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Supplier: Mad City Labs, Inc.
Description: MadAFM™ is a new sample scanning atomic force microscope (AFM) designed for ease-of-use and simple installation. The MadAFM™ includes our industry leading closed loop nanopositioners for precision movement of the sample and probe. Mad City Labs has designed and
- Application: Biological / Life Science
- Scanning Probe Microscope Type: AFM
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Supplier: Hitachi High Technologies America, Inc.
Description: The AFM5500M is a SPM platform equipped with a fully addressable 4-inch stage, optimized for medium-sized samples. It affords exceptional levels of ease of use, automation, and accuracy, as well as correlation for AFM/SEM investigations. Sample Size
- Application: Biological / Life Science, Medical / Forensic
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Supplier: Hitachi High Technologies America, Inc.
Description: Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabilities, and extraordinary performance. The breakthrough hardware option, the self-sensing detector, doesn't require laser and detector alignments and thus can
- Application: Biological / Life Science, Medical / Forensic
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Supplier: Bruker Corporation
Description: As atomic force microscopy enters its fourth decade as a primary technique for enabling research of all levels, its high-resolution data has helped researchers across a nearly countless array of disciplines and applications. Bruker has been leading the expansion of atomic force microscope
- Application: Biological / Life Science, Medical / Forensic, Metallurgical
- Computer Interface: Yes
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
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Supplier: Hitachi High Technologies America, Inc.
Description: The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of electromagnetic property measurements operated under high-vacuum conditions. Furthermore, it establishes a benchmark for comprehensive environmental control and is the only tool on the
- Application: Biological / Life Science, Medical / Forensic
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Supplier: Mad City Labs, Inc.
Description: A typical application of the RM21™ microscope is live cell imaging and transmitted light microscopy. A standard option available with the RM21™ is the Köhler illumination tower, which provides a simple yet flexible solution for delivering even illumination to the sample. The
- Application: Biological / Life Science
- Computer Interface: Yes
- Eyepiece Style: Monocular
- Grade: Research
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Supplier: Mad City Labs, Inc.
Description: our sales engineers to fully explore the possibilities of the RM21™ microscopes. Applications Fluorescence Microscopy Single Molecule Imaging Super Resolution Microscopy AFM/SPM Optical and Magnetic Tweezers
- Application: Biological / Life Science
- Lateral Resolution: 0.4000 nm
- Scanning Probe Microscope Type: AFM
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Supplier: Polytec, Inc.
Description: The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral
- Application: Measuring / Toolmaker, Semiconductor Inspection, Other
- Computer Interface: Yes
- Digital Display: Yes
- Grade: Benchtop, Research
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Supplier: CIQTEK Co., Ltd
Description: CIQTEK Scanning NV Microscope Diamond III/IV is a scanning NV magnetometer based on the diamond nitrogen-vacancy center (NV center) and AFM scanning magnetic imaging technology. The sample's magnetic properties are obtained quantitatively and non-destructively by quantum control and
- Application: Biological / Life Science, Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Grade: Research
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Supplier: Mad City Labs, Inc.
Description: The MCL-NSOM is a fully operational near field scanning optical microscope. It has been built on Mad City Labs versatile RM21™ inverted optical microscope which allows users to convert between NSOM, SPM, and fluorescence optical microscopy techniques. The MCL-NSOM builds on our
- Application: Biological / Life Science
- Computer Interface: Yes
- Eyepiece Style: Monocular
- Grade: Research
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Supplier: Oxford Instruments
Description: The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete
- Application: Biological / Life Science
- Scanning Probe Microscope Type: AFM, C-AFM, PFM
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Supplier: Oxford Instruments
Description: some of the harshest chemical environments. The Cypher ES is the ultimate AFM for the most demanding experimental requirements. Routinely achieve higher resolution than other AFMs Fast scanning with results in seconds instead of minutes Every step of operation is simpler for remarkable
- Application: Biological / Life Science
- Scanning Probe Microscope Type: AFM, C-AFM, PFM
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Supplier: Oxford Instruments
Description: The Asylum Research MFP-3D-BIO sets the standard for integrating AFM and optical microscopy for bioscience research. It is the only bio-AFM that makes no compromises to AFM imaging resolution, force measurement performance, or application versatility while seamlessly integrating
- Application: Biological / Life Science
- Scanning Probe Microscope Type: AFM, C-AFM, PFM
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Supplier: Oxford Instruments
Description: The Cypher VRS AFM is the first and only full-featured video-rate AFM. Finally, researchers can measure nanoscale dynamic processes at video-rate speeds with all of the resolution, versatility, and ease of use that are the hallmarks of an Asylum Research Cypher AFM. High
- Application: Biological / Life Science
- Scanning Probe Microscope Type: AFM, C-AFM, PFM
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Supplier: Park Systems, Inc.
Description: XE-Bio is a powerful 3-in-1 nanoscience research tool that uniquely combines industry’s only True Non-Contact AFM with Ion Conductance Microscopy (ICM) and inverted optical microscope on the same platform. The modular design of the XE-Bio allows easy exchange between non-contact
- Application: Biological / Life Science
- Digital Display: Yes
- Eyepiece Style: Binocular
- Grade: Benchtop
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Supplier: Park Systems, Inc.
Description: The XE-NSOM is specially designed and tailored for advanced optical measurements including Near-field Scanning Optical Microscopy (NSOM), Raman Spectrometry, and Confocal Microscopy. The XE-NSOM provides a complete AFM system setup with unsurpassed versatility for these optical experiments.
- Application: Biological / Life Science
- Digital Display: Yes
- Eyepiece Style: Monocular
- Grade: Benchtop
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Supplier: Park Systems, Inc.
Description: Atomic Force Microscopy (AFM) is emerging as an essential tool in many industries. With its ability to accurately measure critical dimensions in the micrometer to nanometer regime, the AFM is becoming an essential tool choice in applications involving surface roughness, trench width,
- Application: Semiconductor Inspection
- Digital Display: Yes
- Grade: Benchtop
- Image Analysis Processing Software: Yes
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Supplier: Park Systems, Inc.
Description: Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120, an exceptional AFM with expanded sample and interactivity flexibility. The XE-120 is the research grade AFM with
- Application: Biological / Life Science
- Digital Display: Yes
- Eyepiece Style: Binocular
- Grade: Benchtop, Research
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Supplier: MTI Instruments Inc.
Description: Specifically designed to fit under AFMs, these MicroTensile Testers provide high resolution tensile, compression, fatigue and bend testing of up to 450N (100 lbs.). Used in-situ or stand-alone, it weighs only about 750 grams, these MicroStage testers are also ideal for use on air tables
- Type: Motorized Stage
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Supplier: ASTM International
Description: 1.1 This practice covers a measurement procedure to calibrate the z-scale of an atomic force microscope using Si(111) monatomic step height specimens. 1.2 Applications This procedure is applicable either in ambient or vacuum condition when the atomic force microscope (AFM) is
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Supplier: Anton Paar
Description: Atomic Force Microscope (AFM) Sinus mode Liquid cell Technical Specifications Force Max. force 500 mN Resolution 0.01 µN Depth Max. depth 200 µm Resolution 0.01 nm
- Mounting: Handheld or Portable
- Test Load: 0.0510 kg
- Vertical Capacity: 0.0200 cm
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Supplier: Anton Paar
Description: Microscope (AFM). The combination of the Ultra Nanoindentation Tester head, the optical microscope and the AFM objective provides great flexibility and ease-of-use, as well as accurate three-dimensional imaging at the nanometer scale. Compliant to ISO 14577 and ASTM E2546
- Mounting: Handheld or Portable
- Test Load: 0.0102 kg
- Vertical Capacity: 0.0100 cm
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Supplier: ASTM International
Description: 1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and surface
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Supplier: ASTM International
Description: 1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and surface
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Supplier: ASTM International
Description: 1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and surface
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Supplier: Fischer Technology, Inc.
Description: influences Heatable sample overlays for material testing at increased temperatures Atomic force microscope (AFM): record the three-dimensional surface of your sample and measure additional material parameters such as frictional properties High-precision positioning table
- Hardness Testers: Vickers and Knoop, Other
- Mounting: Fixtured or Permanent
- Test Method: Micro
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Supplier: ValueTronics International, Inc.
Description: current measurement of devices such as field-effect transistors (FET) and insulated-gate bipolar transistors (IGBT) Detection of tunneling current of scanning tunneling microscopes (STM) Detection of conductive probe current for atomic force microscope (AFM) current measurement
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Supplier: Fischer Technology, Inc.
Description: ): Heatable sample overlays for tests at raised temperatures Atomic force microscope (AFM): record the three-dimensional surface of your sample and measure additional material parameters such as frictional properties Specimen holders for different samples Sound insulation casing to
- Hardness Testers: Vickers and Knoop, Other
- Mounting: Fixtured or Permanent
- Test Load: 5.10E-7 to 0.0510 kg
- Test Method: Micro
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Featured Products Top
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Specially-designed lens option for high-resolution imaging of small light source and display features The Radiant Vision Systems Microscope Lens enables high-resolution imaging of extremely small components and features, such as individual LEDs, display pixels, and (read more)
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A new publication in Ultramicroscopy details a breakthrough in magnetic field-free TEM/STEM imaging—featuring the first wide-gap pole piece developed for the JEOL MARS.
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Authored by Tatsuhiro Maekawa of JEOL Ltd. and Prof. Arakawa of Shimane University, this study introduces an innovative image-forming system that enables conventional TEM imaging (bright/dark field) without mag...
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EOL is a world leader in the development and manufacture of leading edge, high performance, high stability Transmission Electron Microscopes (TEM). JEOL introduced its first TEM over 70 years ago and has been developing and producing TEMs (read more)
Browse Electron Microscopes Datasheets for JEOL USA, Inc. -
Transmission Electron Microscopes (TEM) of 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. We developed the JEM-120i with the concept of "Compact", "Easy To Use", and "Expandable". With the new external appearance, this instrument has evolved into (read more)
Browse Electron Microscopes Datasheets for JEOL USA, Inc. -
manufactured by Linkam Scientific Instruments* and an optical microscope manufactured by Nikon Corporation*. The stage coordinates of each instrument can be linked, so the orientation and position of the specimen can always be identified during specimen transfer between instruments. (read more)
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Middlefield, CT – A global leader in the design and manufacture of advanced optical metrology systems — Zygo Corporation — has announced their latest Mx software package release. This is a new software package release for all eligible Zygo systems.
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There is a given when it comes to telescope lenses for use on earth or in space. The bigger the better! A bigger diameter implies greater optical resolution and light gathering power.
But making bigger and bigger mirrors and windows comes with some considerations for those wishing to deploy them, and for the companies charged with their fabrication.
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The P-616.65S 6-axis scanning and alignment stage provides great value in photonics and micro-optics alignment, featuring a wear-free flexure guiding system and a controller that enables the user to take advantage of its virtual pivot point.
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High-Precision Relay Lenses: Engineered to transmit image and pupil planes with superior resolution and minimal distortion. Designed for long, stable optical paths, these lenses preserve magnification and image integrity, making them ideal for microscopy, endoscopy, machine vision, laser scanning, and metrology.
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Ultra-High Precision AFM with 6-Axis Laser and Piezo Scanner for Traceable Measurements on Semiconductors and Step Standards
Atomic force microscopy (AFM) is used for surface measurements with resolution down to atomic levels - dimensions that are far beyond even the highest resolution optical microscopes. AFM is a noncontact procedure, with forces between a very fine measuring tip and the object surface revealing
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Resonant Probe AFM: Uses and Advantages
RESONANT PROBE ATOMIC FORCE MICROSCOPES' UNIQUE CONSTRUCTION AND FUNCTIONALITY ENABLE THEM TO SERVE IN APPLICATIONS DEMANDING SPOT-ON ACCURACY, ADAPTABILITY, AND EXCEPTIONALLY HIGH DEFINITION
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9 Points to Check Before Trusting Your Laser Microscope
(3D) image within seconds. SLCM†TMs measurement scale overlaps with optical light microscopy (OLM), scanning electron microscopy (SEM), and atomic force microscopy (AFM). In addition, there are minimal sample preparation requirements, and the microscopes can accommodate samples with a wide range
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Building a Do-it-yourself Atomic Force Microscope
Homemade AFMs are low-cost and high-performance and provide flexibility and customization
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Piezo Motors: Principle of Operation for Engineers
and detection of sound, generation of high voltages, electronic frequency generation, microbalances, and ultra fine focusing of optical assemblies. It is also the basis of a number of scientific instrumental techniques with atomic resolution, such as scanning probe microscopes (STM, AFM, etc
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Springer Handbook of Nanotechnology
atomic force microscope AFM .
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Nanotribology and Nanomechanics
One of the most pop- ular instruments in this family is the atomic force microscope ( AFM ), which was introduced to the scientific community in 1986.
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Nanotribology and Nanomechanics
One of the most popular in- struments in this family is the atomic force microscope ( AFM ), which was introduced to the scientific community in 1986.
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Encyclopedia of Nanotechnology
Atomic Force Microscopy, Fig. 1 Schematics (a) of a commercial small sample atomic force microscope/ friction force microscope ( AFM /FFM) and (b) of a large sample AFM/FFM .
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Applied Scanning Probe Methods VIII
Comparison of the scanning electron microscope (SEM), the scanning ion microscope (SIM), and the atomic force microscope ( AFM .
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Springer Handbook of Nanotechnology
The top panel shows SEM, atomic force microscope ( AFM ) and MFM micro- graphs at the different stages of the process.
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Atomic Force Microscopy
The advent of scanning probe microscopes and especially of the atomic force microscope ( AFM ; ref. 1) has opened new perspectives in the investigation of biomedical specimens and induces to look again with rejuvenated excitement at what we can learn by “looking” at …
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Springer Handbook of Nanotechnology
Based on their design of the STM, in 1985, Binnig et al. developed an Atomic Force Microscope ( AFM ) to measure ul- trasmall forces (less than 1 µN) present between the AFM tip surface and the sample surface [11.2] (also see [11 …
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Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
In this chapter, the configuration of LASPAN system which integrates a continuous wave (CW) laser into an atomic force microscope ( AFM ) is firstly shown.
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Atomic Force Microscopy Based Nanorobotics
Starting in 1995, there has been a significant thrust in atomic force microscope ( AFM ) based nanorobotic nanomanipulation, and majority of the nanomanipula- tion studies since then has been using AFM based nanorobotic systems.