-
Supplier: Titan Tool Supply, Inc.
Description: measurement of height of terminal steps on Multi-Layer P.C.Boards. Other applications include measurement of depth of minute cracks, engraving depth of printing rolls and plastic molds, depth grooves of phonograph records and computer disks, measurement of the depth of
- Total Magnification: 100 to 400 X
- Resolution: 400 to 600 nm
- Features: Measuring / Toolmaker
- Eyepiece Style: Monocular
-
Supplier: Titan Tool Supply, Inc.
Description: The TM-8 and TM-10 Toolmakers High Magnification Microscopes were designed to bridge the gap between the TM-II (Zoom Objective 30X-160X Magnification) Toolmakers Microscope and the Modular Toolscope Single Objective Measuring and Alignment Microscopes. The TM-8 and TM-10
- Total Magnification: 10 to 400 X
- Grade: Benchtop
- Features: Measuring / Toolmaker, Mechanical Stage
- Eyepiece Style: Monocular
-
Supplier: Titan Tool Supply, Inc.
Description: for castings. Size of print and weave of cloth, etc. Any small production or stamped part which has to be checked in a continuous relationship. Measuring the thickness of castings on wire and wear on the dies proportionately. Measuring depth of small indentations too small to
- Total Magnification: 20 to 100 X
- Grade: Benchtop
- Features: Measuring / Toolmaker, Metallurgical
- Eyepiece Style: Monocular
-
-
Supplier: Titan Tool Supply, Inc.
Description: Fields of application The V-CAD 1 was developed by Dr. Heinrich Schneider Messtechnik to ensure precise and fast measurement of two-dimensional geometries. The V-CAD 1 is ideally suited for measuring profiles made of plastic, aluminium, wood, rubber, rubber-metal or metal, as well as for
- Total Magnification: 0.125 to 1 X
- Grade: Benchtop
- Features: Digital Display, Measuring / Toolmaker
-
Supplier: Edmund Optics Inc.
Description: adjusted with a smooth helical twist ring which features an engraved scale for precise depth measurements. This is ideal for measuring the thickness, height, or depth of subjects up to 11mm with an accuracy of 0.1mm (8mm per rotation). This range can be increased to 22mm by
- Total Magnification: 75 X
- Features: Measuring / Toolmaker
-
Supplier: Edmund Optics Inc.
Description: adjusted with a smooth helical twist ring which features an engraved scale for precise depth measurements. This is ideal for measuring the thickness, height, or depth of subjects up to 11mm with an accuracy of 0.1mm (8mm per rotation). This range can be increased to 22mm by
- Total Magnification: 100 X
- Features: Measuring / Toolmaker
-
Supplier: Edmund Optics Inc.
Description: adjusted with a smooth helical twist ring which features an engraved scale for precise depth measurements. This is ideal for measuring the thickness, height, or depth of subjects up to 11mm with an accuracy of 0.1mm (8mm per rotation). This range can be increased to 22mm by
- Total Magnification: 50 X
- Features: Measuring / Toolmaker
-
Supplier: Edmund Optics Inc.
Description: adjusted with a smooth helical twist ring which features an engraved scale for precise depth measurements. This is ideal for measuring the thickness, height, or depth of subjects up to 11mm with an accuracy of 0.1mm (8mm per rotation). This range can be increased to 22mm by
- Total Magnification: 25 X
- Features: Measuring / Toolmaker
-
Supplier: KEYENCE
Description: Z-axis resolution on almost any material High-resolution, large depth-of-field observation Profile and roughness measurements with zero sample preparation Measures thickness and uniformity of clear layers No data loss - even on steep angles Perform measurements with just a single click
- Total Magnification: 19,200 to 28,000 X
- Resolution: 0.5 to 10 nm
- Grade: Benchtop
- Features: Computer Interface, Digital Display, Measuring / Toolmaker, Mechanical Stage
-
Supplier: Phenom-World BV
Description: fiber samples. Recent developments have enabled us to extend the range of measurements of the Fibermetric application to provide even more in-depth information. It is possible to measure and analyse complicated fiber structures, ranging from spunbond and electrospun fibers to melt-blown fiber
- Particle Size Range: 40 to 0.1 µm
- Technology: Microscopy / Image Analysis
- Measurement Type: Shape, Size
- Features: Specialty / Other
-
Supplier: Park Systems, Inc.
Description: Atomic Force Microscopy (AFM) is emerging as an essential tool in many industries. With its ability to accurately measure critical dimensions in the micrometer to nanometer regime, the AFM is becoming an essential tool choice in applications involving surface roughness, trench width, depth,
- Features: AFM, Digital Display
- Grade: Benchtop
- Remote Interface: Image Analysis Processing Software
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
-
Supplier: Nikon Metrology
Description: The iNEXIV VMA series CNC video measuring system offers the ultimate in usability for automatic measuring of various 3D components with a large FOV, long working distance and wide XYZ stroke. Suitable for large samples (450 x 400 x 200 mm or larger) and simultaneous measurement of
- Applications: Electronics or Semiconductor Inspection
- Image Source: Optical Microscope
- System Type: Turnkey / Complete System
-
Supplier: CSA Group
Description: contrast between the coating and substrate, and - film thicknesses that are larger than the depth of field of the measuring microscope.
-
Supplier: Alliance Calibration
Description: Our certified calibration technicians have decades of experience in calibration CMM's and Optical Comparators. Don't take the risk of using inexperienced technicians on these expensive machines. You can depend on Alliance Calibration to posses the depth of knowledge necessary to calibrate
- Service Capability: Bench (Off-site), Calibration Documentation, Calibration Service, Field / On-site, Installation / Start-up, Online Documentation, Troubleshooting
- Items Serviced: Coordinate Measuring Machines (CMM), Dimensional Gages / Instruments, Hardness Testers, Microscopes / Optical Instruments, Video / Imaging Equipment
- Features: Midwest US Only, North America, Specialty / Other, United States Only
-
Supplier: ASTM International
Description: Apparent depth of microscope focus (the method of the Duc de Chaulnes), Critical Angle Refractometers (Abbe type and Pulfrich type), Metricon system, Vee-block refractometers, Prism spectrometer, and Specular reflectance. 1.1.2 Test methods presented by name only (see Annex A1):
-
Supplier: Shimadzu Scientific Instruments, Inc.
Description: Convenient, Accurate Micro Hardness Measurements Shimadzu’s HMV-G series of Micro Hardness Testers determine hardness by indenting a material and then measuring the size of the resulting indentation. Systems range from standalone models with manual stage movement and indentation reading
- Test: Brinell, Vickers and Knoop
- Mounting: Fixtured or Permanent
- Test Method: Micro
Find Suppliers by Category Top
Conduct Research Top
-
Designing Atmospheric-Pressure Plasma Sources for Surface Engineering of Nanomaterials
nonuniformities. necessary for DEP, as opposed to the electrode. geometry required in traditional DEP [17-19]. Since these. insulating structures typically traverse the entire depth of. the channel, a greater area of the sample channel is affected. by the gradient of the inner product of the electric
-
MSilica Nanoparticles Treated by Cold Atmospheric-Pressure Plasmas Improve the Dielectric Performance of Organic-Inorganic Nanocomposites
with the design. Then the exposed photoresist was removed using Potassium-based. buffered developer AZ 400K (AZ Electronic. Materials, Somerville, NJ, USA). Deep Reactive Ion Etching. (DRIE) was used to etch the silicon master stamp to a depth. of 50 mm. The scalloping effect, which is unfavorable
More Information Top
Indicates content that may require registration and/or purchase.
-
On the study of loop profiles in improving the sweep stiffness of wire bond
The overall length of wire bond is measured by a high-precision non-contact depth measuring microscope , Hisomet DH2, provided by Union Optical Co., Ltd.
-
Advanced Composite Materials
depth measuring microscope , and the surface topography was observed by 3D digit microscope.
-
Design of shrinkage microvalve in microchannel with hydrophilic and hydrophobic walls
The experimental results are recorded by MEIJI EMZ-TR ste- reoscopic microscope, Union DH2/IMH non-contact depth measurement microscope and Nikon Coolpix 4500 CCD camera.
-
A Si stencil mask for deep X-ray lithography fabricated by MEMS technology
The depth measurements of these holes were made with a high-precision non-contact depth measuring microscope .
-
Microfluidic devices for size-dependent separation of liver cells
However, the actual depths obtained with a depth measuring microscope (DH2, Union Optical Co. Ltd., Tokyo, Japan) were 37∼39 μm for Microdevice 1, and ∼29 μm for Microdevice 2.
-
CONTOUR forward imager on the Comet Nucleus Tour mission
After the CCD was assembled to its heatsink at APL, a depth measuring microscope was used determine the distance and tilt from the imaging surface to the shim interface locations.
-
Corning's approach to segment blank manufacturing for an extremely large telescope
Inclusions are inspected using index matching oil on the surface of the boule to make it transparent, a high intensity light to illuminate the glass and a depth measuring microscope to measure the depth and size of inclusions found in the material.
-
Corning: supplier of multiple optical materials for telescope projects
Index matching oil, high intensity light and a depth measuring microscope are used to locate and measure inclusions that are larger than 0.12mm (0.005”).
-
Review of Corning's capabilities for ULE mirror blank manufacturing for an extremely large telescope
Index matching oil, high intensity light and a depth measuring microscope are used to locate and measure inclusions that are larger than 0.12mm (0.005”).
-
Quarterly progress report, Metallurgy Research sub-section, April 1955--June 1955
penetrztion of the uranium into the aluminum i s measured directly with a depth measuring microscope .