Scanning Electron Microscope (SEM) Biological Microscopes
from Phenom-World BV
The Phenom Pro desktop SEM is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images with a minimum of user maintenance intervention. The backscattered-electron detector (BSED) and... [See More]
- Microscope Type: Scanning Electron Microscope
- Magnification: 80 to 100000
- Grade: Benchtop
- Resolution: ? to 17
from Hitachi High Technologies America, Inc.
The dual-beam FIB-SEM integrates a high-performance 40 kV FIB column and an ultra-high-resolution Schottky field-emission SEM column. By using dedicated fabrication template patterns for automatic lift-out, fabrication processes from fiducial marking to specimen lift-out can be automated. For... [See More]
- Microscope Type: Scanning Electron Microscope
- Grade: Research
from Phenom-World BV
The Phenom ProX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system. With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Viewing three-dimensional images of microscopic structures... [See More]
- Microscope Type: Scanning Electron Microscope
- Magnification: 80 to 100000
- Grade: Benchtop
- Resolution: ? to 17
from Hitachi High Technologies America, Inc.
FIB-SEM systems have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale materials. An ever-increasing demand for ultrathin TEM lamellas without artifacts during FIB processing require the best in ion and electron optics... [See More]
- Microscope Type: Scanning Electron Microscope
- Grade: Research
from Phenom-World BV
The Phenom Pure desktop SEM (scanning electron microscope) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom Pure is equipped with the basic fundamentals for meeting imaging needs. The Phenom Pure provides high-quality... [See More]
- Microscope Type: Scanning Electron Microscope
- Magnification: 70 to 20000
- Grade: Benchtop
- Resolution: ? to 30
from Hitachi High Technologies America, Inc.
The MI4050 High-Performance Focused Ion Beam System is equipped with new optics and provides the world-leading SIM imaging resolution and high-definition TEM sample preparation with improved imaging resolution at low kV. The MI4050 accommodates a variety of applications such as cross-section... [See More]
- Microscope Type: Scanning Electron Microscope
- Grade: Research