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Supplier: Accuris
Description: Non-destructive testing of thermally sprayed coatings - Roughness measurement
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Supplier: SAE International
Description: This SAE Recommended Practice describes a method for measuring Roughness Average (R a ) and Peak Count (PC) of the surface of cold-rolled steel sheet.
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Supplier: ASTM International
Description: 1.1 This practice covers the mathematical processing of longitudinal profile measurements to produce a road roughness statistic called the International Roughness Index (IRI). 1.2 The intent is to provide a standard practice for computing and reporting an estimate of road
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Supplier: ASTM International
Description: 1.1 This test method covers the determination of vehicular response to traveled surface roughness. 1.2 This test method utilizes an apparatus that measures the relative motion of a sprung mass system in response to traveled surface roughness where the mass is supported by automotive
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Supplier: Mahr Inc.
Description: "sMAHRtSurf" - Simple, smart and mobile Compact roughness measuring instrument for mobile use Simple and intuitive to use: As easy to use as a smart phone Large, illuminated 4.3" TFT touch display Adjustable display Start button also serves as the Home button for direct access to the start
- Vertical (Z) Range: 0.003543309 to 0.013779535 inch
- Vertical (Z) Resolution: 0.0000003149608 inch
- Traverse Length: 0.0393701 to 0.6299216 inch
- Technology: Contact / Stylus Based
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Supplier: ASTM International
Description: 1.1 This practice covers the mathematical processing of longitudinal profile measurements to produce a wheelchair pathway roughness statistic called the Wheelchair Pathway Roughness Index (WPRI). 1.2 This provides a standard practice for computing and reporting an estimate of
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Supplier: ASTM International
Description: Rmax, and Pc. 1.2 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only. 1.3 In general, this method should be limited to the measurement of surface roughness where Rmax is in the range 10 to 150 m (0.4 to 6 mil) and
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Supplier: KEYENCE
Description: minimal light distortion, accurate 3D measurements can be made over the entire area. Accurate Measurements Even by New Users Some users may have issues with measurement locations or data varying between different users, particularly if there are multiple measurements
- Total Magnification: 12 to 50 X
- Field of View: 1.4000000000000001 to 24 mm
- Working Distance: 75.00000000000001 mm
- Grade: Benchtop
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Supplier: SAE International
Description: This SAE Recommended Practice describes a method for measuring Roughness Average (R a ) and Peak Count (PC) and other variables of the surface of metallic coated and uncoated steel sheet/strip.
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Supplier: Bruker Corporation
Description: The world's first CMM that can provide surface roughness, shape, and size data ” all with one measurement technique. Bruker™s Contour CMM system is specifically designed to measure the small features found in the increasing number of applications that require both precise dimensional
- Application: Angularity / Orientation, Depth Mapping, Dimensional Measurement, Profile Measurement
- Features: Coordinate Measuring Machine (CMM)
- Mounting Options: Free Standing
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: savings: parts are automatically measured in one setting New, highly precise air bearings for extremely reliable results Contour measurements with large deflection range of ±26 mm at resolution of 1.24 nanometers Roughness measurements with large deflection range of ±2 mm at
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
- Technology: Contact / Stylus Based
- Mounting / Loading Options: Floor / Free Standing
- Features: Other, Specialty / Custom
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Supplier: MTI Instruments Inc.
Description: The Proforma 300SA is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials. Based on MTII’s exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning for thickness, thickness variation, bow,
- Maximum Wafer / Part Size: 300.00000000000006 mm
- Measurements: Area Mapping, Roughness / Waviness, Shape / Flatness, Thickness - Wafer / Disc (TTV)
- Technology: Capacitance / EM Gage
- Mounting / Loading: Manual Loading
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Supplier: Marposs Corp
Description: Integrated 7" display Passive optical probe not affected by heat and electrical noise Availability of SDK and protocol commands for easy integration into any system Small measurement spot Synchronized measurement with encoder for dynamic acquisitions Roughness
- Display: Digital Display
- Gaging Technology: Non-contact
- Attribute Measurement Capability: Thickness Gage
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Supplier: SAE International
Description: This SAE Recommended Practice describes a method for measuring the surface texture of cold rolled, matte finish sheet steel with a roughness average (R a ) of 20-80 \u03bc in.
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Supplier: LMI Technologies
Description: MikroCAD delivers sub-micron accuracy and repeatability on a variety of challenging scan surfaces such as shiny, reflective and steep edges, in contrast to confocal solutions that are unable to handle steeply angled geometries. With MikroCAD 3D Surface Metrology you can: Measure roughness and
- Features: 3-D Scanning / Profiling, Dimensional Measurement, Profile Measurement, Reverse Engineering
- Mounting Options: Benchtop
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Supplier: Zygo Corporation
Description: with ISO 25178 surface roughness parameters. High resolution 1 million pixel image sensor provides fast areal measurements in seconds, for excellent surface detail and visualization. Integrated autofocus and focus aid simplify part setup and minimize operator variability.
- Features: 3-D Scanning / Profiling, Digitizing / Imaging, Profile Measurement
- Mounting Options: Benchtop
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Supplier: KEYENCE
Description: Features Non-contact 3D metrology system performs nanometer level profile, roughness and thickness measurements on nearly any material. This software module complies with ISO 25178 and allows users to complete measurements of several surface parameters. Up to 28,800x
- Total Magnification: 19,200 to 28,000 X
- Resolution: 0.5 to 10 nm
- Grade: Benchtop
- Remote Interface: Computer Interface
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Supplier: Park Systems, Inc.
Description: non-destructively • Immunity from parameter-dependent results observed in tapping imaging Complete 3D Metrology of Sidewall • Sidewall roughness measurement • Critical angle measurement of sidewalls • Critical dimension measurements of vertical sidewalls High Throughput
- Measurements: Critical Dimension / Trench Geometry, Defects / ADC, Roughness / Waviness
- Mounting / Loading: Floor Mounted / Stand-alone
- Form Factor: Monitor / Instrument
- Features: Non-contact, Non-destructive
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Supplier: Zygo Corporation
Description: high-accuracy measurements, ease of use, and fast measurements, all at an attractive price point that make it the ideal choice for versatility and value in 3D optical profilers. Some of the differentiated features targeted at making users' metrology better, faster, and more reliable:
- Features: 3-D Scanning / Profiling, Digitizing / Imaging, Profile Measurement
- Mounting Options: Benchtop
- Control: Manual, PC
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Supplier: LMI Technologies
Description: Gocator displacement sensors are non-contact laser distance measurement devices that are ideal for determining 3D thickness, height, and surface roughness. The sensors operate at speeds up to 32,000 Hz and ideal for closed loop control or inline inspection of manufactured parts. These
- Features: 3-D Scanning / Profiling, Dimensional Measurement, Laser Triangulation, Other
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Supplier: Phenom-World BV
Description: With the 3D Roughness Reconstruction application, the Phenom desktop SEM systems are able to generate three-dimensional images and submicrometer roughness measurements. 3D imaging helps to interpret sample characteristics and makes images understandable for a larger group of
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Supplier: CSA Group
Description: ISO/TR 22335:2007 describes a method for determining ion-sputtering rates for depth profiling measurements with Auger electron spectroscopy (AES) and X‑ray photoelectron spectroscopy (XPS) where the specimen is ion-sputtered over a region with an area between 0,4 mm2 and 3,0 mm2. The
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Description: ISO/TR 22335:2007 describes a method for determining ion-sputtering rates for depth profiling measurements with Auger electron spectroscopy (AES) and X‑ray photoelectron spectroscopy (XPS) where the specimen is ion-sputtered over a region with an area between 0,4 mm2 and 3,0 mm2. The
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: resolution of the detector and stylus system for higher throughput Centering is not required for serial measurements. Patented CNC offset probe holder For CNC-guided rotating and pivoting of the stylus Measurement below the R axis Deep penetration with the standard stylus Options
- Part Weight / Load Capacity: 60 lbs
- Applications: Automotive
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
- Technology: Contact / Stylus Based
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Supplier: Bruker Corporation
Description: Bruker's Dektak® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
- Mounting / Loading Options: Benchtop, Floor / Free Standing
- Display & Special Features: Computer Interface / Networkable
- Technology: Contact / Stylus Based
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Description: only be used within specified limits of pipe size, roughness, diameter ratio and Reynolds number. ISO 5167-4:2003 is not applicable to the measurement of pulsating flow. It does not cover the use of Venturi tubes in pipes sized less than 50 mm or more than 1 200 mm, or for where the
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Supplier: CSA Group
Description: only be used within specified limits of pipe size, roughness, diameter ratio and Reynolds number. ISO 5167-4:2003 is not applicable to the measurement of pulsating flow. It does not cover the use of Venturi tubes in pipes sized less than 50 mm or more than 1 200 mm, or for where the
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Supplier: Park Systems, Inc.
Description: non-destructively • Immunity from parameter-dependent results observed in tapping imaging Precision Critical Angle Measurements • Precision calibration of Z-scan orthogonality • Provides the angle measurement accuracy of less than 0.1 degrees • Fully automatic Critical Angle
- Measurements: Critical Dimension / Trench Geometry, Defects / ADC, Roughness / Waviness
- Mounting / Loading: Floor Mounted / Stand-alone
- Form Factor: Monitor / Instrument
- Features: Non-contact, Non-destructive
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Supplier: MicroSense, LLC
Description: hour 2D & 3D mapping capability Full SECS/GEM compatibility Automated calibration Options Edge gripper/non-contact handling Extended warp/bow range up to 5000um Wafer prealigner Roughness measurement Applications High volume wafer production control, backgrinding control, Wafer
- Maximum Wafer / Part Size: 100 to 300.00000000000006 mm
- Mounting / Loading: Floor Mounted / Stand-alone
- Form Factor: Monitor / Instrument
- Features: Non-contact
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Supplier: Evident Scientific
Description: Get reliable data quickly. Sub-micron 3D observation/measurement Observe steps in the nanometer range and measure height differences at the sub-micron level. ISO25178-compliant surface roughness measurement Measure surface roughness from linear to planar. Non-contact,
- Total Magnification: 54 to 17,280 X
- Resolution: 0.5 nm
- Grade: Benchtop
- Eyepiece Style: Binocular
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Supplier: Polytec, Inc.
Description: Roughness (Ra) overthe full surface with results comparable to an AFM, but in a fraction of the time. You can achieve repeatablenano and micro waviness measurements when measuring the same target on different machines and the capability to not only find defects, but to classify
- Measurement Capability: 3D / Areal Topography, Defects / ADC, Flatness, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Runout, Thickness, Waviness Parameters (Wa,Wt )
- Standards Compliance: ASME, ISO / EN
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability, Video / Graphic Display
- Mounting / Loading Options: Floor / Free Standing
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Supplier: SPIE - Education
Description: future of lithography scaling. 1. Introduction to Line-Edge Roughness (LER) and Linewidth Roughness (LWR): LER Experimental Results, Device Effects, LER Trends 2. Metrology for LER/LWR: Power Spectral Density Measurement, Low-frequency roughness and feature-to-feature
- Type: Course
- Delivery: On-site / In Plant
- Technology / Subject Expertise: Photonics / Optics
- Features: Specialty / Other
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Supplier: Zygo Corporation
Description: creation of simple one-click or automation interfaces. Automated Operation – through a graphical interface, Mx allows for easy configuration of fully automated measurement sequences, including multiple field-of-view stitching, tray-based measurements of multiple parts, or complex
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: axis Topography measurements up to seven times faster than systems with a spindle drive Can be used with numerous sensors: surface, contour, hybrid and white light sensors Topography function or lead twist measurement function quickly upgradeable on site Optional rotation tracing
- Measurement Capability: 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
- Standards Compliance: ASME, DIN, ISO / EN, JIS
- Mounting / Loading Options: Benchtop
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
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Supplier: Bruker Corporation
Description: XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution
- Measurements: Defects / ADC, Roughness / Waviness
- Features: Other
- Technology: Profilometer / AFM, X-ray Diffractometer
- Applications: Semiconductor Wafers
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ZCP2002HT001
… thermochemically treated samples surfaces have been analysed as to their surface appearance (with a stereoscopic lens 50x magnification and with the scanning electron microscope), their surface roughness (RA, RZ, Rmax, RT and R3Z ) has been determined and the microhardness (100gf load) measured .
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ZCP2005ITSC0399
The Surftest 301 unit provides digital readout of the measuring conditions and results for nine types of roughness parameters including Ra (arithmetic mean deviation of the profile), Rq (RMS deviation of the profile), R3z (mean peak-to-valley height), Rt (maximum peak …
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A comparison of surface roughness of pipes as measured by two profilometers and atomic force microscopy
lm = evaluation length x = distance coordinate along the measurement axis y = distance coordinate perpendicular to the measure- ment axis Ra = arithmetic average roughness Rmax = maximum individual peak-to-valley height … … roughness RZD = mean peak-to-valley height R3Z = arithmetic average of third …
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AMST’05 Advanced Manufacturing Systems and Technology
… diameter of the jet, at 2 mm below the primary nozzle, has been measured , that is at … ^^^ To the aim to make inquiries about the maximum and minimum value on the roughness profile, the parameter R3Z is liked better than Ra because it protects from possible local imperfections of the material or exceptional data.
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Quantitative surface roughness measurements using multivariate data analysis in speckle interferometry
A profile zðxÞ has been acquired over 4 mm of measurement length with the stylus measurement system. In this work, the results for five roughness parameters Rq, Ra, R3z , Rp, and Mr1 are presented exemplarily.
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Effect of grit-blasting on substrate roughness and coating adhesion
The Surftest 301 unit provides digital readout of the measuring conditions and results for a significant number of surface texture parameters including Ra (arithmetic mean deviation of the profile), Rq (RMS deviation of the profile), R3z (mean peak-to-valley height), Rt … Rz was used for the primary roughness measurement since it most closely matches ANSI standard B46.1 …
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Micro-scale mass-transfer variations during electrodeposition
3320 ' 3330 DATA Mode,Cutoff, Magnification,Assessed, Measurement ,Run,Rti,Rpi 3340 DATA Rvi,Ra,Rq,Ry,Rt,Rtm,Rv,Rp,Sm,LamQ,DelQ,Rsk,Rku,S, R3z ,Rz 3350 DATA Rpm,Rvm,R3y,Wa,Wq,Wt,Wc,Wp,HSCa,HSCb … 3470 ' 3480 DATA " Roughness ISO", "Roughness PC", "Waviness PC", "Unfiltered" 3490 DATA WAVINESS ISO,Roughness …
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Preliminary study in the evaluation of anti‐aging cosmetic treatment using two complementary methods for assessing skin surface
R2/ R3z Average roughness estimated form several measurements .
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Understanding Surface Texture Parameters
Among the largest set of parameters, roughness parameters include Swedish height (H), areal flatness deviation (ISO flatness), total peak-to-valley profile height (Pt ISO), base roughness depth (R3z), base roughness profile depth ( R3z ISO), arithmetical mean deviation (Ra), Kurtosis (Rku),maximum … … peak-to-valley areal roughness (SRz ISO), the average of individual Rz results, measured by slicing the …
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Textbook of Aging Skin
After the treatment period, the differences between active and placebo for Rzmax, R3z , and RzISO were statistically … The differ- ences between active and placebo for Ra, (Although the average roughness Ra is one of the most frequently used parameters in surface measurement , this parameter does not inform about all aspects of the surface.