Continuous Refractometers
from Vaisala
For semiconductor liquid chemical processes. A compact refractometer with an ultra-pure modified PTFE flow cell body for semiconductor liquid chemical processes. Connected to the process by a ¼ — 1 inch pillar or flare fitting. Vaisala K-PATENTS ® Semicon Refractometer PR-23-MS has a... [See More]
- Monitoring: Continuous Monitoring
- RI Range: Full measurement range of Refractive Index nD 1.3200–1.5300, which corresponds to 0-100 % by weight. Optional range nD 1.2600–1.4700 for strong HF
- Measurement Scale: RI
- Prism / Light Source & Special Features: Modified PTFE, Prism Gasket Modified PTFE Prism Sapphire, O-ring Kalrez, Adaptor Sapphire; Alarms; Automatic Temperature Compensation; Temp Measurement
from FLEXIM AMERICAS Corp.
Technical features: Embedded standard-applications, e.g. determination of the sugar concentration in °Brix. Calculation of user defined output values: e.g. density, w%, Vol%, g/l, dry mass. Use of up to two sensors per Transmitter possible. Simple creation and management of user-defined data... [See More]
- Monitoring: Continuous Monitoring
- RI Range: nD: 1.3 … 1.7
- Measurement Scale: RI; BRIX
- BRIX Range: Brix: 0…100
from Vaisala
For semiconductor liquid chemical processes. A compact refractometer with an ultra pure modified PTFE flow cell body for semiconductor liquid chemical processes. Connected to the process by a ¼ — 1 inch pillar or flare fitting. Vaisala K-PATENTS ® Semicon Refractometer PR-33-S... [See More]
- Monitoring: Continuous Monitoring
- RI Range: Full measurement range of Refractive Index nD 1.3200–1.5300, which corresponds to 0-100 % by weight. Optional range nD 1.2600–1.4700 for strong HF
- Measurement Scale: RI
- Prism / Light Source & Special Features: Modified PTFE, Prism Gasket Modified PTFE Prism Sapphire, O-ring Kalrez, Adaptor Sapphire; Alarms; Automatic Temperature Compensation; Temp Measurement