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Supplier: Qioptiq
Description: The A-Zoom2 10x single-objective zoom optical brightfield microscope delivers continuous 10:1 variable power magnification for microelectronics inspection, R&D imaging, testing and analysis. Originally designed for electronic probing applications, A-Zoom2 features superior optics to
- Total Magnification: 28 to 7,000 X
- Field of View: 0.034 to 9 mm
- Working Distance: 34.00000000000001 to 13 mm
- Grade: Benchtop
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Supplier: Nikon Metrology
Description: Combined with Nikon's superior CFI60 LU/L optical system and an extraordinary new illumination system, this microscope provides images with greater contrast, high resolving power and darkfield images three times brighter than before. Used independently, or in combination with
- Total Magnification: 1 to 150 X
- Grade: Benchtop
- Remote Interface: Computer Interface, Image Analysis Processing Software
- Features: Digital Display, Fine Focus, Mechanical Stage
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Supplier: Marposs Corp
Description: DESCRIPTION Optocloud S is an advanced optical measurement system that combines multiple laser profilometers, a high-precision rotary axis and an optimized optical architecture to perform complete 360° inspection of parts without repositioning. In a single measuring
- Applications: Gauging, Scanning & Dimensioning
- Features: Other Image Source
- System Type: Turnkey / Complete System
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Supplier: Nikon Metrology
Description: produce a highly affordable automated measurement system. The iNEXIV VMA-2520's design is optimized for easy use as well as repeatable and accurate measurement of 3D parts. Compact and Lightweight The iNEXIV VMA-2520 is a powerful bench-top system designed to use minimum factory
- Applications: Electronics or Semiconductor Inspection
- Image Source: Optical Microscope
- System Type: Turnkey / Complete System
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Supplier: Zygo Corporation
Description: The ZeGage™ optical profiler is the ideal non-contact tool for quantitative measurements of 3D form and roughness on precision machined surfaces. The industrial design provides fast, accurate metrology in a compact, cost-effective package that can be located directly on the factory floor
- Features: 3-D Scanning / Profiling, Digitizing / Imaging, Profile Measurement
- Mounting Options: Benchtop
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Supplier: Nikon Metrology
Description: Designed to meet demanding manufacturing requirements with automated measurements of mechanical parts, electronic devices, dies & molds and medical devices. The iNEXIV VMA-2520 is a new multi-sensor measuring system that's lightweight and compact enough to be used in the factory on the
- Image Source: Confocal Laser
- Applications: Electronics or Semiconductor Inspection
- System Type: Turnkey / Complete System
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Supplier: Hitachi High-Tech America
Description: It will find the right measurement locations on your part – even on large substrates – select the correct analysis program and send the results to your quality system. Time and human error are reduced, and you get more analysis done in less time, making 100% inspection much more
- Operating Temperature: 50 to 104 F
- Operating Humidity: 90 %
- Remote Interface: Computer Interface
- General Features: Data Processing Functions, Data Storage / Data Logger, Programmable
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Supplier: Zygo Corporation
Description: ZYGO's Compass™ metrology systems set the benchmark for automated, non-contact 3D surface metrology and process control for discrete micro lenses and molds critical to compact imaging systems such as automotive vision systems and cameras for smart phones and tablets.
- Measurement Capability: 3D / Areal Topography
- Mounting / Loading Options: Benchtop
- Features: Form Measurement, Surface Profilometry
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Supplier: Evident Scientific
Description: integration simple with application specific software. Precision Functionality Enhanced Macro Inspection Macro Inspection - 360 Degree Rotation (Simulation) Macro inspection features a 360-degree self-rotating function for a complete macro inspection of the wafer's top
- Grade: Benchtop
- Eyepiece Style: Binocular
- Microscope Type: Compound
- Features: Digital Display, Mechanical Stage
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Supplier: Zaber Technologies, Inc.
Description: the episcopic and transmitted illuminators, camera and even the tube lens, should you need to switch optical systems. While most microscope companies charge you thousands for software, we provide a system that is fully compatible with µManager open source microscopy software.
- Grade: Benchtop, Research, Student
- Application: Biological / Life Science, Medical / Forensic, Semiconductor Inspection
- Microscope Type: Fluorescent / UV
- Features: Other
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Supplier: ValueTronics International, Inc.
Description: address the need for application specific measurements to quickly quantify device and system performance. Optional applications include power measurement and analysis, jitter and timing analysis, disk drive measurements, USB compliance testing, optical storage analysis, ANSI/ITU
- Bandwidth: 500 MHz
- Number of Input Channels: 4 (# channels)
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Saki Corporation
BF-Comet/BF-Sirius - Benchtop Automated Optical Inspection Systems .
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QP Toolbox: April 2007
YESTech has introduced the B3 benchtop automated optical inspection system for populated printed circuit boards.
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Product News
The B3 benchtop automated optical inspection (AOI) system for populated printed circuit boards, from YESTech .
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Manncorp unveils the new Sherlock-300F benchtop AOI system
Manncorp introduces the new Sherlock-300F, a benchtop automated optical inspection (AOI) system that has a radical new design with advanced features to provide comprehensive defect coverage even on densely populated boards with components as small as 01005s.
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Incorporating boundary scan tools in PXI based ATE systems
Its capabilities can be further extendedby Automated Optical Inspection and a benchtop Flying Probe system .
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Christopher Associates Debuts Revolutionary New AOI Concept
Christopher Associates Inc. introduces the Marantz iSpector Island, a new concept in automatic optical inspection (AOI). Capable of working in âlights outâ environments, the iSpector Island combines the benchtop Marantz iSpector AOI system with full automation .
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New AOI equipment helps throughput and quality to rise together
Remploy Electronics has further enhanced its PCB testing capabilities with the installation of new automated optical inspection (AOI) equipment at its Bolton and Barking factories. The benchtop systems inspect solder joints and verify correct part assembly, enabling quality levels and throughput to be maximised.
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Micro-Epsilon Launch New Multi-Point Measurement Systems for Inspection of Light-Emitting Diodes
The MFA series can be used as a benchtop system for inspection of LEDs or as an online, automated test system. Optional features are available for the MFA series, including different types of optical fibre such as UV …
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JDSU Introduces New Fiber Inspection And Testing Solutions To Help Customers Comply With Quality Standards
Both instruments support the company's Inspect Before You Connect(TM) campaign, which is designed to educate customers about the best practices and industry quality standards for improving the speed and efficiency of handling optical connectors. The new FVA digital benchtop microscope system cuts fiber inspection time in half and provides an objective and repeatable measurement that enables users to ensure standard compliance of their connectors. The JDSU FVA eliminates operator subjectivity with a fully automated inspection system that quickly and consistently focuses …
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JDSU Introduces New Fiber Inspection And Testing Solutions To Help Customers Comply With Quality Standards
Both instruments support the company's Inspect Before You Connect(TM) campaign, which is designed to educate customers about the best practices and industry quality standards for improving the speed and efficiency of handling optical connectors. The new FVA digital benchtop microscope system cuts fiber inspection time in half and provides an objective and repeatable measurement that enables users to ensure standard compliance of their connectors. The JDSU FVA eliminates operator subjectivity with a fully automated inspection system that quickly and consistently focuses …