Semiconductor / High Density Electrical Test Probes

19 Results
Probe Tip -- DC-11018
from SemiProbe

Submicron probe for small featue probing, can easily be bent or cut to length [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Computer
Ball Grid Array Probes -- M08-89 Series
from QA Technology Company, Inc.

The M08-PRH89 series Spear or Crown probes are designed for 0.8 mm standard and custom socket applications. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Approvals: RoHS Compliant
Conventional Board Testing Probes -- 025-16 Series
from QA Technology Company, Inc.

Choice of Spherical or Spear points designed for loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Operating Temperature: 4 to 121
Conventional Board Testing Probes -- 039-16 Series
from QA Technology Company, Inc.

Choices of Spherical, Spear, Crown, Chisel or Razor Sharp Tip points designed for loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Operating Temperature: 4 to 121
Conventional Board Testing Probes -- 050-05 Series
from QA Technology Company, Inc.

Choices of Spherical, Chisel or Spear point designed for bare and loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Operating Temperature: 4 to 121
Conventional Board Testing Probes -- 050-16 Series
from QA Technology Company, Inc.

Choices of Chisel, Spherical, Spear, Crown, Cup, Serrated, or Chisel point designed for loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Operating Temperature: 4 to 121
Conventional Board Testing Probes -- 050-R25 Series
from QA Technology Company, Inc.

Choices of Cup, Flat, Blade, Serrated, Spherical, Spear, Crown or Chisel point designed for loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Operating Temperature: 4 to 121
Conventional Board Testing Probes -- 050-T25 Series
from QA Technology Company, Inc.

Choices of Flat, Blade, Cup, Serrated, Spherical, Spear, Crown or Chisel point designed for bare and loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Operating Temperature: 4 to 121
Conventional Board Testing Probes -- 075-25 Series
from QA Technology Company, Inc.

Choices of Star point, Torch point, Tulip, Insulator, Flat, Blade, Serrated, Spherical, Chisel, Crown, or Spear designed for loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Operating Temperature: 4 to 121
Conventional Board Testing Probes -- 075-40 Series
from QA Technology Company, Inc.

Chisel, Triad, Star, Crown, Serrated, Spear or Blade point probe designed for mixed height loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Operating Temperature: 4 to 121
Conventional Board Testing Probes -- 100-05 Series
from QA Technology Company, Inc.

Choice of Chisel, Spherical, or Cup point probe designed for bare PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Operating Temperature: 4 to 121
Conventional Board Testing Probes -- 100-16 Series
from QA Technology Company, Inc.

Choices of Slotted, Serrated, Star, Spherical, Torch, Cup, Crown, Chisel, Flat, Triad or Connector point designed for bare and loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Operating Temperature: 4 to 121
Conventional Board Testing Probes -- 100-25 Series
from QA Technology Company, Inc.

Choices of Slotted, Serrated, Star, Spherical, Torch, Crown, Chisel, Flat, Cup, Tulip, Spear, and Triad designed for loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Operating Temperature: 4 to 121
Conventional Board Testing Probes -- 100-40 Series
from QA Technology Company, Inc.

Choices of Slotted, Serrated, Star, Spherical, Torch, Crown, Chisel, Flat, Traid, Tulip and Chisel/Triad point designed for mixed height, loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Operating Temperature: 4 to 121
Conventional Board Testing Probes -- 125-25 Series
from QA Technology Company, Inc.

Choices of Spear, Crown, Cup, Flat, Serrated or Chisel point designed for loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Operating Temperature: 4 to 204
Interface Probes for Test Jet, Polarity Check, GenRad and Teladyne Testers -- 100 Series
from QA Technology Company, Inc.

Probes for GenRad testers come in: Nickel silver/ID precious metal clad. Nickel silver/ID OD gold plated. Nickel silver/No finish [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Approvals: RoHS Compliant
X Probe® Socketless Probe Series -- X39 Series
from QA Technology Company, Inc.

Choices of Spherical, Spear, Crown, Blade, Flat, Serrated, Torch, or Chisel dsigned for loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Approvals: RoHS Compliant
X Probe® Socketless Probe Series -- X50 Series
from QA Technology Company, Inc.

Choices of Spherical, Spear, Star, Crown, Cup, Blade, Flat, Serrated, Torch, Triad, Tulip, or Chisel/Triad designed for loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Approvals: RoHS Compliant
X Probe® Socketless Probe Series -- X75 Series
from QA Technology Company, Inc.

Choices of Chisel, Spherical, Spear, Star, Crown, Blade, Flat, Serrated, Torch, Triad, Tulip or Chisel/Triad designed for loaded PCB testing. [See More]

  • Probe Type: Semiconductor / High Density
  • Probe Configuration: Spring Loaded
  • Probe Technology: Passive
  • Approvals: RoHS Compliant