | 10 ?5 | C |
| Profile Projectors | 8 10 ?6 | 1 | 10 ?5 | L |
| Telemicroscopes | 10 ?6 | 1 | 10 ?6 | L |
| Micrometer Slides | 10 ?6 | 10 ?1 | 10 ?6 | SG |
| B. Electrical Transducers | ||||
| Resistance Strain Gages | 10 ?7( ?) | 20% | 10 ?7( ?) | C |
| Semiconductor Strain Gages | 10 ?9( ?) | 1% | 10 ?8( ?) | C |
| Capacitance | 10 ?11 | 10 ?4 | 10 ?1 0 | SG |
| LVDT's (dilatometers) | 2 10 ?6 | 10 ?2 | 10 ?8 | SG |
| Electronic Gages | 10 ?9 | 10 ?5 | 10 ?9 | C |
| Resistance Transducers | 10 ?5 | 3 | 1% | C |
| Variable lmpedance | 10 ?8 | 10 ?2 | 0.01% | SG |
| Variable Reluctance | 10 ?6 | 10 ?3 | 3% | C |
| C. Electro-Optical Techniques |