Mechanical Stage Metallurgical Microscopes

9 Results
Field Emission Scanning Electron Microscope -- SEM4000Pro
from CIQTEK Co., Ltd

CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD,... [See More]

  • Grade: Benchtop; Research
  • Magnification: 1 to 1000000
  • Microscope Type: Scanning Electron Microscope
  • Resolution: 0.9000 to 2.5
Olympus® Inverted Metallurgical Microscope -- GX51
from LECO Corporation

The advanced Olympus GX-Series sets higher standards for image clarity and resolution in inverted metallurgical microscopes. Its modular design makes it a more flexible instrument, and an ideal solution for diverse inspection and research needs (including video microscopy). LECO and Olympus —a... [See More]

  • Grade: Benchtop
  • Optical Technique: Brightfield, Darkfield, Sensitive Tint, Simple Polarizing, Nomarski DIC
  • Microscope Type: Inverted
  • Magnification: 1 to 150
Advanced Zoom Macro Microscope System -- AZ100 Multizoom
from Nikon Metrology

A multi-purpose zoom microscope system that provides capabilities that don't currently exist with stereomicroscopes and compound high magnification microscopes. The AZ100 Multizoom represents a new concept in zoom microscopes. It covers an extremely wide range of magnifications, from 5x to 400x,... [See More]

  • Grade: Benchtop
  • Optical Technique: Transmitted Light: Brightfield, Nomarski Dic, Simple Polarizing, And Oblique Illumination Observation
  • Microscope Type: Polarizing; Stereomicroscope
  • Magnification: 5 to 400
MS-2 IM2
from Unitron Ltd.

Modern inverted design with built in base transformer [See More]

  • Grade: Benchtop
  • Optical Technique: Brightfield
  • Microscope Type: Compound; Inverted
  • Magnification: 50 to 400
Field Emission Scanning Electron Microscope -- SEM5000Pro
from CIQTEK Co., Ltd

CIQTEK SEM5000Pro is a field emission scanning electron microscope with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (Super Tunnel), low aberration, and... [See More]

  • Grade: Benchtop; Research
  • Magnification: 1 to 2500000
  • Microscope Type: Scanning Electron Microscope
  • Resolution: 0.9000 to 1.3
Durable, User-friendly Inverted Microscope -- Eclipse MA100N
from Nikon Metrology

The MA100N is a compact inverted microscope designated for bright field and simple polarizing observations. Responding to the requests from manufacturing and QA/QC sections in a variety of industries, Nikon developed this simple but durable model which enables high contrast image observation... [See More]

  • Grade: Benchtop
  • Optical Technique: Bright?eld and Polarization (with MA P/A Simple Polarizer/Analyzer Set)
  • Microscope Type: Polarizing; Stereomicroscope
  • Illumination / Electron Emission Type: Built in White LED light source
Focused Ion Beam Scanning Electron Microscope -- DB500
from CIQTEK Co., Ltd

CIQTEK DB500 is a Field Emission Scanning Electron Microscope with a Focused Ion Beam column for nano analysis and specimen preparation, which is applied with “SuperTunnel ” technology, low aberration, and magnetic-free objective lens design, with low-voltage and high-resolution ability... [See More]

  • Grade: Benchtop; Research
  • Resolution: 1.2 to 3
  • Microscope Type: Scanning Electron Microscope
  • Working Distance: 65 to 110
Eclipse LV100ND Motorized Microscope
from Nikon Metrology

A manual microscope with episcopic/diascopic illumination, which meets the various needs of observation, inspection, research, and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before mean superior optical performance and efficient digital... [See More]

  • Grade: Benchtop
  • Objective Lenses: 4
  • Magnification: 1 to 150
  • Eyepiece Style: Trinocular
High-speed Scanning Electron Microscope -- HEM6000
from CIQTEK Co., Ltd

High-speed scanning electron microscope for cross-scale imaging of large-volume specimensCIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis, and... [See More]

  • Grade: Research
  • Magnification: 66 to 1000000
  • Microscope Type: Scanning Electron Microscope
  • Resolution: 1.3 to 3.3