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Supplier: Bruker Corporation
Description: As atomic force microscopy enters its fourth decade as a primary technique for enabling research of all levels, its high-resolution data has helped researchers across a nearly countless array of disciplines and applications. Bruker has been leading the expansion of atomic
- Computer Interface: Yes
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
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Supplier: Mad City Labs, Inc.
Description: probe microscope using Mad City Labs piezo nanopositioning systems. The MadPLL® package includes a digital phase lock loop (PLL) controller, software, sensor amplifier board, and resonant probe mounting board. MadPLL® includes five (5) each of the vertical, horizontal, Akiyama, and
- Application: Biological / Life Science
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
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Supplier: Mad City Labs, Inc.
Description: MadAFM™ is a new sample scanning atomic force microscope (AFM) designed for ease-of-use and simple installation. The MadAFM™ includes our industry leading closed loop nanopositioners for precision movement of the sample and probe. Mad City Labs has designed and manufactured
- Application: Biological / Life Science
- Computer Interface: Yes
- Grade: Benchtop
- Image Analysis Processing Software: Yes
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Supplier: Oxford Instruments
Description: The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and
- Grade: Benchtop
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
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Supplier: Oxford Instruments
Description: The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The same high resolution, speed and stability are maintained while easily operating in controlled gas or liquid environments, at temperatures from 0-250°C, and in some of
- Grade: Benchtop
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
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Supplier: Oxford Instruments
Description: 's simply the best place to start with AFM! Easily the best research-grade AFM at this low price point High performance-a single scanner scales from atomic resolution to huge 120 µm scans Ease of use and a rugged, reliable design make it great for busy labs Modes and accessories that take you
- Grade: Benchtop
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
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Supplier: Oxford Instruments
Description: The MFP-3D Origin+ features high performance and extensive capabilities at a price competitive with most low-cost AFMs. The MFP-3D Origin+ is an extremely versatile and high performance research AFM ready for almost any field of research. It features the same core performance as the MFP-3D Origin
- Grade: Benchtop
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
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Supplier: Mad City Labs, Inc.
Description: A typical application of the RM21™ microscope is live cell imaging and transmitted light microscopy. A standard option available with the RM21™ is the Köhler illumination tower, which provides a simple yet flexible solution for delivering even illumination to the sample. The
- Application: Biological / Life Science
- Computer Interface: Yes
- Eyepiece Style: Monocular
- Grade: Research
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Supplier: Hitachi High Technologies America, Inc.
Description: Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabilities, and extraordinary performance. The breakthrough hardware option, the self-sensing detector, doesn't require laser and detector alignments and thus can
- Application: Biological / Life Science, Medical / Forensic
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Supplier: Hitachi High Technologies America, Inc.
Description: The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of electromagnetic property measurements operated under high-vacuum conditions. Furthermore, it establishes a benchmark for comprehensive environmental control and is the only tool on the market
- Application: Biological / Life Science, Medical / Forensic
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Supplier: Mad City Labs, Inc.
Description: The RM21™ is a versatile microscope suitable for a variety of advanced microscopy and nanoscopy methods. The RM21™ is available in 4 standard configurations (see tables) to satisfy a wide range of applications and budgets. The tables below compare methods and features for the four
- Application: Biological / Life Science
- Computer Interface: Yes
- Eyepiece Style: Monocular
- Grade: Research
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Supplier: Polytec, Inc.
Description: The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral
- Application: Measuring / Toolmaker, Semiconductor Inspection, Other
- Computer Interface: Yes
- Digital Display: Yes
- Grade: Benchtop, Research
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Supplier: Park Systems, Inc.
Description: nanoscale electrophysiology. Powerful 3-in-1 Nanoscale Research Tool with Modular Platform • True Non-Contact Atomic Force Microscope (AFM) • Ion Conductance Microscope (ICM) • Inverted Optical Microscope Ultimate AFM Resolution by True Non
- Application: Biological / Life Science
- Digital Display: Yes
- Eyepiece Style: Binocular
- Grade: Benchtop
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Supplier: Park Systems, Inc.
Description: Atomic Force Microscopy (AFM) is emerging as an essential tool in many industries. With its ability to accurately measure critical dimensions in the micrometer to nanometer regime, the AFM is becoming an essential tool choice in applications involving surface roughness, trench width,
- Application: Semiconductor Inspection
- Digital Display: Yes
- Grade: Benchtop
- Image Analysis Processing Software: Yes
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Supplier: Park Systems, Inc.
Description: Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120, an exceptional AFM with expanded sample and interactivity flexibility. The XE-120 is the research grade AFM with industry’s only
- Application: Biological / Life Science
- Digital Display: Yes
- Eyepiece Style: Binocular
- Grade: Benchtop, Research
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Supplier: Accuris
Description: Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si (111) Monatomic Steps
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Supplier: Park Systems, Inc.
Description: than 2 nm over entire scan range • Flat and linear XY scan of up to 100 µm x 100 µm with low residual bow • Up to 25 µm Z-scan by high force scanner • Accurate height measurements • Reduced drift rate of less than 0.5 nm/min Ultimate AFM
- Application: Biological / Life Science
- Digital Display: Yes
- Eyepiece Style: Monocular
- Grade: Benchtop, Research
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Supplier: ASTM International
Description: 1.1 This practice covers a measurement procedure to calibrate the z-scale of an atomic force microscope using Si(111) monatomic step height specimens. 1.2 Applications This procedure is applicable either in ambient or vacuum condition when the atomic force
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Supplier: Accuris
Description: Surface chemical analysis - Scanning probe microscopy - Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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Supplier: Accuris
Description: Surface chemical analysis \x97 Scanning probe microscopy \x97 Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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Supplier: ASTM International
Description: 1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and
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Supplier: ASTM International
Description: 1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and
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Supplier: ASTM International
Description: 1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and
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Supplier: Anton Paar
Description: Atomic Force Microscope (AFM) Sinus mode Liquid cell Technical Specifications Force Max. force 500 mN Resolution 0.01 µN Depth Max. depth 200 µm Resolution 0.01 nm
- Mounting: Handheld or Portable
- Test Load: 0.0510 kg
- Vertical Capacity: 0.0200 cm
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Supplier: Anton Paar
Description: . Ultra-high resolution and very low noise floor. Depth resolution: 0.001 nm, noise floor ˜ 0.1 nm Force resolution: 0.01 µN, noise floor ˜ 0.5 µN Perfect positional synchronization with a high-quality optical video microscope and/or an optional Atomic Force
- Mounting: Handheld or Portable
- Test Load: 0.0102 kg
- Vertical Capacity: 0.0100 cm
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Supplier: CSA Group
Description: ISO 11775:2015 describes five of the methods for the determination of normal spring constants for atomic force microscope cantilevers to an accuracy of 5 % to 10 %. Each method is in one of the three categories of dimensional, static experimental, and dynamic experimental
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Supplier: Fischer Technology, Inc.
Description: influences Heatable sample overlays for material testing at increased temperatures Atomic force microscope (AFM): record the three-dimensional surface of your sample and measure additional material parameters such as frictional properties High-precision positioning table
- Hardness Testers: Vickers and Knoop, Other
- Mounting: Fixtured or Permanent
- Test Method: Micro
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Supplier: Fischer Technology, Inc.
Description: ): Heatable sample overlays for tests at raised temperatures Atomic force microscope (AFM): record the three-dimensional surface of your sample and measure additional material parameters such as frictional properties Specimen holders for different samples Sound insulation casing
- Hardness Testers: Vickers and Knoop, Other
- Mounting: Fixtured or Permanent
- Test Load: 5.10E-7 to 0.0510 kg
- Test Method: Micro
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Supplier: Piezosystem Jena, Inc.
Description: : positioning feedback sensor for closed loop control applications: micropositioning laser beam steering scanning systems for atomic force microscopes piezoelectrical pumps fiber positioning laser tuning
- Actuator Configuration: Ring
- Blocked Force: 2000 N
- Capacitance: 2900 to 24000 nF
- Diameter or Height: 9 to 14 mm
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Supplier: ValueTronics International, Inc.
Description: current measurement of devices such as field-effect transistors (FET) and insulated-gate bipolar transistors (IGBT) Detection of tunneling current of scanning tunneling microscopes (STM) Detection of conductive probe current for atomic force microscope (AFM) current
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Supplier: Lake Shore Cryotronics, Inc.
Description: orientation Ultra-high vacuum cryostats and superconducting magnet systems for scanning probe, atomic force, and scanning tunneling microscopes Cryostats that operate from liquid helium temperatures to high temperatures (750 K or higher) Custom vibration-isolated systems
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NANOPOSITIONING: Piezoelectric nanopositioners forge low-cost atomic force microscope
In the nanopositioning industry, prices continue to fall as resolution, linearity, and reliability improve. Engineers can now use standard optical components and off-the-shelf nanopositioners to build a high-quality atomic force microscope.
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Building a Do-it-yourself Atomic Force Microscope
Homemade AFMs are low-cost and high-performance and provide flexibility and customization
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Atomic Force Microscopy Enhances The Nanoscopy Toolkit
ATOMIC FORCE MICROSCOPES ARE IDEAL FOR NANOMECHANICAL CHARACTERIZATION, BRINGING UTILITY TO NANOSCOPY APPLICATIONS AND EXCELLING IN CONDITIONS WHERE LOW LIGHT PRESENTS CHALLENGES OR SAMPLE INTEGRITY IS VITAL.
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Resonant Probe AFM: Uses and Advantages
RESONANT PROBE ATOMIC FORCE MICROSCOPES' UNIQUE CONSTRUCTION AND FUNCTIONALITY ENABLE THEM TO SERVE IN APPLICATIONS DEMANDING SPOT-ON ACCURACY, ADAPTABILITY, AND EXCEPTIONALLY HIGH DEFINITION
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Optical Tweezers with XYZ-Piezo Nanopositioning Stages
Investigations on interactions and forces at the level of individual molecules assist in gaining a great deal of information on chemical and mechanical properties or biological functions. Special techniques have been developed for this purpose, e.g. atomic force microscopes or so-called optical
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9 Points to Check Before Trusting Your Laser Microscope
(3D) image within seconds. SLCM†TMs measurement scale overlaps with optical light microscopy (OLM), scanning electron microscopy (SEM), and atomic force microscopy (AFM). In addition, there are minimal sample preparation requirements, and the microscopes can accommodate samples with a wide range
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EETimes.com | Electronics Industry News for EEs & Engineering Managers
with e-beam, multi-project wafers Veeco purchases IBM's atomic force microscope assets Ikos Systems shows data streaming portal for emulation system Cadabra jumpstarts standard cell libraries on TSMC's 0.18-micron process Isonics sells 18% stake to Eagle-Picher through warrant exercise NEC, Toshiba
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Ultra-High Precision AFM with 6-Axis Laser and Piezo Scanner for Traceable Measurements on Semiconductors and Step Standards
Atomic force microscopy (AFM) is used for surface measurements with resolution down to atomic levels - dimensions that are far beyond even the highest resolution optical microscopes. AFM is a noncontact procedure, with forces between a very fine measuring tip and the object surface revealing
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Springer Handbook of Nanotechnology
21.2 Atomic Force Microscope ................................................................
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Springer Handbook of Nanotechnology
22.2 Atomic Force Microscope ................................................................
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Applied Scanning Probe Methods VIII
Towards a Nanoscale View of Microbial Surfaces Using the Atomic Force Microscope .
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Nanotribology and Nanomechanics
One of the most pop- ular instruments in this family is the atomic force microscope (AFM), which was introduced to the scientific community in 1986.
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Nanotribology and Nanomechanics
One of the most popular in- struments in this family is the atomic force microscope (AFM), which was introduced to the scientific community in 1986.
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Springer Handbook of Nanotechnology
11.2 Atomic Force Microscope ...............................................................
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Tip-Based Nanofabrication
1 Nanoscale Scratching with Single and Dual Sources Using Atomic Force Microscopes . . . . . . . . . . . . . . . . . . . . . . .
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Nanotribology and Nanomechanics I
One of the most popular instruments in this family is the atomic force microscope (AFM), which was introduced to the scientific community in 1986.