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Supplier: Qioptiq
Description: prober stations Compatible with LINOS X95 Rail System and Stages for benchtop mounting. Automated models available Laser-Integrated models available
- Application: Semiconductor Inspection
- Eyepiece Style: Binocular
- Field of View: 0.0340 to 9 mm
- Grade: Benchtop
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Supplier: Qioptiq
Description: most prober stations Compatible with LINOS X95 Rail System and Stages for benchtop mounting Automated models available Laser-Integrated models available
- Application: Semiconductor Inspection
- Eyepiece Style: Binocular
- Field of View: 0.0340 to 9 mm
- Grade: Benchtop
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Supplier: Nikon Metrology
Description: Combined with Nikon's superior CFI60 LU/L optical system and an extraordinary new illumination system, this microscope provides images with greater contrast, high resolving power and darkfield images three times brighter than before. Used independently, or in combination with
- Application: Semiconductor Inspection
- Computer Interface: Yes
- Fine Focus: Yes
- Grade: Benchtop
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Supplier: Nikon Metrology
Description: -of-the-art digital technologies to produce a highly affordable automated measurement system. The iNEXIV VMA-2520's design is optimized for easy use as well as repeatable and accurate measurement of 3D parts. Compact and Lightweight The iNEXIV VMA-2520 is a powerful bench-top
- Applications / Capabilities: Electronics or Semiconductor Inspection
- Image Source: Optical Microscope
- System Type: Turnkey / Complete System
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Supplier: Zygo Corporation
Description: setup and minimize operator variability. Fully-automated measurement sequences and field stitching enable high resolution inspection of large areas. (Requires optional motorized part stage.) Versatility Measures a wide variety of surface materials and
- Mounting Options: Benchtop
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Supplier: Zygo Corporation
Description: ZYGO's Compass™ metrology systems set the benchmark for automated, non-contact 3D surface metrology and process control for discrete micro lenses and molds critical to compact imaging systems such as automotive vision systems and cameras for smart phones and tablets.
- Mounting / Loading: Benchtop
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Supplier: Nikon Metrology
Description: affordable automated measurement system. The iNEXIV VMA-2520's design is optimized for easy use as well as repeatable and accurate measurement of 3D parts. Compact and lightweight The iNEXIV VMA-2520 is a powerful bench-top system designed to use minimum factory floor
- Applications / Capabilities: Electronics or Semiconductor Inspection
- Image Source: Confocal Laser
- System Type: Turnkey / Complete System
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Supplier: Evident Scientific
Description: to optimize inspection results. Easy to Operate To meet the demands of varying inspection routines, the AL120 is recipe driven with ten programmable system configurations including specific cassette types, wafer specifications and transfer speed. Quick push button
- Application: Semiconductor Inspection
- Digital Display: Yes
- Eyepiece Style: Binocular
- Grade: Benchtop
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Supplier: Zaber Technologies, Inc.
Description: automated whole slide imaging Industrial reliability and proven long-term operation in high throughput environments ensure maximum up-time Modules are easily combined and reconfigured to adapt as your needs change Supports Zeiss, Nikon, or Olympus optical systems
- Application: Biological / Life Science, Medical / Forensic, Semiconductor Inspection, Other
- Grade: Student, Benchtop, Research
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Supplier: Hitachi High-Tech America
Description: % inspection much more realistic in a busy production environment. Product Highlights Automated focusing reduces sample loading time Find My Part™ smart recognition automatically sets the complete measurement routine Sample view is presented
- Computer Interface: Yes
- Data Processing Functions: Yes
- Data Storage / Data Logger: Yes
- Detector Type: Other
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Supplier: ValueTronics International, Inc.
Description: basis – saving minutes, hours or even days by quickly revealing the nature of faults so sophisticated trigger modes can be applied to isolate them. Advanced Waveform Analysis The TDS5000B Series includes a complete parametric measurement system for signal characterization. Select
- Bandwidth: 500 MHz
- Number of Input Channels: 4 (# channels)
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Supplier: ValueTronics International, Inc.
Description: quantify device and system performance. Optional applications include power measurement and analysis, jitter and timing analysis, disk drive measurements, USB compliance testing, optical storage analysis, ANSI/ITU telecom pulse compliance, and Ethernet compliance testing. Open
- Bandwidth: 350 MHz
- Number of Input Channels: 2 (# channels)
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Supplier: ValueTronics International, Inc.
Description: quantify device and system performance. Optional applications include power measurement and analysis, jitter and timing analysis, disk drive measurements, USB compliance testing, optical storage analysis, ANSI/ITU telecom pulse compliance, and Ethernet compliance testing. Open
- Bandwidth: 500 MHz
- Number of Input Channels: 2 (# channels)
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Supplier: ValueTronics International, Inc.
Description: quantify device and system performance. Optional applications include power measurement and analysis, jitter and timing analysis, disk drive measurements, USB compliance testing, optical storage analysis, ANSI/ITU telecom pulse compliance, and Ethernet compliance testing. Open
- Bandwidth: 350 MHz
- Number of Input Channels: 4 (# channels)
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Saki Corporation
BF-Comet/BF-Sirius - Benchtop Automated Optical Inspection Systems .
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QP Toolbox: April 2007
YESTech has introduced the B3 benchtop automated optical inspection system for populated printed circuit boards.
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Product News
The B3 benchtop automated optical inspection (AOI) system for populated printed circuit boards, from YESTech .
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Manncorp unveils the new Sherlock-300F benchtop AOI system
Manncorp introduces the new Sherlock-300F, a benchtop automated optical inspection (AOI) system that has a radical new design with advanced features to provide comprehensive defect coverage even on densely populated boards with components as small as 01005s.
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Incorporating boundary scan tools in PXI based ATE systems
Its capabilities can be further extendedby Automated Optical Inspection and a benchtop Flying Probe system .
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Christopher Associates Debuts Revolutionary New AOI Concept
Christopher Associates Inc. introduces the Marantz iSpector Island, a new concept in automatic optical inspection (AOI). Capable of working in âlights outâ environments, the iSpector Island combines the benchtop Marantz iSpector AOI system with full automation .
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New AOI equipment helps throughput and quality to rise together
Remploy Electronics has further enhanced its PCB testing capabilities with the installation of new automated optical inspection (AOI) equipment at its Bolton and Barking factories. The benchtop systems inspect solder joints and verify correct part assembly, enabling quality levels and throughput to be maximised.
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Micro-Epsilon Launch New Multi-Point Measurement Systems for Inspection of Light-Emitting Diodes
The MFA series can be used as a benchtop system for inspection of LEDs or as an online, automated test system. Optional features are available for the MFA series, including different types of optical fibre such as UV …
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JDSU Introduces New Fiber Inspection And Testing Solutions To Help Customers Comply With Quality Standards
Both instruments support the company's Inspect Before You Connect(TM) campaign, which is designed to educate customers about the best practices and industry quality standards for improving the speed and efficiency of handling optical connectors. The new FVA digital benchtop microscope system cuts fiber inspection time in half and provides an objective and repeatable measurement that enables users to ensure standard compliance of their connectors. The JDSU FVA eliminates operator subjectivity with a fully automated inspection system that quickly and consistently focuses …
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JDSU Introduces New Fiber Inspection And Testing Solutions To Help Customers Comply With Quality Standards
Both instruments support the company's Inspect Before You Connect(TM) campaign, which is designed to educate customers about the best practices and industry quality standards for improving the speed and efficiency of handling optical connectors. The new FVA digital benchtop microscope system cuts fiber inspection time in half and provides an objective and repeatable measurement that enables users to ensure standard compliance of their connectors. The JDSU FVA eliminates operator subjectivity with a fully automated inspection system that quickly and consistently focuses …