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Supplier: North Star Imaging, Inc.
Description: North Star Imaging partners with nearly all of the manufacturers of Industrial Digital X-ray Detectors to offer you the most effective solution for your X-ray application. Linear Diode Array Detectors (LDA) are avaiable up to 36" in size.
- Digital Imaging / Tomography System: Yes
- Instrument Type: Flaw Detectors
- Technology: Radiographic / X-ray
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Supplier: VJ Technologies, Inc.
Description: VJ Inspection Systems 4000 wheel inspection system images cast aluminum wheels in a single rotation. Operators receive a concise, accurate wheel discontinuity picture allowing optimized process adjustment. The wheel inspection system incorporates next generation linear diode
- Flaw Detection / Inspection Area: Other
- Form Factor: Monitoring System
- Instrument Type: Flaw Detectors
- Programmable / Digital Control Unit: Yes
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Supplier: Marktech Optoelectronics
Description: the 1.0 um to 2.6um range, using InP material as the base substrate. Marktech is currently producing these high reliability wafers in 2", 3" and 4" diameters. Among the applications for these wafers are photo detectors, linear arrays and image sensors. Photo detectors
- Active Area Diameter or Length: 0.1000 mm
- PN, PIN, or Avalanche: PIN Photodiode
- Photodiode Material: Indium Gallium Arsenide
- Photodiode Package / Mounting: Other
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Supplier: Knight Optical (UK) Ltd
Description: Knight Optical's Redshift NIR I high performance mini spectrometer is designed to cover the NIR wavelength range from 0.9-1.7µm. Boasting an InGaAs (indium gallium arsenide) detector with a high quality “Sensors Unlimited” linear photo diode array comprised of 512 pixels
- Spectral Resolution: 3.1 nm
- Wavelength Range: 900 to 1600 nm
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Supplier: Knight Optical (UK) Ltd
Description: Knight Optical's Redshift NIR I high performance mini spectrometer is designed to cover the NIR wavelength range from 0.9-1.7µm. Boasting an InGaAs (indium gallium arsenide) detector with a high quality “Sensors Unlimited” linear photo diode array comprised of 512 pixels
- Spectral Resolution: 3.1 nm
- Wavelength Range: 1530 to 1605 nm
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Supplier: Knight Optical (UK) Ltd
Description: Knight Optical's Redshift NIR I high performance mini spectrometer is designed to cover the NIR wavelength range from 0.9-1.7µm. Boasting an InGaAs (indium gallium arsenide) detector with a high quality “Sensors Unlimited” linear photo diode array comprised of 512 pixels
- Spectral Resolution: 3.1 nm
- Wavelength Range: 1500 to 2200 nm
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Supplier: Knight Optical (UK) Ltd
Description: Knight Optical's Redshift NIR I high performance mini spectrometer is designed to cover the NIR wavelength range from 0.9-1.7µm. Boasting an InGaAs (indium gallium arsenide) detector with a high quality “Sensors Unlimited” linear photo diode array comprised of 512 pixels
- Spectral Resolution: 3.1 nm
- Wavelength Range: 1500 to 2200 nm
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Supplier: ASTM International
Description: a single detector, that is, a photomultiplier tube or a single photodiode. It has not been demonstrated if this method is effective for photo-array instruments such as those using a CCD or a diode array detector. 1.4 This test method is applicable to 10-mm
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Supplier: ASTM International
Description: , that is, a photomultiplier tube or a single photodiode. It has not been demonstrated if this method is effective for photo-array instruments such as those using a CCD or a diode array detector. 1.4 This test method is applicable to 10-mm pathlength cuvette formats and
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Supplier: ASTM International
Description: detector, that is, a photomultiplier tube or a single photodiode. It has not been demonstrated if this method is effective for photo-array instruments such as those using a CCD or a diode array detector. 1.4 This test method is applicable to 10 mm pathlength
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Supplier: Nikon Metrology
Description: -density parts and generate scatter-free CT volumes with micron accuracy. The system is available with a flat panel detector and a proprietary Curved Linear Diode Array (CLDA) detector that optimizes the collection of the X-rays without capturing the undesired
- Form Factor: Other
- Instrument / System Type: Computed Tomographic System
- Programmable / Digital Control Unit: Yes
- X-ray Operating Voltage: 225 to 450 kilovolts
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Supplier: Nikon Metrology
Description: dual detectors Large format 16-bit detector technology Exclusive Curved Linear Diode Array technology Intuitive software interface Advanced 3D visualization and analysis Customizable macros to automate work flow Applications
- Form Factor: Other
- Instrument / System Type: Computed Tomographic System
- Programmable / Digital Control Unit: Yes
- X-ray Operating Voltage: 225 to 450 kilovolts
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Supplier: StellarNet, Inc.
Description: Sensors Unlimited linear photo diode array with 512 pixels (1024 optional) 25µm by 500µm tall to provide maximum sensitivity. The detector has an integrated thermo electric cooler (TEC) maintained at -10 °C, stabilized within +/-0.1 °C. The RED-Wave NIR InGaAs
- Display Type: Video
- Mounting / Environment: Portable, Lab / Benchtop, In-situ / Field
- Wavelength Range: 900 to 1700 nm
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Supplier: ECOPTIK (CHANGCHUN) LTD
Description: to shape a deformed beam with a pair of cylindrical lenses. A pair of positive cylindrical lenses can be used to collimate and round the output of the laser diode. Another possible application is to focus the diverging beam onto the detector array with a single cylindrical lens.
- Center Thickness: 2 to 20 mm
- Lens Application: Visible
- Lens Form: Plano-Convex
- Materials: Sapphire, Other
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Supplier: StellarNet, Inc.
Description: 4� x 6�) for portable, process, and lab applications. The InGaAs detector is a Sensors Unlimited linear photo diode array with 512 pixels (1024 optional) 25μm by 500μm tall to provide maximum sensitivity. The detector has an integrated thermo
- Application Software Included: Yes
- Computer Interface Options: Serial Interface, Parallel Interface
- Data Processing Functions: Yes
- Data Storage / Data Logger: Yes
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Description: air onto a filter followed by analysis using high performance liquid chromatography usually with fluorescence detector (FLD). The use of a diode array detector (DAD) is possible. The combination of both detector types is also possible. Total suspended particulate
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Supplier: Edmund Optics Inc.
Description: incident ray symmetrically, cylindrical lenses act in the same manner but in only one dimension. Typical applications include line generation with laser diodes, focusing a diverging beam onto a linear detector array or using a pair of cylindrical lenses to collimate and
- Center Thickness: 3.5 mm
- Focal Length: 75 mm
- Surface Quality: 40-20 Scratch / Dig
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Supplier: Edmund Optics Inc.
Description: incident ray symmetrically, cylindrical lenses act in the same manner but in only one dimension. Typical applications include line generation with laser diodes, focusing a diverging beam onto a linear detector array or using a pair of cylindrical lenses to collimate and
- Center Thickness: 7 mm
- Focal Length: 25 mm
- Surface Quality: 40-20 Scratch / Dig
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Supplier: Edmund Optics Inc.
Description: incident ray symmetrically, cylindrical lenses act in the same manner but in only one dimension. Typical applications include line generation with laser diodes, focusing a diverging beam onto a linear detector array or using a pair of cylindrical lenses to collimate and
- Center Thickness: 4 mm
- Focal Length: 50 mm
- Length: 12.5 mm
- Materials: BK7 Glass
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Supplier: Edmund Optics Inc.
Description: incident ray symmetrically, cylindrical lenses act in the same manner but in only one dimension. Typical applications include line generation with laser diodes, focusing a diverging beam onto a linear detector array or using a pair of cylindrical lenses to collimate and
- Center Thickness: 3 mm
- Focal Length: 100 mm
- Length: 12.5 mm
- Materials: BK7 Glass
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Supplier: Changchun Sunday Optics Co., Ltd.
Description: doublet lens consisting of a positive low-index (crown) element and a negative high-index (flint) cemented together. The two materials are designed to work together to reduce spherical and chromatic aberrations. The Typical applications include line generation with laser diodes, focusing a
- Antireflection Coating: Yes
- Lens Type: Aspheric Lens
- Materials: Other
- Surface Flatness: λ/4
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Supplier: CSA Group
Description: followed by analysis using high performance liquid chromatography usually with fluorescence detector (FLD). The use of a diode array detector (DAD) is possible. The combination of both detector types is also possible. Total suspended particulate matter is sampled.
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Supplier: ASTM International
Description: -channel plates, neutron sensitive fluoroscopes, neutron sensitive scintillators coupled to optical cameras, digitized radiographic films, and linear diode arrays. 1.2 This guide does not purport to establish what is considered an acceptable image but is intended to only give
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The ALD310702 from Advanced Linear Devices is a monolithic quad P-channel MOSFET array with unrivaled precision in temperature tracking and simplified bias circuitry. The matched pair circuit is designed for the next generation of products requiring extremely low (read more)
Browse Metal-Oxide Semiconductor FET (MOSFET) Datasheets for Advanced Linear Devices, Inc. -
principle whereby collimated laser light is transmitted towards a receiver. The edges of the shadow cast by an object in the beam’s path are accurately measured by the detector array inside the receiver unit. (read more)
Browse Micrometers Datasheets for RIFTEK EUROPE Sp. z.o.o. -
shapes, run-out, etc. Optical micrometers use a “shadow” measurement principle whereby collimated laser light is transmitted towards a receiver. The edges of the shadow cast by an object in the beam’s path are accurately measured by the detector array inside the receiver unit. (read more)
Browse Optical Micrometers and Laser Micrometers Datasheets for RIFTEK EUROPE Sp. z.o.o. -
transmitted towards a receiver. The edges of the shadow cast by an object in the beam’s path are accurately measured by the detector array inside the receiver unit. (read more)
Browse Micrometers Datasheets for RIFTEK EUROPE Sp. z.o.o. -
compensation circuitry, thermocouple power monitors derive their readings directly from the heating effect of RF energy. This simple yet highly effective principle provides a foundation for excellent stability, linearity, flatness, and repeatability. The following sections describe several key (read more)
Browse RF Power Detectors Datasheets for LadyBug Technologies LLC -
Linear regulators. They usually need a bigger voltage difference between input and output to work properly. When we discuss "dropout voltage," this "quick overview of dropout" shows the main benefit of an LDO. It keeps the voltage stable, even with a small voltage difference. This (read more)
Browse General Purpose Diodes Datasheets for ODG (Origin Data Global)
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Photonic Data Recorder Development Update
An unintensified linear diode array detector to replace the OMA will be tested shortly, and a data acquisition system using an IBM PC and menu -driven software is being investigated.
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Multichannel raman scattering: Comparison of an intensified linear diode array and an ICCD detector
A comparison of the Signal to Noise (S/N) ratio was made between an Intensified Linear Diode Array detector (ILDA) and an Intensified Charge Coupled Device (ICCD) applied to single shot pulsed spontaneous Raman spectroscopy with an excimer laser.
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http://www.ndt.net/article/wcndt2008/papers/31.pdf
Linear Diode Arrays detector 8. rotating device .
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Laser diagnostics for research in coal combustion
High energy laser pulses were used to form plasmas on single coal particles, and time—resolved spectra of the optical emission was collected using a linear diode array detector .
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River runoff reconstructions from novel spectral luminescence scanning of massive coral skeletons
Luminescence intensities generated by the SLS tech- nique were also compared to the emission produced using an argon-ion laser-beam as an excitation source and an Ocean-Optics linear diode array detector via an optical fibre at the VU University, Amsterdam.
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Detection of calcified atherosclerotic plaque by laser‐induced plasma emission
linear diode array detector (Princeton Instru- merits .
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OVERVIEWS OF RECENT RESEARCH ON ENERGETIC MATERIALS
Electronic emission and absorption spectra can be measured using a linear diode array detector or, more recently, an imaging spectrograph with a two- dimensional CCD camera.
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Microscopy of Oxidation 2
Speed of acquisition of Raman data may be considerably improved by the use of linear diode array detectors which will collect all the spectral data simultaneously.
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Evaluation Of Spectral Discriminant Functions For Guidance Of Laser Angioplasty
Tissue fluorescence, collected with the same fiberoptic probe, was separated from the excitation beam by a custom beam splitter, dispersed by a spectrograph, and then imaged onto a linear diode array detector .
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Implementations Of Adaptive Associative Optical Computing Elements
Also, by inputting a vector where all elements were ones, and using a linear diode array detector to measure the output vector intensity, the theoreti- cally- expected intensity ratios, .