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Supplier: Bruker Corporation
Description: As atomic force microscopy enters its fourth decade as a primary technique for enabling research of all levels, its high-resolution data has helped researchers across a nearly countless array of disciplines and applications. Bruker has been leading the expansion of atomic
- Features: AFM
- Application: Biological / Life Science, Medical / Forensic, Metallurgical
- Remote Interface: Computer Interface
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
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Supplier: Mad City Labs, Inc.
Description: is ideal for research and teaching laboratories offering high performance, versatility, simplicity and excellent value. MadPLL® is a powerful instrument package that allows the user to create an inexpensive, high resolution resonant scanning probe microscope using Mad City Labs piezo
- Features: AFM
- Application: Biological / Life Science
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
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Supplier: Mad City Labs, Inc.
Description: MadAFM™ is a new sample scanning atomic force microscope (AFM) designed for ease-of-use and simple installation. The MadAFM™ includes our industry leading closed loop nanopositioners for precision movement of the sample and probe. Mad City Labs has designed and manufactured
- Features: AFM, Mechanical Stage
- Grade: Benchtop
- Application: Biological / Life Science
- Remote Interface: Computer Interface, Image Analysis Processing Software
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Supplier: Hitachi High Technologies America, Inc.
Description: The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of electromagnetic property measurements operated under high-vacuum conditions. Furthermore, it establishes a benchmark for comprehensive environmental control and is the only tool on the market
- Application: Biological / Life Science, Medical / Forensic
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Supplier: Hitachi High Technologies America, Inc.
Description: Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabilities, and extraordinary performance. The breakthrough hardware option, the self-sensing detector, doesn't require laser and detector alignments and thus can
- Application: Biological / Life Science, Medical / Forensic
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Supplier: Accuris
Description: Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si (111) Monatomic Steps
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Supplier: Accuris
Description: Surface chemical analysis - Scanning probe microscopy - Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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Supplier: ASTM International
Description: 1.1 This practice covers a measurement procedure to calibrate the z-scale of an atomic force microscope using Si(111) monatomic step height specimens. 1.2 Applications This procedure is applicable either in ambient or vacuum condition when the atomic force
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Supplier: Accuris
Description: Surface chemical analysis \x97 Scanning probe microscopy \x97 Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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Supplier: Mad City Labs, Inc.
Description: A typical application of the RM21™ microscope is live cell imaging and transmitted light microscopy. A standard option available with the RM21™ is the Köhler illumination tower, which provides a simple yet flexible solution for delivering even illumination to the sample. The Köhler
- Total Magnification: 40 to 100 X
- Application: Biological / Life Science
- Remote Interface: Computer Interface, Image Analysis Processing Software
- Features: Mechanical Stage, Monocular
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Supplier: Mad City Labs, Inc.
Description: nanopositioning systems. Unlike conventional optical microscopes, RM21™ microscopes allow direct access to the optical pathway. This access enables users to employ a variety of microscopy methods using the same central instrument. RM21™ microscopes are compatible with 30mm and
- Resolution: 0.4 nm
- Lateral Resolution: 0.4 nm
- Features: AFM, Mechanical Stage, Monocular
- Application: Biological / Life Science
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Supplier: Polytec, Inc.
Description: The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral
- Resolution: 1,000 nm
- Lateral Resolution: 1,000 nm
- Grade: Benchtop, Research
- Remote Interface: Computer Interface, Image Analysis Processing Software
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Supplier: ASTM International
Description: 1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and
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Supplier: ASTM International
Description: 1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and
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Supplier: Park Systems, Inc.
Description: nanoscale electrophysiology. Powerful 3-in-1 Nanoscale Research Tool with Modular Platform • True Non-Contact Atomic Force Microscope (AFM) • Ion Conductance Microscope (ICM) • Inverted Optical Microscope Ultimate AFM Resolution by True Non-Contact Mode • 10 times
- Field of View: 0.10000000000000002 mm
- Features: AFM, Digital Display
- Grade: Benchtop
- Eyepiece Style: Binocular
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Supplier: Park Systems, Inc.
Description: Atomic Force Microscopy (AFM) is emerging as an essential tool in many industries. With its ability to accurately measure critical dimensions in the micrometer to nanometer regime, the AFM is becoming an essential tool choice in applications involving surface roughness, trench width,
- Features: AFM, Digital Display
- Grade: Benchtop
- Remote Interface: Image Analysis Processing Software
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
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Supplier: Park Systems, Inc.
Description: Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120, an exceptional AFM with expanded sample and interactivity flexibility. The XE-120 is the research grade AFM with industry’s only True
- Field of View: 0.10000000000000002 mm
- Features: AFM, Digital Display
- Grade: Benchtop, Research
- Eyepiece Style: Binocular
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Supplier: Park Systems, Inc.
Description: Undercut and Sidewall • Two independent, closed-loop XY and Z flexure scanners for sample and tip • Z-scanner is tilted sideways from -40 to +40 degrees • Use of normal high aspect ratio tips for high resolution imaging • XY scan of up to 100 μm x 100 μm • Up to 25 um Z scan range by high
- Resolution: 1.5 nm
- Lateral Resolution: 1.5 nm
- Features: AFM, Digital Display
- Grade: Benchtop
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Supplier: Anton Paar
Description: Differential capacitive measurement of indentation depths PC software package for automated data acquisition, storage and evaluation Options: Vacuum or environmental control enclosure Atomic Force Microscope (AFM) Sinus mode Liquid cell Technical Specifications Force Max.
- Force / Load Capacity: 0.1124 lbs
- Stroke / Travel: 0.00787402 inch
- Features: Specialty / Other
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Supplier: CSA Group
Description: ISO 11775:2015 describes five of the methods for the determination of normal spring constants for atomic force microscope cantilevers to an accuracy of 5 % to 10 %. Each method is in one of the three categories of dimensional, static experimental, and dynamic experimental
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Supplier: Piezosystem Jena, Inc.
Description: beam steering scanning systems for atomic force microscopes piezoelectrical pumps fiber positioning laser tuning Piezoelectric ring actuators consist of a large number of contacted ceramic discs. Compared with the tube actuator, the ring actuator reaches a higher stiffness and
- Maximum Displacement: 12 to 50 µm
- Blocked Force: 2,000 N
- Maximum Operating Voltage: 130 volts
- Resonance Frequency: 7 to 18 kHz
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Supplier: ValueTronics International, Inc.
Description: tunneling current of scanning tunneling microscopes (STM) Detection of conductive probe current for atomic force microscope (AFM) current measurement As a preamplifier for a lock-in amplifier The CA5350 programmable current amplifier is a variable gain type,
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Supplier: Fischer Technology, Inc.
Description: streams from air conditioning units Active damping table to reduce vibration influences Heatable sample overlays for material testing at increased temperatures Atomic force microscope (AFM): record the three-dimensional surface of your sample and measure additional material
- Mounting: Fixtured or Permanent
- Test Method: Micro
- Features: Other
- Test: Vickers and Knoop
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Supplier: Lake Shore Cryotronics, Inc.
Description: magnet systems for scanning probe, atomic force, and scanning tunneling microscopes Cryostats that operate from liquid helium temperatures to high temperatures (750 K or higher) Custom vibration-isolated systems Tensile testing and high-pressure diamond anvil cell cryostats
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Supplier: ASTM International
Description: a line or an array over an area of the surface, optical interferometry, and scanning-microscopy techniques such as atomic-force microscopy. The distinctions between different measuring techniques enter the present practice through various parameters and functions that are defined in
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NANOPOSITIONING: Piezoelectric nanopositioners forge low-cost atomic force microscope
In the nanopositioning industry, prices continue to fall as resolution, linearity, and reliability improve. Engineers can now use standard optical components and off-the-shelf nanopositioners to build a high-quality atomic force microscope.
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Building a Do-it-yourself Atomic Force Microscope
Homemade AFMs are low-cost and high-performance and provide flexibility and customization
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Atomic Force Microscopy Enhances The Nanoscopy Toolkit
ATOMIC FORCE MICROSCOPES ARE IDEAL FOR NANOMECHANICAL CHARACTERIZATION, BRINGING UTILITY TO NANOSCOPY APPLICATIONS AND EXCELLING IN CONDITIONS WHERE LOW LIGHT PRESENTS CHALLENGES OR SAMPLE INTEGRITY IS VITAL.
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Resonant Probe AFM: Uses and Advantages
RESONANT PROBE ATOMIC FORCE MICROSCOPES' UNIQUE CONSTRUCTION AND FUNCTIONALITY ENABLE THEM TO SERVE IN APPLICATIONS DEMANDING SPOT-ON ACCURACY, ADAPTABILITY, AND EXCEPTIONALLY HIGH DEFINITION
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Optical Tweezers with XYZ-Piezo Nanopositioning Stages
Investigations on interactions and forces at the level of individual molecules assist in gaining a great deal of information on chemical and mechanical properties or biological functions. Special techniques have been developed for this purpose, e.g. atomic force microscopes or so-called optical
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9 Points to Check Before Trusting Your Laser Microscope
(3D) image within seconds. SLCM†TMs measurement scale overlaps with optical light microscopy (OLM), scanning electron microscopy (SEM), and atomic force microscopy (AFM). In addition, there are minimal sample preparation requirements, and the microscopes can accommodate samples with a wide range
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EETimes.com | Electronics Industry News for EEs & Engineering Managers
with e-beam, multi-project wafers Veeco purchases IBM's atomic force microscope assets Ikos Systems shows data streaming portal for emulation system Cadabra jumpstarts standard cell libraries on TSMC's 0.18-micron process Isonics sells 18% stake to Eagle-Picher through warrant exercise NEC, Toshiba
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Ultra-High Precision AFM with 6-Axis Laser and Piezo Scanner for Traceable Measurements on Semiconductors and Step Standards
Atomic force microscopy (AFM) is used for surface measurements with resolution down to atomic levels - dimensions that are far beyond even the highest resolution optical microscopes. AFM is a noncontact procedure, with forces between a very fine measuring tip and the object surface revealing
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Springer Handbook of Nanotechnology
21.2 Atomic Force Microscope ................................................................
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Springer Handbook of Nanotechnology
22.2 Atomic Force Microscope ................................................................
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Applied Scanning Probe Methods VIII
Towards a Nanoscale View of Microbial Surfaces Using the Atomic Force Microscope .
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Nanotribology and Nanomechanics
One of the most pop- ular instruments in this family is the atomic force microscope (AFM), which was introduced to the scientific community in 1986.
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Nanotribology and Nanomechanics
One of the most popular in- struments in this family is the atomic force microscope (AFM), which was introduced to the scientific community in 1986.
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Springer Handbook of Nanotechnology
11.2 Atomic Force Microscope ...............................................................
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Tip-Based Nanofabrication
1 Nanoscale Scratching with Single and Dual Sources Using Atomic Force Microscopes . . . . . . . . . . . . . . . . . . . . . . .
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Nanotribology and Nanomechanics I
One of the most popular instruments in this family is the atomic force microscope (AFM), which was introduced to the scientific community in 1986.