Products & Services
See also: Categories | Featured Products | Technical Articles | More Information-
Supplier: Mad City Labs, Inc.
Description: MadAFM™ is a new sample scanning atomic force microscope (AFM) designed for ease-of-use and simple installation. The MadAFM™ includes our industry leading closed loop nanopositioners for precision movement of the sample and probe. Mad City Labs has designed and manufactured piezo
- Features: AFM, Mechanical Stage
- Grade: Benchtop
- Application: Biological / Life Science
- Remote Interface: Computer Interface, Image Analysis Processing Software
-
Supplier: Hitachi High Technologies America, Inc.
Description: The AFM5500M is a SPM platform equipped with a fully addressable 4-inch stage, optimized for medium-sized samples. It affords exceptional levels of ease of use, automation, and accuracy, as well as correlation for AFM/SEM investigations. Sample Size Diameter：100 mm (4 inch) Thickness： 20 mm
- Application: Biological / Life Science, Medical / Forensic
-
Supplier: Hitachi High Technologies America, Inc.
Description: affording AFM imaging in air/liquid/vacuum, a broad temperature range (-120 °C to 800 °C), magnetic field or humidity controls, as well as correlated AFM/SEM/ion milling investigations. Sample Size 25mm (diameter) Thickness: 10mm Scan range 20µm×20µm×1.5µm 100µm×100µm×15µm
- Application: Biological / Life Science, Medical / Forensic
-
-
Supplier: Hitachi High Technologies America, Inc.
Description: AFM operation. As a full-featured system in support of high-resolution and multifunctional AFM measurements, the AFM5100N offers a wide variety of advanced modes, including the proprietary sampling intelligent scan (SIS), which delivers previously unattainable results for very
- Application: Biological / Life Science, Medical / Forensic
-
Supplier: Bruker Corporation
Description: As atomic force microscopy enters its fourth decade as a primary technique for enabling research of all levels, its high-resolution data has helped researchers across a nearly countless array of disciplines and applications. Bruker has been leading the expansion of atomic force microscope
- Features: AFM
- Application: Biological / Life Science, Medical / Forensic, Metallurgical
- Remote Interface: Computer Interface
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
-
Supplier: Mad City Labs, Inc.
Description: nanopositioning systems. Unlike conventional optical microscopes, RM21™ microscopes allow direct access to the optical pathway. This access enables users to employ a variety of microscopy methods using the same central instrument. RM21™ microscopes are compatible with 30mm and
- Resolution: 0.4 nm
- Lateral Resolution: 0.4 nm
- Features: AFM, Mechanical Stage, Monocular
- Application: Biological / Life Science
-
Supplier: Mad City Labs, Inc.
Description: A typical application of the RM21™ microscope is live cell imaging and transmitted light microscopy. A standard option available with the RM21™ is the Köhler illumination tower, which provides a simple yet flexible solution for delivering even illumination to the sample. The Köhler
- Total Magnification: 40 to 100 X
- Application: Biological / Life Science
- Remote Interface: Computer Interface, Image Analysis Processing Software
- Features: Mechanical Stage, Monocular
-
Supplier: CIQTEK Co., Ltd
Description: CIQTEK Scanning NV Microscope Diamond III/IV is a scanning NV magnetometer based on the diamond nitrogen-vacancy center (NV center) and AFM scanning magnetic imaging technology. The sample's magnetic properties are obtained quantitatively and non-destructively by quantum control and
- Application: Biological / Life Science, Semiconductor Inspection
- Remote Interface: Computer Interface, Image Analysis Processing Software
- Features: Digital Display, Mechanical Stage, Other
- Grade: Research
-
Supplier: Mad City Labs, Inc.
Description: The SPM-M Kit combines the MadPLL® instrument package with Mad City Labs high resolution piezo nanpositioning systems to form a high performance, closed loop, scanning Akiyama probe or tuning fork AFM. The seamless integration of hardware combined with the built-in automated control of
- Features: AFM
- Application: Biological / Life Science
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
-
Supplier: Polytec, Inc.
Description: The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral
- Resolution: 1,000 nm
- Lateral Resolution: 1,000 nm
- Grade: Benchtop, Research
- Remote Interface: Computer Interface, Image Analysis Processing Software
-
Supplier: Park Systems, Inc.
Description: nanoscale electrophysiology. Powerful 3-in-1 Nanoscale Research Tool with Modular Platform • True Non-Contact Atomic Force Microscope (AFM) • Ion Conductance Microscope (ICM) • Inverted Optical Microscope Ultimate AFM Resolution by True Non-Contact Mode • 10 times
- Field of View: 0.10000000000000002 mm
- Features: AFM, Digital Display
- Grade: Benchtop
- Eyepiece Style: Binocular
-
Supplier: Park Systems, Inc.
Description: high-performance Z-servo scanner of the XE-NSOM supports True Non-Contact AFM and utilizes cantilever-based closed-loop feedback technology. • Seamless integration of AFM and optical measurements • Optical head design allows wide angle access to samples • Versatile platform supports
- Resolution: 1 nm
- Field of View: 0.10000000000000002 mm
- Lateral Resolution: 1 nm
- Features: AFM, Digital Display, Monocular
-
Supplier: Park Systems, Inc.
Description: Atomic Force Microscopy (AFM) is emerging as an essential tool in many industries. With its ability to accurately measure critical dimensions in the micrometer to nanometer regime, the AFM is becoming an essential tool choice in applications involving surface roughness, trench width,
- Features: AFM, Digital Display
- Grade: Benchtop
- Remote Interface: Image Analysis Processing Software
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
-
Supplier: ASTM International
Description: 1.1 This practice covers a measurement procedure to calibrate the z-scale of an atomic force microscope using Si(111) monatomic step height specimens. 1.2 Applications This procedure is applicable either in ambient or vacuum condition when the atomic force microscope (AFM) is
-
Supplier: Park Systems, Inc.
Description: Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120, an exceptional AFM with expanded sample and interactivity flexibility. The XE-120 is the research grade AFM with
- Field of View: 0.10000000000000002 mm
- Features: AFM, Digital Display
- Grade: Benchtop, Research
- Eyepiece Style: Binocular
-
Supplier: MTI Instruments Inc.
Description: Specifically designed to fit under AFMs, these MicroTensile Testers provide high resolution tensile, compression, fatigue and bend testing of up to 450N (100 lbs.). Used in-situ or stand-alone, it weighs only about 750 grams, these MicroStage testers are also ideal for use on air tables.
- Stage Type: Motorized Stage
-
Supplier: Anton Paar
Description: 0.01 μN, noise floor ≈ 0.5 µN Perfect positional synchronization with a high-quality optical video microscope and/or an optional Atomic Force Microscope (AFM). The combination of the Ultra Nanoindentation Tester head, the optical microscope and the AFM objective
- Force / Load Capacity: 0.02248 lbs
- Stroke / Travel: 0.00393701 inch
- Features: Specialty / Other
-
Supplier: ASTM International
Description: 1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and surface
-
Supplier: ASTM International
Description: 1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and surface
-
Supplier: ValueTronics International, Inc.
Description: tunneling current of scanning tunneling microscopes (STM) Detection of conductive probe current for atomic force microscope (AFM) current measurement As a preamplifier for a lock-in amplifier The CA5350 programmable current amplifier is a variable gain type, current-input,
-
Supplier: Fischer Technology, Inc.
Description: streams from air conditioning units Active damping table to reduce vibration influences Heatable sample overlays for material testing at increased temperatures Atomic force microscope (AFM): record the three-dimensional surface of your sample and measure additional material parameters
- Mounting: Fixtured or Permanent
- Test Method: Micro
- Features: Other
- Test: Vickers and Knoop
Find Suppliers by Category Top
Featured Products Top
-
Specially-designed lens option for high-resolution imaging of small light source and display features The Radiant Vision Systems Microscope Lens enables high-resolution imaging of extremely small components and features, such as individual LEDs, display pixels, and (read more)
Browse Datasheets for Radiant Vision Systems -
A new publication in Ultramicroscopy details a breakthrough in magnetic field-free TEM/STEM imaging—featuring the first wide-gap pole piece developed for the JEOL MARS.
(read more)
Authored by Tatsuhiro Maekawa of JEOL Ltd. and Prof. Arakawa of Shimane University, this study introduces an innovative image-forming system that enables conventional TEM imaging (bright/dark field) without mag...
Browse Electron Microscopes Datasheets for JEOL USA, Inc. -
EOL is a world leader in the development and manufacture of leading edge, high performance, high stability Transmission Electron Microscopes (TEM). JEOL introduced its first TEM over 70 years ago and has been developing and producing TEMs (read more)
Browse Electron Microscopes Datasheets for JEOL USA, Inc. -
Transmission Electron Microscopes (TEM) of 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. We developed the JEM-120i with the concept of "Compact", "Easy To Use", and "Expandable". With the new external appearance, this instrument has evolved into (read more)
Browse Electron Microscopes Datasheets for JEOL USA, Inc. -
manufactured by Linkam Scientific Instruments* and an optical microscope manufactured by Nikon Corporation*. The stage coordinates of each instrument can be linked, so the orientation and position of the specimen can always be identified during specimen transfer between instruments. (read more)
Browse Electron Microscopes Datasheets for JEOL USA, Inc. -
What Does it Mean to Be a Medical Device Contract Manufacturing Company?
(read more)
Browse Datasheets for Protomatic, Inc. -
The P-616.65S 6-axis scanning and alignment stage provides great value in photonics and micro-optics alignment, featuring a wear-free flexure guiding system and a controller that enables the user to take advantage of its virtual pivot point.
(read more)
Browse Microscope Stages Datasheets for PI (Physik Instrumente) L.P. -
Microscope objectives are designed to magnify an object by a specific factor, ranging from 4x (a scanning objective) to 40x (a high-power objective), and even up to 100x for an oil immersion lens. To maximize flexibility, microscopes are often equipped with up to four objectives mounted on a (read more)
Browse Microscope Lenses and Objectives Datasheets for Avantier Inc. -
High-Precision Relay Lenses: Engineered to transmit image and pupil planes with superior resolution and minimal distortion. Designed for long, stable optical paths, these lenses preserve magnification and image integrity, making them ideal for microscopy, endoscopy, machine vision, laser scanning, and metrology.
(read more)
Browse Microscope Lenses and Objectives Datasheets for Avantier Inc. -
Transmittance Testing for High-Performance Lenses Case Study: High-NA Microscope Objective Design for Optical (read more)
Browse Microscope Lenses and Objectives Datasheets for Avantier Inc.
Conduct Research Top
-
Ultra-High Precision AFM with 6-Axis Laser and Piezo Scanner for Traceable Measurements on Semiconductors and Step Standards
Atomic force microscopy (AFM) is used for surface measurements with resolution down to atomic levels - dimensions that are far beyond even the highest resolution optical microscopes. AFM is a noncontact procedure, with forces between a very fine measuring tip and the object surface revealing
-
Resonant Probe AFM: Uses and Advantages
RESONANT PROBE ATOMIC FORCE MICROSCOPES' UNIQUE CONSTRUCTION AND FUNCTIONALITY ENABLE THEM TO SERVE IN APPLICATIONS DEMANDING SPOT-ON ACCURACY, ADAPTABILITY, AND EXCEPTIONALLY HIGH DEFINITION
-
9 Points to Check Before Trusting Your Laser Microscope
(3D) image within seconds. SLCM†TMs measurement scale overlaps with optical light microscopy (OLM), scanning electron microscopy (SEM), and atomic force microscopy (AFM). In addition, there are minimal sample preparation requirements, and the microscopes can accommodate samples with a wide range
-
Building a Do-it-yourself Atomic Force Microscope
Homemade AFMs are low-cost and high-performance and provide flexibility and customization
-
Piezo Motors: Principle of Operation for Engineers
and detection of sound, generation of high voltages, electronic frequency generation, microbalances, and ultra fine focusing of optical assemblies. It is also the basis of a number of scientific instrumental techniques with atomic resolution, such as scanning probe microscopes (STM, AFM, etc
More Information Top
Indicates content that may require registration and/or purchase.
-
Springer Handbook of Nanotechnology
atomic force microscope AFM .
-
Nanotribology and Nanomechanics
One of the most pop- ular instruments in this family is the atomic force microscope ( AFM ), which was introduced to the scientific community in 1986.
-
Nanotribology and Nanomechanics
One of the most popular in- struments in this family is the atomic force microscope ( AFM ), which was introduced to the scientific community in 1986.
-
Encyclopedia of Nanotechnology
Atomic Force Microscopy, Fig. 1 Schematics (a) of a commercial small sample atomic force microscope/ friction force microscope ( AFM /FFM) and (b) of a large sample AFM/FFM .
-
Applied Scanning Probe Methods VIII
Comparison of the scanning electron microscope (SEM), the scanning ion microscope (SIM), and the atomic force microscope ( AFM .
-
Springer Handbook of Nanotechnology
The top panel shows SEM, atomic force microscope ( AFM ) and MFM micro- graphs at the different stages of the process.
-
Atomic Force Microscopy
The advent of scanning probe microscopes and especially of the atomic force microscope ( AFM ; ref. 1) has opened new perspectives in the investigation of biomedical specimens and induces to look again with rejuvenated excitement at what we can learn by “looking” at …
-
Springer Handbook of Nanotechnology
Based on their design of the STM, in 1985, Binnig et al. developed an Atomic Force Microscope ( AFM ) to measure ul- trasmall forces (less than 1 µN) present between the AFM tip surface and the sample surface [11.2] (also see [11 …
-
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
In this chapter, the configuration of LASPAN system which integrates a continuous wave (CW) laser into an atomic force microscope ( AFM ) is firstly shown.
-
Atomic Force Microscopy Based Nanorobotics
Starting in 1995, there has been a significant thrust in atomic force microscope ( AFM ) based nanorobotic nanomanipulation, and majority of the nanomanipula- tion studies since then has been using AFM based nanorobotic systems.