TABLE OF CONTENTS The following is a listing of informative references.
AS 9000 Revised 1998, Aerospace Basic Quality System Standard, Appendix 1, Society of Automotive Engineers
ISO/TR 9122-1:1989, Toxicity of Combustion Products
BSI BS EN 190000, Harmonised System of Quality Assurance for Electronic Components, Generic Specification Monolithic Integrated Circuits
CDF-AEC Q100, Stress Test Qualification for Automotive-Grade Integrated Circuits, Chrysler-Delco-Ford Automotive Electronics Council
CDF-AEC Q101, Stress Test Qualification for Automotive-Grade Discrete Semiconductors, Chrysler-Delco-Ford Automotive Electronics Council
CDF-AEC Q200, Stress Test Qualification for Automotive-Grade Passive Components, Chrysler-Delco-Ford Automotive Electronics Council
CECC 00114, Rules of Procedure Quality Assessment Procedures
DEF.STAN.00-71 Issue 2, Obsolescence Management
EIA JESD22-A112-A, JEDEC Standard Test Method A112-A, Moisture Induced Stress Sensitivity for Plastic Surface Mount Devices
EIA JESD22-A113-B (1999), JEDEC Standard Test Method A113-B Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
EIA JESD 26-A, JEDEC Standard - General Specification for Plastic Encapsulated Microcircuits for use in Rugged Applications
EIA JESD 47, JEDEC Standard Stress Driven Qualification of Integrated Circuits
EN 100015-1 (1992), Basic Specification: Protection of Electrostatic Sensitive Devices - Part 1: General Requirements
EN 100015-2 (1993), Basic Specification: Protection of Electrostatic Sensitive Devices - Part 2: Requirements for Low Humidity Conditions
EN 100015-3 (1993), Basic Specification: Protection of Electrostatic Sensitive Devices - Part 3: Requirements for Clean Room Areas
EN 100015-4 (1993), Basic Specification: Protection of Electrostatic Sensitive Devices - Part 4: Requirements for High-Voltage Environments
EN 100114-1 (1996), Rules of Procedure 14: Quality Assessment Procedures Part 1: CECC Requirements for the Approval of...
