Introduction to the Dimensional Stability of Composite Materials

Chapter 11: Measurement Techniques

11.1 INTRODUCTION

Table 1.1 showed the strain range of interest to the dimensional stability of engineering materials, from nanometers per meter (nanotechnology) to 0.2% offset strain (engineering yield strengths). Table 11.1 lists a range of candidate measurement techniques that cover the required temperatures, stress levels, environmental conditions, precision and accuracy [1]. These techniques include methods to determine linear displacements, area distortions and even volumetric or 3-dimensional shape changes.

Table 11.1: Summary of Length Measurement Techniques.

Technique

Resolution (m)

Range (m) or ? ?(%)

Accuracy m or % Range

Contacting [*]

A. Metrology

Air Gage

10 ?7

10 ?3

1%

SG

Micrometers

3 10 ?5

10 ?1

10 ?4

C

Vernier Scales

3 10 ?5

1

2 ?10 ?5

C

Dial Gages

10 ?5

10 ?2

10 ?5

C

Profile Projectors

8 10 ?6

1

10 ?5

L

Telemicroscopes

10 ?6

1

10 ?6

L

Micrometer Slides

10 ?6

10 ?1

10 ?6

SG

B. Electrical Transducers

Resistance Strain Gages

10 ?7( ?)

20%

10 ?7( ?)

C

Semiconductor Strain Gages

10 ?9( ?)

1%

10 ?8( ?)

C

Capacitance

10 ?11

10 ?4

10 ?1 0

SG

LVDT's (dilatometers)

2 10 ?6

10 ?2

10 ?8

SG

Electronic Gages

10 ?9

10 ?5

10 ?9

C

Resistance Transducers

10 ?5

3

1%

C

Variable lmpedance

10 ?8

10 ?2

0.01%

SG

Variable Reluctance

10 ?6

10 ?3

3%

C

C. Electro-Optical Techniques

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