Scanning Probe / Atomic Force (SPM / AFM) Biological Microscopes
from Oxford Instruments
The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The same high resolution, speed and stability are maintained while easily operating in controlled gas or liquid environments, at temperatures from 0-250 °C, and in... [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Optical Technique: Contact mode, DART PFM, Dual AC, Dual AC Resonance Tracking (DART), More
- Grade: Benchtop
from Mad City Labs, Inc.
The SPM-M Kit combines the MadPLL ® instrument package with Mad City Labs high resolution piezo nanpositioning systems to form a high performance, closed loop, scanning Akiyama probe or tuning fork AFM. The seamless integration of hardware combined with the built-in automated control of MadPLL... [See More]
- Microscope Type: Scanning Probe / Atomic Force
from Park Systems, Inc.
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology. It is a mid-priced system for materials science, polymers, electrochemistry and other applications in nanoscience and... [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Magnification: 160 to 1500
- Grade: Benchtop; Research
- Resolution: 1000
from Bruker Corporation
As atomic force microscopy enters its fourth decade as a primary technique for enabling research of all levels, its high-resolution data has helped researchers across a nearly countless array of disciplines and applications. Bruker has been leading the expansion of atomic force microscope (AFM)... [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Remote Interface: Computer Interface
from Oxford Instruments
The Cypher ES Polymer Edition is a special configuration of the Cypher ES AFM tailored to excel in polymer science research. It shares the same extraordinary performance and versatility as the Cypher ES, but comes standard with blueDrive photo thermal excitation, three powerful techniques from our... [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Optical Technique: Contact mode, DART PFM, Dual AC, Dual AC Resonance Tracking (DART), More
- Grade: Benchtop
from Mad City Labs, Inc.
The RM21 ™ is a versatile microscope suitable for a variety of advanced microscopy and nanoscopy methods. The RM21 ™ is available in 4 standard configurations (see tables) to satisfy a wide range of applications and budgets. The tables below compare methods and features for the four... [See More]
- Microscope Type: Fluorescent; Inverted; Scanning Probe / Atomic Force
- Resolution: 0.4000
- Grade: Research
- Objective Lenses: One
from Park Systems, Inc.
Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120, an exceptional AFM with expanded sample and interactivity flexibility. The XE-120 is the research grade AFM with industry ’s only True... [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Field of View: 0.1000
- Grade: Benchtop; Research
- Eyepiece Style: Binocular
from Oxford Instruments
The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Optical Technique: Contact mode, DART PFM, Dual AC, Dual AC Resonance Tracking (DART), More
- Grade: Benchtop
from Mad City Labs, Inc.
A typical application of the RM21 ™ microscope is live cell imaging and transmitted light microscopy. A standard option available with the RM21 ™ is the K öhler illumination tower, which provides a simple yet flexible solution for delivering even illumination to the sample. The K... [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Magnification: 40 to 100
- Grade: Research
- Objective Lenses: One
from Park Systems, Inc.
With the arrival of the XE-150, Park Systems ’ large sample AFM, Non-Contact AFM imaging has become the most feasible and practical way to scan your large samples with ultimate AFM resolution and reliability. The XY motorized sample stage is optimized for both small and large sample placement,... [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Magnification: 160 to 1500
- Grade: Benchtop; Research
- Resolution: 1000
from Oxford Instruments
The Cypher VRS AFM is the first and only full-featured video-rate AFM. Finally, researchers can measure nanoscale dynamic processes at video-rate speeds with all of the resolution, versatility, and ease of use that are the hallmarks of an Asylum Research Cypher AFM. High resolution video-rate... [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Optical Technique: Contact mode, DART PFM, Dual AC, Dual AC Resonance Tracking (DART), More
- Grade: Benchtop
from Mad City Labs, Inc.
The MCL-NSOM is a fully operational near field scanning optical microscope. It has been built on Mad City Labs versatile RM21 ™ inverted optical microscope which allows users to convert between NSOM, SPM, and fluorescence optical microscopy techniques. The MCL-NSOM builds on our successful... [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Magnification: 20
- Grade: Research
- Resolution: 0.4000 to 0.6000
from Park Systems, Inc.
The XE-200 is an AFM with increased capacity that supports 200 mm wafer investigation. In addition to the precise scan performance provided by True Non-Contact mode, the XE-200 offers users an encoded XY stage that travels over the entire 200 mm x 200 mm sample area, an XY scan range of 100 µm... [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Field of View: 0.1000
- Grade: Benchtop; Research
- Eyepiece Style: Monocular
from Oxford Instruments
The MFP-3D Origin ™ features Asylum Research performance and quality at a price competitive with most low-cost AFMs. Origin marks the intersection of performance and affordability and offers high-resolution imaging, supports large samples, most imaging modes, and many accessories. It's simply... [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Optical Technique: Contact mode, DART PFM, Dual AC, Dual AC Resonance Tracking (DART), More
- Grade: Benchtop
from Mad City Labs, Inc.
MadAFM ™ is a new sample scanning atomic force microscope (AFM) designed for ease-of-use and simple installation. The MadAFM ™ includes our industry leading closed loop nanopositioners for precision movement of the sample and probe. Mad City Labs has designed and manufactured piezo... [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Objective Lenses: One
- Grade: Benchtop
- Features: Mechanical Stage
from Park Systems, Inc.
XE-Bio is a powerful 3-in-1 nanoscience research tool that uniquely combines industry ’s only True Non-Contact AFM with Ion Conductance Microscopy (ICM) and inverted optical microscope on the same platform. The modular design of the XE-Bio allows easy exchange between non-contact AFM and ICM. [See More]
- Microscope Type: Scanning Probe / Atomic Force
- Optical Technique: Inverted Optical Microscope
- Grade: Benchtop
- Field of View: 0.1000