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Supplier: Zygo Corporation
Description: material qualification represent broadly-varying wavelength requirements, and all benefit from testing at design wavelength with an infrared interferometer system. ZYGO, long recognized as the world leader in interferometric testing instruments, has designed and built many
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Supplier: Zygo Corporation
Description: ZYGO's Verifire™ HD interferometer system provides fast high-resolution measurements of flat or spherical surfaces, and transmitted wavefront measurement of optical components and assemblies. The interferometric cavity length is precisely modulated while a high-speed camera captures
- Laser Wavelength: 633 nm
- Light Source / Laser Type: HeNe
- Measurement: Profiles / Topography
- Operating Temperature: 59 to 86 F
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Supplier: Fairfield Crystal Technology, LLC.
Description: fluoride, barium fluoride, fused silica, most optical glasses, and IR materials, including zinc selenide and zinc sulfide. To ensure that the polished optic meets or exceeds customer specifications, each element is tested using state-of-the-art Zygo interferometers, hilger-watts
- Surface Flatness: λ/2, λ/4, λ/5, λ/8, λ/10, λ/20
- Surface Quality: 10-5 Scratch / Dig, 20-10 Scratch / Dig, 40-20 Scratch / Dig, 60-40 Scratch / Dig, 80-50 Scratch / Dig
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Supplier: Edmund Optics Inc.
Description: precision ground and polished to the stated accuracies on both surfaces so that either face may be used for test applications. Both surfaces are tested and certified by our Zygo Interferometer. Each flat ships in a durable storage case for permanent protection. 1/20?
- Diameter/Width: 25.4 mm
- Mirror Coatings: Uncoated
- Mirror Materials: Zerodur?
- Surface Flatness: λ/20
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Supplier: Edmund Optics Inc.
Description: precision ground and polished to the stated accuracies on both surfaces so that either face may be used for test applications. Both surfaces are tested and certified by our Zygo Interferometer. Each flat ships in a durable storage case for permanent protection. 1/20?
- Diameter/Width: 102 mm
- Mirror Coatings: Uncoated
- Mirror Materials: Fused Silica
- Surface Flatness: λ/20
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Supplier: Edmund Optics Inc.
Description: precision ground and polished to the stated accuracies on both surfaces so that either face may be used for test applications. Both surfaces are tested and certified by our Zygo Interferometer. Each flat ships in a durable storage case for permanent protection. 1/20?
- Diameter/Width: 25.4 mm
- Mirror Coatings: Uncoated
- Mirror Materials: Fused Silica
- Surface Flatness: λ/20
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Supplier: Edmund Optics Inc.
Description: precision ground and polished to the stated accuracies on both surfaces so that either face may be used for test applications. Both surfaces are tested and certified by our Zygo Interferometer. Each flat ships in a durable storage case for permanent protection. 1/20?
- Diameter/Width: 152 mm
- Mirror Coatings: Uncoated
- Mirror Materials: Fused Silica
- Surface Flatness: λ/20
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Supplier: SPIE - Education
Description: inhomogeneity, and radius of curvature. Testing cylindrical and aspheric surfaces, determining the absolute shape of flats and spheres, and the use of infrared interferometers for testing ground surfaces are also discussed. The course also covers state-of-the-art direct
- Modality: Internet / Online, On-site / In Plant
- Technology / Subject: Design / Engineering Methods (ESDU, DFx, etc.), Instruments / Sensors, Photonics / Optics
- Type: Course
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Supplier: Knight Optical (UK) Ltd
Description: for testing gauge blocks. Optical flats are also used in interferometers and high quality flat optical mirror and window sub-straights for laser applications. This range of Zerodur optical flats are single-sided optical flats and dual faced optical
- Diameter, Square Side, or Rectangular Length: 2 mm
- Optical Flat Materials: Zerodur?
- Thickness: 1 mm
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Supplier: Knight Optical (UK) Ltd
Description: for testing gauge blocks. Optical flats are also used in interferometers and high quality flat optical mirror and window sub-straights for laser applications. This range of Zerodur optical flats are single-sided optical flats and dual faced optical
- Diameter, Square Side, or Rectangular Length: 2 mm
- Optical Flat Materials: Zerodur?
- Thickness: 1 mm
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Supplier: Knight Optical (UK) Ltd
Description: for testing gauge blocks. Optical flats are also used in interferometers and high quality flat optical mirror and window sub-straights for laser applications. This range of Zerodur optical flats are single-sided optical flats and dual faced optical
- Diameter, Square Side, or Rectangular Length: 2 mm
- Optical Flat Materials: Zerodur?
- Thickness: 1 mm
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Supplier: Knight Optical (UK) Ltd
Description: for testing gauge blocks. Optical flats are also used in interferometers and high quality flat optical mirror and window sub-straights for laser applications. This range of Zerodur optical flats are single-sided optical flats and dual faced optical
- Diameter, Square Side, or Rectangular Length: 2 mm
- Optical Flat Materials: Zerodur?
- Thickness: 1 mm
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Supplier: SPIE
Description: A distillation of Dr. Wyant's course at the University of Arizona, this Field Guide covers the key fundamentals of interferometry, types of interferometers and interferograms, concepts of phase-shifting interferometry, long-wavelength interferometry, testing of aspheric surfaces,
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Supplier: Zygo Corporation
Description: local (die-level) flatness, surface roughness, and total thickness variation (TTV), and sub-arcsec tolerances for perpendicularity and parallelism specifications. Our unique glass and ceramic machining equipment, combined with years of experience developing process-oriented techniques, enable
- Application / Industries Served: Optical Components
- Fabrication Process: Machining
- Location: North America, United States Only, Northeast US Only, Southwest US Only
- Materials: Glass Ceramic, Sapphire, Silicate / Fused Silica, Specialty / Other
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Description: . Common applications include measurements of end/length standards, long gage blocks, plug/pin gages, thread gages, and rings/discs. Features & Benefits of the Lab micrometer®: Digital laser interferometer with zero Abbe offset - for maximum resolution
- Anvil / Spindle Type: Standard Type - Flat Anvil
- Display: Digital Display
- Gage Type: External Micrometer, Internal Micrometer, Bore Micrometer, Thread Micrometer
- Gaging Technology: Mechanical, Optical - Laser
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Supplier: Zygo Corporation
Description: local (die-level) flatness, surface roughness, and total thickness variation (TTV), and sub-arcsec tolerances for perpendicularity and parallelism specifications. Our unique glass and ceramic machining equipment, combined with years of experience developing process-oriented techniques, enable
- Additional Operations: Etching / Blasting, Lapping / Polishing, Other
- Application Expertise: Optical / Semiconductor
- Coating Services: Anti-Reflective Coating, Other
- Fabrication Services: Design Assistance, Glass Part Fabrication, Materials Development / R&D, Material Selection, Inspection / Testing
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Supplier: Primatics, Inc.
Description: system, and a full set of accuracy, repeatability, straightness and flatness plots are included with each stage. Additionally, each unit undergoes extensive burn-in and testing. These steps ensure that the stage will deliver optimal performance over a long period of time.
- Base Height: 1.69 inch
- Base Length: 5.31 inch
- Base Width: 5.31 inch
- Carriage Length: 5.31 inch
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Description: • Coating options: uncoated, V-coating or broadband anti-reflection (BBAR) coating • Applications: laser scanners, remote sensing, imaging instruments, fiber lasers, and interferometers Plano-concave Lensis a bulk optical singlet with a flat side and a convex side
- Antireflection Coating: Yes
- Diameter / Length: 25.4 mm
- Focal Length: -150 mm
- Materials: Other
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Supplier: Shanghai Optics
Description: testing personnel, Shanghai Optics is able to provide a full range of inspection reports and CoC( Certificate of Conformance) for full optical characterization such as surface quality, dimensions, centricity, coating transmittance/reflec tance (with SHIMADU UV3600 spectrophotometer), and
- Lens Application: Ultraviolet
- Lens Type: Achromats
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Supplier: Shanghai Optics
Description: special Glass materials including ultraviolet and infrared quartz; or crystals like fluorinated calcium. Shanghai Optics has acquired custom made CGH Cylinder Nulls for most F/#’s and apertures for cylindrical lenses testing. Combined with our Zygo interferometer, Shanghai Optics can
- Lens Application: Ultraviolet
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Supplier: Qioptiq
Description: , velocity, geometrical forms, flatness and many other measurements can be determined by interference and compared to the wavelength of the light source. In turn, an interferometer with known geometrical data can be configured to determine the wavelength of a light source and analyze
- Measurement: Displacement / Position, Flatness, Specialty / Other
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recommended for use with the Verifire HDX interferometer in order to realize full performance capability of the system. Ultraflat Transmission Flats are certified at λ/40 PVr or better, and are manufactured with strict control of PSD signature to minimize mid-spatial frequency content. These high (read more)
Browse Interferometers Datasheets for Zygo Corporation -
installation with options for vibration isolation, vertical orientation, and a beam-path switch to permit multiple simultaneous test setups. Optical Transmission Flats (read more)
Browse Microscope Lenses and Objectives Datasheets for Zygo Corporation -
For more than 50 years, phase-shifting interferometry has been the technology of choice for high-precision surface form metrology instruments. These interferometers provide fast and reliable measurements of surface form error and transmitted wavefront of optical components, systems, and (read more)
Browse Interferometers Datasheets for Zygo Corporation -
specialty, and can be machined into the structures. Nanometer-Level Flatness/Thickness Control, and Sub-Arcsec Geometry Tolerances Our production experts can control global flatness, local (die-level) flatness, and total thickness variation (TTV) down to nanometer level (read more)
Browse Wafer and Thin Film Instrumentation Datasheets for Zygo Corporation
More Information Top
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In situ deformation measurement on the surface of Si wafers
1 p 342 Synborski Ch E 1973 High resolution flatness testing interferometer for 6-inch photoplates SPIE 001.
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Exact measurement of flat surface profiles by object shifts in a phase-conjugate Fizeau interferometer
Subject terms: flatness testing ; interferometers ; phase conjugation.
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Springer Handbook of Lasers and Optics
Applications of Lloyd’s mirror interferometers include flatness tests [16.15], measurement of refractive index and thickness of thin films [16.16], phase imaging in the soft x-ray regime [16.17], and interferometry of bound- ary diffraction waves [16.18].
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High-Resolution 3D Laser Imaging for Inspection, Maintenance, Repair, and Operations
Right) Sapphire window in interferometer for flatness testing , as the laser sensor requires higher quality optical surfaces than standard underwater video cameras.
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Geometrically desensitized interferometry for shape measurement of flat surfaces and 3-D structures
We construct an interferometer for flatness testing of precision-engineered objects such as rigid disk drive platters, pump parts, and fuel injectors.
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OSA | Absolute three-dimensional coordinate measurement by the two-point diffraction interferometry
P. de Groot, "Grating interferometer for flatness testing ," Opt. Lett. 21, 228-230 (1996).
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Adjustable coherence depth in a geometrically desensitized interferometer
Grating Interferometer for flatness testing .
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Coherence scanning in a geometrically desensitized interferometer
2 p de Groot, 'Grating interferometer for flatness testing ," Opt. Lett. i(3) 228-230 (1996).
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Development of a nanometer resolution flatness measurement system for the ceramic surface by using Blue-ray optical pickup
1996) Grating interferometer for flatness testing .
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High diffraction order grating interferometer for pitch measurement
P. J. de Groot, “Grating interferometer for flatness testing ,” Opt. Lett. 21(3), 228–230 (1996).
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