Semiconductor / High Density Electrical Test Probes
from SemiProbe
Submicron probe for small featue probing, can easily be bent or cut to length [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Computer
from QA Technology Company, Inc.
The M08-PRH89 series Spear or Crown probes are designed for 0.8 mm standard and custom socket applications. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Approvals: RoHS Compliant
from QA Technology Company, Inc.
Choice of Spherical or Spear points designed for loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Operating Temperature: 4 to 121
from QA Technology Company, Inc.
Choices of Spherical, Spear, Crown, Chisel or Razor Sharp Tip points designed for loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Operating Temperature: 4 to 121
from QA Technology Company, Inc.
Choices of Spherical, Chisel or Spear point designed for bare and loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Operating Temperature: 4 to 121
from QA Technology Company, Inc.
Choices of Chisel, Spherical, Spear, Crown, Cup, Serrated, or Chisel point designed for loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Operating Temperature: 4 to 121
from QA Technology Company, Inc.
Choices of Cup, Flat, Blade, Serrated, Spherical, Spear, Crown or Chisel point designed for loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Operating Temperature: 4 to 121
from QA Technology Company, Inc.
Choices of Flat, Blade, Cup, Serrated, Spherical, Spear, Crown or Chisel point designed for bare and loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Operating Temperature: 4 to 121
from QA Technology Company, Inc.
Choices of Star point, Torch point, Tulip, Insulator, Flat, Blade, Serrated, Spherical, Chisel, Crown, or Spear designed for loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Operating Temperature: 4 to 121
from QA Technology Company, Inc.
Chisel, Triad, Star, Crown, Serrated, Spear or Blade point probe designed for mixed height loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Operating Temperature: 4 to 121
from QA Technology Company, Inc.
Choice of Chisel, Spherical, or Cup point probe designed for bare PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Operating Temperature: 4 to 121
from QA Technology Company, Inc.
Choices of Slotted, Serrated, Star, Spherical, Torch, Cup, Crown, Chisel, Flat, Triad or Connector point designed for bare and loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Operating Temperature: 4 to 121
from QA Technology Company, Inc.
Choices of Slotted, Serrated, Star, Spherical, Torch, Crown, Chisel, Flat, Cup, Tulip, Spear, and Triad designed for loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Operating Temperature: 4 to 121
from QA Technology Company, Inc.
Choices of Slotted, Serrated, Star, Spherical, Torch, Crown, Chisel, Flat, Traid, Tulip and Chisel/Triad point designed for mixed height, loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Operating Temperature: 4 to 121
from QA Technology Company, Inc.
Choices of Spear, Crown, Cup, Flat, Serrated or Chisel point designed for loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Operating Temperature: 4 to 204
from QA Technology Company, Inc.
Probes for GenRad testers come in: Nickel silver/ID precious metal clad. Nickel silver/ID OD gold plated. Nickel silver/No finish [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Approvals: RoHS Compliant
from QA Technology Company, Inc.
Choices of Spherical, Spear, Crown, Blade, Flat, Serrated, Torch, or Chisel dsigned for loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Approvals: RoHS Compliant
from QA Technology Company, Inc.
Choices of Spherical, Spear, Star, Crown, Cup, Blade, Flat, Serrated, Torch, Triad, Tulip, or Chisel/Triad designed for loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Approvals: RoHS Compliant
from QA Technology Company, Inc.
Choices of Chisel, Spherical, Spear, Star, Crown, Blade, Flat, Serrated, Torch, Triad, Tulip or Chisel/Triad designed for loaded PCB testing. [See More]
- Probe Type: Semiconductor / High Density
- Probe Configuration: Spring Loaded
- Probe Technology: Passive
- Approvals: RoHS Compliant